JPS58211399A - 半導体装置 - Google Patents

半導体装置

Info

Publication number
JPS58211399A
JPS58211399A JP57093807A JP9380782A JPS58211399A JP S58211399 A JPS58211399 A JP S58211399A JP 57093807 A JP57093807 A JP 57093807A JP 9380782 A JP9380782 A JP 9380782A JP S58211399 A JPS58211399 A JP S58211399A
Authority
JP
Japan
Prior art keywords
transistor
node
type transistor
redundant
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57093807A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6237476B2 (enrdf_load_stackoverflow
Inventor
Yasutaka Yamaguchi
山口 泰孝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP57093807A priority Critical patent/JPS58211399A/ja
Publication of JPS58211399A publication Critical patent/JPS58211399A/ja
Publication of JPS6237476B2 publication Critical patent/JPS6237476B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/78Masking faults in memories by using spares or by reconfiguring using programmable devices

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Semiconductor Memories (AREA)
JP57093807A 1982-06-01 1982-06-01 半導体装置 Granted JPS58211399A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57093807A JPS58211399A (ja) 1982-06-01 1982-06-01 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57093807A JPS58211399A (ja) 1982-06-01 1982-06-01 半導体装置

Publications (2)

Publication Number Publication Date
JPS58211399A true JPS58211399A (ja) 1983-12-08
JPS6237476B2 JPS6237476B2 (enrdf_load_stackoverflow) 1987-08-12

Family

ID=14092671

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57093807A Granted JPS58211399A (ja) 1982-06-01 1982-06-01 半導体装置

Country Status (1)

Country Link
JP (1) JPS58211399A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62107500A (ja) * 1985-11-05 1987-05-18 Matsushita Electronics Corp 半導体メモリ装置
JPH03235297A (ja) * 1990-02-13 1991-10-21 Toshiba Corp 半導体集積回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62107500A (ja) * 1985-11-05 1987-05-18 Matsushita Electronics Corp 半導体メモリ装置
JPH03235297A (ja) * 1990-02-13 1991-10-21 Toshiba Corp 半導体集積回路

Also Published As

Publication number Publication date
JPS6237476B2 (enrdf_load_stackoverflow) 1987-08-12

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