JPS5855728A - 温度差検出回路 - Google Patents

温度差検出回路

Info

Publication number
JPS5855728A
JPS5855728A JP15438881A JP15438881A JPS5855728A JP S5855728 A JPS5855728 A JP S5855728A JP 15438881 A JP15438881 A JP 15438881A JP 15438881 A JP15438881 A JP 15438881A JP S5855728 A JPS5855728 A JP S5855728A
Authority
JP
Japan
Prior art keywords
voltage
temp
temperature
circuit
resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15438881A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6239926B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Keizo Yamamura
山村 恵造
Nobuo Akashi
信夫 明石
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Tateisi Electronics Co
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tateisi Electronics Co, Omron Tateisi Electronics Co filed Critical Tateisi Electronics Co
Priority to JP15438881A priority Critical patent/JPS5855728A/ja
Publication of JPS5855728A publication Critical patent/JPS5855728A/ja
Publication of JPS6239926B2 publication Critical patent/JPS6239926B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/22Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
    • G01K7/24Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
    • G01K7/25Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/18Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
    • G01K7/20Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
    • G01K7/21Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
JP15438881A 1981-09-29 1981-09-29 温度差検出回路 Granted JPS5855728A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15438881A JPS5855728A (ja) 1981-09-29 1981-09-29 温度差検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15438881A JPS5855728A (ja) 1981-09-29 1981-09-29 温度差検出回路

Publications (2)

Publication Number Publication Date
JPS5855728A true JPS5855728A (ja) 1983-04-02
JPS6239926B2 JPS6239926B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-08-26

Family

ID=15583039

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15438881A Granted JPS5855728A (ja) 1981-09-29 1981-09-29 温度差検出回路

Country Status (1)

Country Link
JP (1) JPS5855728A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5224777A (en) * 1991-04-23 1993-07-06 Kabushiki Kaisha Toshiba Cryogenic measurement equipment
EP0710823A1 (en) * 1991-04-23 1996-05-08 Kabushiki Kaisha Toshiba Cryogenic measurement equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5224777A (en) * 1991-04-23 1993-07-06 Kabushiki Kaisha Toshiba Cryogenic measurement equipment
EP0710823A1 (en) * 1991-04-23 1996-05-08 Kabushiki Kaisha Toshiba Cryogenic measurement equipment

Also Published As

Publication number Publication date
JPS6239926B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-08-26

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