JPS58204462A - 質量分析計におけるイオン源装置 - Google Patents
質量分析計におけるイオン源装置Info
- Publication number
- JPS58204462A JPS58204462A JP57086850A JP8685082A JPS58204462A JP S58204462 A JPS58204462 A JP S58204462A JP 57086850 A JP57086850 A JP 57086850A JP 8685082 A JP8685082 A JP 8685082A JP S58204462 A JPS58204462 A JP S58204462A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- mass spectrometer
- ion source
- emitter
- source device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Sources, Ion Sources (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57086850A JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57086850A JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58204462A true JPS58204462A (ja) | 1983-11-29 |
JPH0232749B2 JPH0232749B2 (enrdf_load_html_response) | 1990-07-23 |
Family
ID=13898282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57086850A Granted JPS58204462A (ja) | 1982-05-22 | 1982-05-22 | 質量分析計におけるイオン源装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58204462A (enrdf_load_html_response) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2021033318A1 (enrdf_load_html_response) * | 2019-08-22 | 2021-02-25 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51136189U (enrdf_load_html_response) * | 1975-04-25 | 1976-11-02 | ||
JPS5297785A (en) * | 1976-02-13 | 1977-08-16 | Hitachi Ltd | Ion source device |
-
1982
- 1982-05-22 JP JP57086850A patent/JPS58204462A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51136189U (enrdf_load_html_response) * | 1975-04-25 | 1976-11-02 | ||
JPS5297785A (en) * | 1976-02-13 | 1977-08-16 | Hitachi Ltd | Ion source device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2021033318A1 (enrdf_load_html_response) * | 2019-08-22 | 2021-02-25 | ||
WO2021033318A1 (ja) * | 2019-08-22 | 2021-02-25 | 株式会社島津製作所 | ガスクロマトグラフ質量分析計および質量分析方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0232749B2 (enrdf_load_html_response) | 1990-07-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Vestal | Methods of ion generation | |
JP3299335B2 (ja) | 時間変調が課される電気的噴霧装置および方法 | |
US7087898B2 (en) | Laser desorption ion source | |
US7375319B1 (en) | Laser desorption ion source | |
JPS5935347A (ja) | イオン生成装置 | |
US20080067352A1 (en) | Combined ambient desorption and ionization source for mass spectrometry | |
EP1639622B1 (en) | Laser desorption ion source | |
JPH031435A (ja) | 質量分析法のためのイオン化法 | |
EP0000586B1 (en) | Method for rejuvenating ion sources | |
US4988869A (en) | Method and apparatus for electron-induced dissociation of molecular species | |
JPH0218854A (ja) | 液体クロマトグラフ/質量分析装置 | |
US4159423A (en) | Chemical ionization ion source | |
JP3300602B2 (ja) | 大気圧イオン化イオントラップ質量分析方法及び装置 | |
US4166952A (en) | Method and apparatus for the elemental analysis of solids | |
US4808819A (en) | Mass spectrometric apparatus | |
JPH06215729A (ja) | 質量分析計 | |
JPS58204462A (ja) | 質量分析計におけるイオン源装置 | |
US3723729A (en) | Ionization chamber for use with a mass spectrometer | |
JP3578127B2 (ja) | 質量分析装置 | |
US3731089A (en) | Mass spectrometer ion source having means for rapidly expelling ions from the source and method of operation | |
JPH1186778A (ja) | イオン化装置 | |
US20060038122A1 (en) | Ion source with adjustable ion source pressure combining ESI-, FI-, FD-, LIFDI- and MALDI-elements as well as hybrid intermediates between ionization techniques for mass spectrometry and/or electron paramagnetic resonance spectrometry | |
JP3691522B2 (ja) | 液体クロマトグラフ質量分析計 | |
JPH1164289A (ja) | 液体クロマトグラフ質量分析装置 | |
US4054810A (en) | Field emission ion source having heated anode |