JPS58160848A - 光干渉計 - Google Patents

光干渉計

Info

Publication number
JPS58160848A
JPS58160848A JP57042584A JP4258482A JPS58160848A JP S58160848 A JPS58160848 A JP S58160848A JP 57042584 A JP57042584 A JP 57042584A JP 4258482 A JP4258482 A JP 4258482A JP S58160848 A JPS58160848 A JP S58160848A
Authority
JP
Japan
Prior art keywords
light
wave
optical
optical fiber
light wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57042584A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6352694B2 (enrdf_load_stackoverflow
Inventor
Kiyobumi Mochizuki
望月 清文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KDDI Corp
Original Assignee
Kokusai Denshin Denwa KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Denshin Denwa KK filed Critical Kokusai Denshin Denwa KK
Priority to JP57042584A priority Critical patent/JPS58160848A/ja
Priority to GB8307262A priority patent/GB2117132B/en
Publication of JPS58160848A publication Critical patent/JPS58160848A/ja
Publication of JPS6352694B2 publication Critical patent/JPS6352694B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02015Interferometers characterised by the beam path configuration
    • G01B9/02024Measuring in transmission, i.e. light traverses the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0226Fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP57042584A 1982-03-19 1982-03-19 光干渉計 Granted JPS58160848A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP57042584A JPS58160848A (ja) 1982-03-19 1982-03-19 光干渉計
GB8307262A GB2117132B (en) 1982-03-19 1983-03-16 Interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57042584A JPS58160848A (ja) 1982-03-19 1982-03-19 光干渉計

Publications (2)

Publication Number Publication Date
JPS58160848A true JPS58160848A (ja) 1983-09-24
JPS6352694B2 JPS6352694B2 (enrdf_load_stackoverflow) 1988-10-19

Family

ID=12640111

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57042584A Granted JPS58160848A (ja) 1982-03-19 1982-03-19 光干渉計

Country Status (2)

Country Link
JP (1) JPS58160848A (enrdf_load_stackoverflow)
GB (1) GB2117132B (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02165026A (ja) * 1988-12-20 1990-06-26 Fujitsu Ltd 半導体レーザのfm変調特性測定装置
JPH036431A (ja) * 1989-06-02 1991-01-11 Nippon Telegr & Teleph Corp <Ntt> 光周波数変調特性の測定装置
JPH0359428A (ja) * 1989-07-28 1991-03-14 Fujitsu Ltd 半導体レーザの周波数変調特性測定方法及び装置
JP2015503754A (ja) * 2012-01-11 2015-02-02 コー・ヤング・テクノロジー・インコーポレーテッド 非対称偏光を用いた干渉計及びそれを用いた光学装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1986000402A1 (en) * 1984-06-30 1986-01-16 Kent Scientific And Industrial Projects Limited Interferometric sensor
US4852106A (en) * 1987-02-19 1989-07-25 Brother Kogyo Kabushiki Kaisha Optical system for producing controlled beat frequency
FR2697336B1 (fr) * 1992-10-28 1994-12-16 Inst Francais Du Petrole Procédé et dispositif de mesure différentielle d'indices de réfraction et utilisation associée.
DE102005041491A1 (de) * 2005-09-01 2007-03-08 Robert Bosch Gmbh Interferometrische Messeinrichtung
CN104330162A (zh) * 2014-11-17 2015-02-04 中国科学院光电研究院 一种便携式傅里叶变换光谱仪

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1175855A (en) * 1966-08-25 1970-01-01 American Optical Corp Improvements in or relating to information processors

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02165026A (ja) * 1988-12-20 1990-06-26 Fujitsu Ltd 半導体レーザのfm変調特性測定装置
JPH036431A (ja) * 1989-06-02 1991-01-11 Nippon Telegr & Teleph Corp <Ntt> 光周波数変調特性の測定装置
JPH0359428A (ja) * 1989-07-28 1991-03-14 Fujitsu Ltd 半導体レーザの周波数変調特性測定方法及び装置
JP2015503754A (ja) * 2012-01-11 2015-02-02 コー・ヤング・テクノロジー・インコーポレーテッド 非対称偏光を用いた干渉計及びそれを用いた光学装置

Also Published As

Publication number Publication date
JPS6352694B2 (enrdf_load_stackoverflow) 1988-10-19
GB2117132A (en) 1983-10-05
GB2117132B (en) 1986-01-22
GB8307262D0 (en) 1983-04-20

Similar Documents

Publication Publication Date Title
WO2019210734A1 (zh) 一种基于平面镜反射的激光外差干涉测量装置和方法
JP2005338076A (ja) 偏光操作レトロリフレクタを使用するシステム
US7277180B2 (en) Optical connection for interferometry
US4752133A (en) Differential plane mirror interferometer
JPS62293110A (ja) 角度測定平面鏡干渉計システム
US7426039B2 (en) Optically balanced instrument for high accuracy measurement of dimensional change
EP0244275A2 (en) Angle measuring interferometer
US4802764A (en) Differential plane mirror interferometer having beamsplitter/beam folder assembly
JP4067427B2 (ja) ファイバにおける直交円偏光伝送
JPS58160848A (ja) 光干渉計
CN111562001B (zh) 一种双路四通道偏振干涉成像系统及方法
US5028137A (en) Angular displacement measuring interferometer
JPS61219803A (ja) 物理量測定装置
CN110966939B (zh) 一种干涉测量装置、测量方法及光刻设备
US7705994B2 (en) Monolithic displacement measuring interferometer with spatially separated but substantially equivalent optical pathways and optional dual beam outputs
JPH0385514A (ja) 円偏光発生装置
JPH0739971B2 (ja) 干渉形波長測定装置
Banerjee et al. Broadband achromatic tunable polarization rotator
JPS58160827A (ja) 温度センサ
JPS6134128B2 (enrdf_load_stackoverflow)
JPH0755571A (ja) 偏波分散測定器
JPH05302810A (ja) ヘテロダイン2波長変位干渉計
CN111562003B (zh) 一种高稳定高通量的偏振干涉仪及干涉方法
US20030231390A1 (en) Athermal delay line
JPH0264522A (ja) 光変調器