JPS58161870A - 電力ケ−ブル絶縁層の水トリ−の検出方法 - Google Patents
電力ケ−ブル絶縁層の水トリ−の検出方法Info
- Publication number
- JPS58161870A JPS58161870A JP57042790A JP4279082A JPS58161870A JP S58161870 A JPS58161870 A JP S58161870A JP 57042790 A JP57042790 A JP 57042790A JP 4279082 A JP4279082 A JP 4279082A JP S58161870 A JPS58161870 A JP S58161870A
- Authority
- JP
- Japan
- Prior art keywords
- cable
- charge
- absorbed
- layer
- conductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electric Cable Installation (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57042790A JPS58161870A (ja) | 1982-03-19 | 1982-03-19 | 電力ケ−ブル絶縁層の水トリ−の検出方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57042790A JPS58161870A (ja) | 1982-03-19 | 1982-03-19 | 電力ケ−ブル絶縁層の水トリ−の検出方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58161870A true JPS58161870A (ja) | 1983-09-26 |
| JPH0236191B2 JPH0236191B2 (enExample) | 1990-08-15 |
Family
ID=12645753
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57042790A Granted JPS58161870A (ja) | 1982-03-19 | 1982-03-19 | 電力ケ−ブル絶縁層の水トリ−の検出方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58161870A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6824846B1 (en) | 1989-03-16 | 2004-11-30 | Pi-Patente Gesellschaft Mit Beschrankter Haftung (Gmbh) Entwicklung Und Verwertung | Packaging envelope |
| WO2017150691A1 (ja) * | 2016-03-03 | 2017-09-08 | 住友電気工業株式会社 | 絶縁体の絶縁性能の評価方法 |
| CN108445341A (zh) * | 2018-03-01 | 2018-08-24 | 华南理工大学 | 一种电缆护套多点接地下各段泄露电流的计算方法 |
-
1982
- 1982-03-19 JP JP57042790A patent/JPS58161870A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6824846B1 (en) | 1989-03-16 | 2004-11-30 | Pi-Patente Gesellschaft Mit Beschrankter Haftung (Gmbh) Entwicklung Und Verwertung | Packaging envelope |
| WO2017150691A1 (ja) * | 2016-03-03 | 2017-09-08 | 住友電気工業株式会社 | 絶縁体の絶縁性能の評価方法 |
| JPWO2017150691A1 (ja) * | 2016-03-03 | 2018-12-27 | 住友電気工業株式会社 | 絶縁体の絶縁性能の評価方法 |
| CN108445341A (zh) * | 2018-03-01 | 2018-08-24 | 华南理工大学 | 一种电缆护套多点接地下各段泄露电流的计算方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0236191B2 (enExample) | 1990-08-15 |
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