JPS58161854A - 放射線分析方法 - Google Patents

放射線分析方法

Info

Publication number
JPS58161854A
JPS58161854A JP57042887A JP4288782A JPS58161854A JP S58161854 A JPS58161854 A JP S58161854A JP 57042887 A JP57042887 A JP 57042887A JP 4288782 A JP4288782 A JP 4288782A JP S58161854 A JPS58161854 A JP S58161854A
Authority
JP
Japan
Prior art keywords
rays
test piece
distribution
radiation
specimen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57042887A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0153416B2 (cs
Inventor
Isamu Taguchi
勇 田口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP57042887A priority Critical patent/JPS58161854A/ja
Publication of JPS58161854A publication Critical patent/JPS58161854A/ja
Publication of JPH0153416B2 publication Critical patent/JPH0153416B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57042887A 1982-03-19 1982-03-19 放射線分析方法 Granted JPS58161854A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57042887A JPS58161854A (ja) 1982-03-19 1982-03-19 放射線分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57042887A JPS58161854A (ja) 1982-03-19 1982-03-19 放射線分析方法

Publications (2)

Publication Number Publication Date
JPS58161854A true JPS58161854A (ja) 1983-09-26
JPH0153416B2 JPH0153416B2 (cs) 1989-11-14

Family

ID=12648541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57042887A Granted JPS58161854A (ja) 1982-03-19 1982-03-19 放射線分析方法

Country Status (1)

Country Link
JP (1) JPS58161854A (cs)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6395345A (ja) * 1986-10-09 1988-04-26 Mitsubishi Heavy Ind Ltd 材料表面の析出物濃度の非破壊的分析法
KR20020079293A (ko) * 2001-04-10 2002-10-19 주식회사 신한에스아이티 방사선 투과 영상의 디지털 정보화 시스템
JP2022505390A (ja) * 2018-10-18 2022-01-14 セキュリティ マターズ リミテッド 物質中の異物の検出及び特定のためのシステム及び方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6395345A (ja) * 1986-10-09 1988-04-26 Mitsubishi Heavy Ind Ltd 材料表面の析出物濃度の非破壊的分析法
KR20020079293A (ko) * 2001-04-10 2002-10-19 주식회사 신한에스아이티 방사선 투과 영상의 디지털 정보화 시스템
JP2022505390A (ja) * 2018-10-18 2022-01-14 セキュリティ マターズ リミテッド 物質中の異物の検出及び特定のためのシステム及び方法
US11867645B2 (en) 2018-10-18 2024-01-09 Security Matters Ltd. System and method for detection and identification of foreign elements in a substance by X-ray or Gamma-ray detection and emission

Also Published As

Publication number Publication date
JPH0153416B2 (cs) 1989-11-14

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