JPS58189530U - printed wiring board - Google Patents

printed wiring board

Info

Publication number
JPS58189530U
JPS58189530U JP8649382U JP8649382U JPS58189530U JP S58189530 U JPS58189530 U JP S58189530U JP 8649382 U JP8649382 U JP 8649382U JP 8649382 U JP8649382 U JP 8649382U JP S58189530 U JPS58189530 U JP S58189530U
Authority
JP
Japan
Prior art keywords
substrate
wiring board
printed wiring
slit
guard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8649382U
Other languages
Japanese (ja)
Other versions
JPH0334907Y2 (en
Inventor
金藤 圭輝
成松 洋
今泉 仁志
Original Assignee
横河・ヒユ−レツト・パツカ−ド株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 横河・ヒユ−レツト・パツカ−ド株式会社 filed Critical 横河・ヒユ−レツト・パツカ−ド株式会社
Priority to JP8649382U priority Critical patent/JPS58189530U/en
Publication of JPS58189530U publication Critical patent/JPS58189530U/en
Application granted granted Critical
Publication of JPH0334907Y2 publication Critical patent/JPH0334907Y2/ja
Granted legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は半導体ウェーハ測定装置の正面図。第2図は本
考案のパーソナリティ・ボードの部分分解図。第3図は
本考案のパーソナリティ・ボードの部分平面図および断
面図。 201:上部基板、205:下部基板、202:信号用
パターン、204ニスリツト、203゜206=ガード
用パターン、212:突出部。
FIG. 1 is a front view of a semiconductor wafer measuring device. Figure 2 is a partially exploded view of the personality board of the present invention. FIG. 3 is a partial plan view and a sectional view of the personality board of the present invention. 201: Upper substrate, 205: Lower substrate, 202: Signal pattern, 204 Nislit, 203°206=Guard pattern, 212: Projection.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] スリットを有し絶縁体によって形成された第1の基板と
、前記第1の基板上に設けられた信号用パターンと、前
記第1の基板の表部、裏部および前記スリットの縁部に
連続して設けられた第1のガード用パターンと、絶縁体
によって形成された第2の基板上に設けられ前記第1の
ガード用パターンに接する第2のガード用パターンとか
ら成り、前記信号用パターンを前記第1の基板の縁部、
前記スリットおよび前記第1、第2のガード用パターン
によって囲ったことを特徴とするプリント配線基板。
A first substrate having a slit and formed of an insulator, a signal pattern provided on the first substrate, and a signal pattern continuous to the front and back sides of the first substrate and the edge of the slit. a second guard pattern provided on a second substrate formed of an insulator and in contact with the first guard pattern; an edge of the first substrate,
A printed wiring board, characterized in that the slit is surrounded by the first and second guard patterns.
JP8649382U 1982-06-10 1982-06-10 printed wiring board Granted JPS58189530U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8649382U JPS58189530U (en) 1982-06-10 1982-06-10 printed wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8649382U JPS58189530U (en) 1982-06-10 1982-06-10 printed wiring board

Publications (2)

Publication Number Publication Date
JPS58189530U true JPS58189530U (en) 1983-12-16
JPH0334907Y2 JPH0334907Y2 (en) 1991-07-24

Family

ID=30095289

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8649382U Granted JPS58189530U (en) 1982-06-10 1982-06-10 printed wiring board

Country Status (1)

Country Link
JP (1) JPS58189530U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6350034A (en) * 1986-08-20 1988-03-02 Tokyo Electron Ltd Prober device
EP0305076A2 (en) * 1987-08-18 1989-03-01 Hewlett-Packard Company Personality board
JP2015206763A (en) * 2014-04-23 2015-11-19 バイオセンサー株式会社 Measuring device and measuring method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6350034A (en) * 1986-08-20 1988-03-02 Tokyo Electron Ltd Prober device
EP0305076A2 (en) * 1987-08-18 1989-03-01 Hewlett-Packard Company Personality board
EP0305076A3 (en) * 1987-08-18 1989-03-15 Hewlett-Packard Company Personality board
JP2015206763A (en) * 2014-04-23 2015-11-19 バイオセンサー株式会社 Measuring device and measuring method

Also Published As

Publication number Publication date
JPH0334907Y2 (en) 1991-07-24

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