JPS58182169U - Autohandler for measuring electronic components - Google Patents
Autohandler for measuring electronic componentsInfo
- Publication number
- JPS58182169U JPS58182169U JP7946482U JP7946482U JPS58182169U JP S58182169 U JPS58182169 U JP S58182169U JP 7946482 U JP7946482 U JP 7946482U JP 7946482 U JP7946482 U JP 7946482U JP S58182169 U JPS58182169 U JP S58182169U
- Authority
- JP
- Japan
- Prior art keywords
- autohandler
- electronic components
- measuring electronic
- measuring
- electronic component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来の電子部品測定用オートハンドラ、を示す
側面図、第2図は本考案による電子部品測定用オートハ
ンドラを示す側面図、第3図は第二の実施例を示す側面
図、第4図は第三の実施例を示す側面図である。
11・・・・・・外部予熱部、12・・・・・・測定部
、13゜13′・・・・・・フリヒート部、14.14
’、16・・・ 、・・・ヒートレール、17・・・
・・・測定用コンタクタブロック、18・・・・・・回
動アーム、19.19’・・・・・・電源供給用コンタ
クタブロック。FIG. 1 is a side view showing a conventional autohandler for measuring electronic components, FIG. 2 is a side view showing an autohandler for measuring electronic components according to the present invention, and FIG. 3 is a side view showing a second embodiment. FIG. 4 is a side view showing the third embodiment. 11...External preheating section, 12...Measurement section, 13゜13'...Preheating section, 14.14
', 16... ,...Heat rail, 17...
...Measurement contactor block, 18...Rotating arm, 19.19'...Contactor block for power supply.
Claims (1)
昇させ次々に測定部に送り込みこの測定部で電源を供給
して試験を行うようにした電子部品測定用オートハンド
ラにおいて、上記電子部品が測定部に至る前の経路にて
該電子部品に電源を供給して、上記パッケージ温度の上
昇と共に内部温度も上昇させるようにしたことを特徴と
する電子部品測定用オートハンドラ。In an autohandler for measuring electronic components, the electronic components are passed through an external preheating section to increase the package temperature, and then sent one after another to the measurement section, where power is supplied and tested. 1. An autohandler for measuring an electronic component, characterized in that power is supplied to the electronic component in a path before reaching the electronic component, and the internal temperature is also increased as the package temperature is increased.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7946482U JPS58182169U (en) | 1982-05-29 | 1982-05-29 | Autohandler for measuring electronic components |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7946482U JPS58182169U (en) | 1982-05-29 | 1982-05-29 | Autohandler for measuring electronic components |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58182169U true JPS58182169U (en) | 1983-12-05 |
Family
ID=30088647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7946482U Pending JPS58182169U (en) | 1982-05-29 | 1982-05-29 | Autohandler for measuring electronic components |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58182169U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6111675A (en) * | 1984-06-27 | 1986-01-20 | Hitachi Electronics Eng Co Ltd | Temperature controller of ic handler |
-
1982
- 1982-05-29 JP JP7946482U patent/JPS58182169U/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6111675A (en) * | 1984-06-27 | 1986-01-20 | Hitachi Electronics Eng Co Ltd | Temperature controller of ic handler |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS58182169U (en) | Autohandler for measuring electronic components | |
JPS5942932U (en) | thermal device | |
JPS6079740U (en) | Contact pins for integrated circuit devices | |
JPS5997469U (en) | Semiconductor chip measurement probe | |
JPS59103441U (en) | semiconductor integrated circuit | |
JPS6021966U (en) | Slit type contact for handler | |
JPS59115642U (en) | semiconductor wafer | |
JPS6117678U (en) | tester | |
JPS593345U (en) | Test piece for measuring internal friction | |
JPS59108321U (en) | Oscillation circuit device | |
JPS59135662U (en) | Wiring pattern structure | |
JPS593537U (en) | Semiconductor device inspection equipment probe card | |
JPS604963U (en) | Semiconductor device measurement equipment | |
JPS5998653U (en) | Acquisition circuit package | |
JPS593344U (en) | Test piece for measuring internal friction | |
JPS59111066U (en) | Board test points | |
JPS6017407U (en) | Gap measuring device | |
JPS58129598U (en) | Measuring device check device | |
JPS5836332U (en) | Temperature difference inspection device | |
JPS6144791U (en) | Cooling device for electrical components | |
JPS58170839U (en) | integrated circuit device | |
JPS58187707U (en) | strain gauge | |
JPS59115857U (en) | Iron powder collection device for fuel supply system | |
JPS60193452U (en) | Cyclogen gas detection circuit | |
JPS58116240U (en) | Semiconductor device package |