JPS58169040A - 水銀柱検知装置 - Google Patents

水銀柱検知装置

Info

Publication number
JPS58169040A
JPS58169040A JP57053290A JP5329082A JPS58169040A JP S58169040 A JPS58169040 A JP S58169040A JP 57053290 A JP57053290 A JP 57053290A JP 5329082 A JP5329082 A JP 5329082A JP S58169040 A JPS58169040 A JP S58169040A
Authority
JP
Japan
Prior art keywords
mercury column
visible
data
image
image data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57053290A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6363056B2 (enrdf_load_html_response
Inventor
Makoto Nakada
誠 中田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Engineering Corp
Original Assignee
Toshiba Engineering Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Engineering Corp filed Critical Toshiba Engineering Corp
Priority to JP57053290A priority Critical patent/JPS58169040A/ja
Publication of JPS58169040A publication Critical patent/JPS58169040A/ja
Publication of JPS6363056B2 publication Critical patent/JPS6363056B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K5/00Measuring temperature based on the expansion or contraction of a material
    • G01K5/02Measuring temperature based on the expansion or contraction of a material the material being a liquid
    • G01K5/18Measuring temperature based on the expansion or contraction of a material the material being a liquid with electric conversion means for final indication

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
JP57053290A 1982-03-31 1982-03-31 水銀柱検知装置 Granted JPS58169040A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57053290A JPS58169040A (ja) 1982-03-31 1982-03-31 水銀柱検知装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57053290A JPS58169040A (ja) 1982-03-31 1982-03-31 水銀柱検知装置

Publications (2)

Publication Number Publication Date
JPS58169040A true JPS58169040A (ja) 1983-10-05
JPS6363056B2 JPS6363056B2 (enrdf_load_html_response) 1988-12-06

Family

ID=12938582

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57053290A Granted JPS58169040A (ja) 1982-03-31 1982-03-31 水銀柱検知装置

Country Status (1)

Country Link
JP (1) JPS58169040A (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6250800B1 (en) 1998-01-05 2001-06-26 Leonard Reiffel X-ray imaged implanted thermometers

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6250800B1 (en) 1998-01-05 2001-06-26 Leonard Reiffel X-ray imaged implanted thermometers

Also Published As

Publication number Publication date
JPS6363056B2 (enrdf_load_html_response) 1988-12-06

Similar Documents

Publication Publication Date Title
JP2742240B2 (ja) 構造物表面の検査における欠陥の検出方法
JPH11306793A (ja) 不良解析方法および装置
JPS58169040A (ja) 水銀柱検知装置
CN116309655B (zh) 一种基于深度学习的显示屏边缘检测方法、装置及设备
JPH0339603A (ja) パターンの輪郭検出方法及びこの方法を用いた測長装置
JP2501436B2 (ja) パタ−ンデ−タ検査装置
JPH0795345B2 (ja) 画像処理方法
JPH0310107A (ja) 濃淡パターンマッチングによる検査方法
JPH0682331A (ja) 可視化画像のトレーサ追跡方法
JP3487963B2 (ja) 透明物体の検査方法
KR100287157B1 (ko) 이차원 영상의 검사방법
JPS63241405A (ja) 硬度計
JPH0259604A (ja) ガラス材の反射歪検査装置
JP2025130599A (ja) 画像解析装置、その制御方法、及びプログラム
JP3333050B2 (ja) 形状測定方法及び形状測定装置
JP3045240B2 (ja) 粒子凝集パターン判定方法
JP2022113646A (ja) 物体内部の可視化装置及び可視化方法と当該コンピュータプログラム。
JPH03291770A (ja) 画像輪郭検出方法
CN118505655A (zh) 一种用于检测晶圆缺陷的方法、设备和计算机可读存储介质
Nübel Computer-aided evaluation method for interferograms
JPH0264402A (ja) 画像処理によるギャップ量測定方法および石油ストーブの芯とフィラメント間のギャップ量測定方法
JP2001195576A (ja) 円直径測定装置
JPS58219683A (ja) 輪郭線検出方法
JPS62137505A (ja) 光切断法による計測装置
JPH06215135A (ja) 画像処理装置