JPS58160849A - ガス濃度測定装置 - Google Patents

ガス濃度測定装置

Info

Publication number
JPS58160849A
JPS58160849A JP4420182A JP4420182A JPS58160849A JP S58160849 A JPS58160849 A JP S58160849A JP 4420182 A JP4420182 A JP 4420182A JP 4420182 A JP4420182 A JP 4420182A JP S58160849 A JPS58160849 A JP S58160849A
Authority
JP
Japan
Prior art keywords
boat
sample gas
sample
path
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4420182A
Other languages
English (en)
Japanese (ja)
Other versions
JPS642889B2 (enExample
Inventor
Ryuzo Kano
龍三 加納
Kenji Hirai
研治 平井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP4420182A priority Critical patent/JPS58160849A/ja
Publication of JPS58160849A publication Critical patent/JPS58160849A/ja
Publication of JPS642889B2 publication Critical patent/JPS642889B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/37—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using pneumatic detection

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP4420182A 1982-03-18 1982-03-18 ガス濃度測定装置 Granted JPS58160849A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4420182A JPS58160849A (ja) 1982-03-18 1982-03-18 ガス濃度測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4420182A JPS58160849A (ja) 1982-03-18 1982-03-18 ガス濃度測定装置

Publications (2)

Publication Number Publication Date
JPS58160849A true JPS58160849A (ja) 1983-09-24
JPS642889B2 JPS642889B2 (enExample) 1989-01-19

Family

ID=12684949

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4420182A Granted JPS58160849A (ja) 1982-03-18 1982-03-18 ガス濃度測定装置

Country Status (1)

Country Link
JP (1) JPS58160849A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008196882A (ja) * 2007-02-09 2008-08-28 Taiyo Nippon Sanso Corp ガス分析装置
US8749789B2 (en) 2010-12-27 2014-06-10 Horiba, Ltd. Gas concentration measuring apparatus
JP2022020445A (ja) * 2020-07-20 2022-02-01 株式会社島津製作所 全有機体炭素計、および、全有機体炭素濃度の測定方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008196882A (ja) * 2007-02-09 2008-08-28 Taiyo Nippon Sanso Corp ガス分析装置
US8749789B2 (en) 2010-12-27 2014-06-10 Horiba, Ltd. Gas concentration measuring apparatus
JP2022020445A (ja) * 2020-07-20 2022-02-01 株式会社島津製作所 全有機体炭素計、および、全有機体炭素濃度の測定方法

Also Published As

Publication number Publication date
JPS642889B2 (enExample) 1989-01-19

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