JPS5879145A - 表面疵検査機構 - Google Patents

表面疵検査機構

Info

Publication number
JPS5879145A
JPS5879145A JP17641081A JP17641081A JPS5879145A JP S5879145 A JPS5879145 A JP S5879145A JP 17641081 A JP17641081 A JP 17641081A JP 17641081 A JP17641081 A JP 17641081A JP S5879145 A JPS5879145 A JP S5879145A
Authority
JP
Japan
Prior art keywords
output
circuit
differential
optical means
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17641081A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0143902B2 (enrdf_load_stackoverflow
Inventor
Masakazu Fujita
正和 藤田
Hideo Kitsuka
木塚　秀雄
Yukio Furukawa
古川　幸夫
Yasuhiko Masuno
増野　豈彦
Shoji Akutsu
阿久津　昭司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
TOEI DENSHI KOGYO KK
Original Assignee
Kawasaki Steel Corp
TOEI DENSHI KOGYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp, TOEI DENSHI KOGYO KK filed Critical Kawasaki Steel Corp
Priority to JP17641081A priority Critical patent/JPS5879145A/ja
Publication of JPS5879145A publication Critical patent/JPS5879145A/ja
Publication of JPH0143902B2 publication Critical patent/JPH0143902B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP17641081A 1981-11-05 1981-11-05 表面疵検査機構 Granted JPS5879145A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17641081A JPS5879145A (ja) 1981-11-05 1981-11-05 表面疵検査機構

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17641081A JPS5879145A (ja) 1981-11-05 1981-11-05 表面疵検査機構

Publications (2)

Publication Number Publication Date
JPS5879145A true JPS5879145A (ja) 1983-05-12
JPH0143902B2 JPH0143902B2 (enrdf_load_stackoverflow) 1989-09-25

Family

ID=16013186

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17641081A Granted JPS5879145A (ja) 1981-11-05 1981-11-05 表面疵検査機構

Country Status (1)

Country Link
JP (1) JPS5879145A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0143902B2 (enrdf_load_stackoverflow) 1989-09-25

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