JPS58208120A - Apparatus for forming thin silicon film - Google Patents
Apparatus for forming thin silicon filmInfo
- Publication number
- JPS58208120A JPS58208120A JP8884882A JP8884882A JPS58208120A JP S58208120 A JPS58208120 A JP S58208120A JP 8884882 A JP8884882 A JP 8884882A JP 8884882 A JP8884882 A JP 8884882A JP S58208120 A JPS58208120 A JP S58208120A
- Authority
- JP
- Japan
- Prior art keywords
- reaction chamber
- silicon film
- thin silicon
- substrate
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
本発明はプラズマCVD法による薄膜シリコン住成装置
に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thin film silicon deposition apparatus using a plasma CVD method.
第1図はそのような薄膜シリコン失成装置を示し、反応
室1内には水平に位置するサセプタ2およびそれに対向
する電極3が存在する。サセプタ2の上に図示しない基
板を載せ、排気口4より、排気して反応室1の内部空間
を真壁にし、ガス導入管5よりシランガスを導入し、サ
セプタ2と対向電極3の間に高周波才たは直流電圧を印
加してグロー放電を発生させると、モノシランが分解し
サセプタ2の内蔵するヒータによって加熱された基板上
にアモルファスシリコン(a−81)の薄膜カ形成され
る。しかしこの場合、a−8lは反応室1の壁11にも
付着し、これが厚くなるとはがれて落下する。このSl
の落下は壁11の温度上昇が最大であるa−81g成
長前が最も多い。これはサセプタ2からの熱放射によっ
て壁11が暖められ、板正に付着する。この微小なa−
8l粒子の上にa−8i膜が成長するので、これがピン
ホールなどの欠陥の原因となり、歩留りの低下をひきお
こす。FIG. 1 shows such a thin film silicon ablation device, in which a reaction chamber 1 has a horizontally positioned susceptor 2 and an electrode 3 facing it. A substrate (not shown) is placed on top of the susceptor 2, the interior space of the reaction chamber 1 is made completely solid by exhausting air through the exhaust port 4, silane gas is introduced through the gas introduction tube 5, and a high-frequency filter is placed between the susceptor 2 and the counter electrode 3. When a glow discharge is generated by applying a direct current voltage or a direct current voltage, the monosilane is decomposed and a thin film of amorphous silicon (a-81) is formed on the substrate heated by the heater built in the susceptor 2. However, in this case, a-8l also adheres to the wall 11 of the reaction chamber 1, and when it becomes thick, it peels off and falls. This Sl
The fall is most common before the growth of a-81g, when the temperature rise of the wall 11 is maximum. The wall 11 is warmed by heat radiation from the susceptor 2 and adheres to the plate. This minute a-
Since the a-8i film grows on the 8l particles, this causes defects such as pinholes, causing a decrease in yield.
本発明の目的は、このような反応室の壁力)らシリコン
粒子が基板面へ落下することのない、歩留りの高い薄膜
シリコン生成装置も提供することにある。An object of the present invention is also to provide a thin film silicon production device with a high yield in which silicon particles do not fall onto the substrate surface due to the wall force of the reaction chamber.
この目的は反応室の内面が可撓性を有する金網で冴われ
ることによって達成される。This objective is achieved in that the inner surface of the reaction chamber is lined with a flexible wire mesh.
以下第2図を引用して本発明の実施例について説明する
。第2図に示す薄膜シリコン住成装置にている。この装
置を用い第1図の場合と同様にサセプタ2と電板3の間
に電圧を印加してグロー放電を屍体させ、モノシランを
分解すると基板上にa−8iが成長すると同時に金N@
6にもa−8iあるいは中間生成物が付着する。薄M化
成過程の繰返しによってこの付着物が厚くなり、金網6
より落下する虞が生ずる前に、基板のとり出しのため反
応室lを開いた機会に付着物を金網より機械的にふりお
とす。機械的なふりおとしは金網6を屈伸させることに
より行うのが効果的である。そのため、金網6は可撓性
を有することが必要である。Embodiments of the present invention will be described below with reference to FIG. A thin film silicon deposition apparatus shown in FIG. 2 was used. Using this device, a voltage is applied between the susceptor 2 and the electric plate 3 in the same way as in the case of Fig. 1 to eliminate the glow discharge, and when monosilane is decomposed, a-8i grows on the substrate and at the same time gold N@
6 also has a-8i or an intermediate product attached to it. By repeating the thin M chemical formation process, this deposit becomes thicker, and the wire mesh 6
Before there is a risk of the substrate falling, the deposits are mechanically shaken off through a wire mesh when the reaction chamber 1 is opened to take out the substrate. It is effective to perform mechanical shaking by bending and stretching the wire mesh 6. Therefore, the wire mesh 6 needs to have flexibility.
金網6は才。た太い針金からなり網目が小さいものであ
れば、反応化成物が付着しやすくまた屈伸の際ハがれや
すい。ふりおとしたa−8iなどの付着物を清掃したの
ち、基板を載置したサセプタ2の上に反応Mlの上部を
かぶせれば、薄膜シリコン性成過程は清浄な反応室1内
で行うことができるので、基板上に住するシリコン薄膜
には欠陥が王することがない。Wire mesh 6 is good. If it is made of thick wire with a small mesh, reaction compounds will easily adhere to it, and it will also tend to peel off during bending and stretching. After cleaning the deposits such as A-8i that have been shaken off, if the top of the reaction Ml is placed over the susceptor 2 on which the substrate is placed, the thin film silicon formation process can be carried out in the clean reaction chamber 1. As a result, defects do not occur in the silicon thin film that resides on the substrate.
第2図の例では、金網は反応室の側壁11の内面にのみ
取り付けられているが、反応室の天井にも設けて天井壁
に反応止成物が付着することを防止できるので有効であ
る。In the example shown in Fig. 2, the wire mesh is attached only to the inner surface of the side wall 11 of the reaction chamber, but it is also effective to install it on the ceiling of the reaction chamber because it can prevent reaction products from adhering to the ceiling wall. .
以上述べたように、本発明は薄膜シリコン化成装置の反
応室の内面そ可撓性を有する金網で覆い、反応化成物を
この金網に付着させ、付着量が多く−・:直ってはがれ
て落下するようになる前にこの付着A゛。As described above, the present invention covers the inner surface of the reaction chamber of a thin film silicon formation apparatus with a flexible wire mesh, and allows the reaction compound to adhere to the wire mesh, so that the amount of adhesion is large. This adhesion A゛ before it comes to be.
シ物モ機械的にふりおとして薄膜化成基板へのa−8i
−、、−−′−1)。A-8i is mechanically shaken and attached to a thin film chemically formed substrate.
-,,--'-1).
一瓢・子などの落下を防止するものであり、これによ二
斗基板上に欠陥のないシリコン薄膜を歩留り高く生成す
ることができ、アモルファスシリコン太陽電池などの製
造に極めて有効に適用できる。This prevents the falling of gourds, seeds, etc., and allows the production of defect-free silicon thin films on two-dimensional substrates at a high yield, making it extremely effective for manufacturing amorphous silicon solar cells.
6・・・金網。 6...wire mesh.
Claims (1)
させ、導入された反応ガスを分解して基板上にシリコン
薄膜を生成するものにおいて、反応室の内面か可撓性を
有する金網で榎われたことを!P#徴とする薄膜シリコ
ン生成装置。1) In a system that generates a glow discharge in a fully evacuated reaction chamber and decomposes the introduced reaction gas to produce a silicon thin film on the substrate, the inner surface of the reaction chamber is covered with a flexible wire mesh. What! Thin film silicon production device with P# characteristics.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8884882A JPS5953211B2 (en) | 1982-05-27 | 1982-05-27 | Thin film silicon production equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8884882A JPS5953211B2 (en) | 1982-05-27 | 1982-05-27 | Thin film silicon production equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58208120A true JPS58208120A (en) | 1983-12-03 |
JPS5953211B2 JPS5953211B2 (en) | 1984-12-24 |
Family
ID=13954395
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8884882A Expired JPS5953211B2 (en) | 1982-05-27 | 1982-05-27 | Thin film silicon production equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5953211B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59207620A (en) * | 1983-05-10 | 1984-11-24 | Zenko Hirose | Amorphous silicon film forming apparatus |
JPS60117716A (en) * | 1983-11-30 | 1985-06-25 | Zenko Hirose | Forming method of film |
JPS60147114A (en) * | 1984-01-11 | 1985-08-03 | Daihen Corp | Manufacturing device for photovoltaic element |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0348489Y2 (en) * | 1985-11-27 | 1991-10-16 | ||
JPH024715U (en) * | 1988-06-17 | 1990-01-12 |
-
1982
- 1982-05-27 JP JP8884882A patent/JPS5953211B2/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59207620A (en) * | 1983-05-10 | 1984-11-24 | Zenko Hirose | Amorphous silicon film forming apparatus |
JPH0456448B2 (en) * | 1983-05-10 | 1992-09-08 | Zenko Hirose | |
JPS60117716A (en) * | 1983-11-30 | 1985-06-25 | Zenko Hirose | Forming method of film |
JPH0456450B2 (en) * | 1983-11-30 | 1992-09-08 | Zenko Hirose | |
JPS60147114A (en) * | 1984-01-11 | 1985-08-03 | Daihen Corp | Manufacturing device for photovoltaic element |
Also Published As
Publication number | Publication date |
---|---|
JPS5953211B2 (en) | 1984-12-24 |
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