JPS58214842A - 膜状物の曇り価測定装置 - Google Patents

膜状物の曇り価測定装置

Info

Publication number
JPS58214842A
JPS58214842A JP9688282A JP9688282A JPS58214842A JP S58214842 A JPS58214842 A JP S58214842A JP 9688282 A JP9688282 A JP 9688282A JP 9688282 A JP9688282 A JP 9688282A JP S58214842 A JPS58214842 A JP S58214842A
Authority
JP
Japan
Prior art keywords
light
film
optical fiber
receiving
emitting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9688282A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0445773B2 (OSRAM
Inventor
Hajime Munekuni
肇 宗国
Hiroshi Saito
斎藤　廣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asahi Kasei Corp
Asahi Chemical Industry Co Ltd
Original Assignee
Asahi Chemical Industry Co Ltd
Asahi Kasei Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Chemical Industry Co Ltd, Asahi Kasei Kogyo KK filed Critical Asahi Chemical Industry Co Ltd
Priority to JP9688282A priority Critical patent/JPS58214842A/ja
Publication of JPS58214842A publication Critical patent/JPS58214842A/ja
Publication of JPH0445773B2 publication Critical patent/JPH0445773B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
JP9688282A 1982-06-08 1982-06-08 膜状物の曇り価測定装置 Granted JPS58214842A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9688282A JPS58214842A (ja) 1982-06-08 1982-06-08 膜状物の曇り価測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9688282A JPS58214842A (ja) 1982-06-08 1982-06-08 膜状物の曇り価測定装置

Publications (2)

Publication Number Publication Date
JPS58214842A true JPS58214842A (ja) 1983-12-14
JPH0445773B2 JPH0445773B2 (OSRAM) 1992-07-27

Family

ID=14176772

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9688282A Granted JPS58214842A (ja) 1982-06-08 1982-06-08 膜状物の曇り価測定装置

Country Status (1)

Country Link
JP (1) JPS58214842A (OSRAM)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62201047U (OSRAM) * 1986-06-12 1987-12-22
JPH02281129A (ja) * 1989-03-30 1990-11-16 Measurex Corp 進行するシート材の特性を検出する光システム
JPH04274732A (ja) * 1990-10-31 1992-09-30 Labsystems Oy 光案内方法およびその装置
US7142307B1 (en) * 1991-03-01 2006-11-28 Stark Edward W Method and apparatus for optical interactance and transmittance measurements
US7632463B2 (en) 2003-12-05 2009-12-15 Mitsubishi Kagaku Iatron, Inc. Analysis apparatus and condenser
JP2015127685A (ja) * 2013-12-27 2015-07-09 三菱重工業株式会社 ガス成分濃度分布測定装置及び排ガス脱硝システム

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5153132U (OSRAM) * 1974-10-21 1976-04-22
JPS5172447A (OSRAM) * 1974-12-20 1976-06-23 Mitsubishi Rayon Co
JPS5229631U (OSRAM) * 1975-08-22 1977-03-02
JPS5233778A (en) * 1975-09-11 1977-03-15 Suga Shikenki Kk Direct reading type clouiness value measuring device
JPS5294017A (en) * 1976-02-03 1977-08-08 Ricoh Co Ltd Scanner for facsimile

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5153132U (OSRAM) * 1974-10-21 1976-04-22
JPS5172447A (OSRAM) * 1974-12-20 1976-06-23 Mitsubishi Rayon Co
JPS5229631U (OSRAM) * 1975-08-22 1977-03-02
JPS5233778A (en) * 1975-09-11 1977-03-15 Suga Shikenki Kk Direct reading type clouiness value measuring device
JPS5294017A (en) * 1976-02-03 1977-08-08 Ricoh Co Ltd Scanner for facsimile

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62201047U (OSRAM) * 1986-06-12 1987-12-22
JPH02281129A (ja) * 1989-03-30 1990-11-16 Measurex Corp 進行するシート材の特性を検出する光システム
JPH04274732A (ja) * 1990-10-31 1992-09-30 Labsystems Oy 光案内方法およびその装置
US7142307B1 (en) * 1991-03-01 2006-11-28 Stark Edward W Method and apparatus for optical interactance and transmittance measurements
US7397566B2 (en) 1991-03-01 2008-07-08 Stark Edward W Method and apparatus for optical interactance and transmittance measurements
US7632463B2 (en) 2003-12-05 2009-12-15 Mitsubishi Kagaku Iatron, Inc. Analysis apparatus and condenser
JP2015127685A (ja) * 2013-12-27 2015-07-09 三菱重工業株式会社 ガス成分濃度分布測定装置及び排ガス脱硝システム

Also Published As

Publication number Publication date
JPH0445773B2 (OSRAM) 1992-07-27

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