JPS5815351U - Semiconductor inspection equipment - Google Patents

Semiconductor inspection equipment

Info

Publication number
JPS5815351U
JPS5815351U JP10878981U JP10878981U JPS5815351U JP S5815351 U JPS5815351 U JP S5815351U JP 10878981 U JP10878981 U JP 10878981U JP 10878981 U JP10878981 U JP 10878981U JP S5815351 U JPS5815351 U JP S5815351U
Authority
JP
Japan
Prior art keywords
inspection equipment
semiconductor inspection
semiconductor
detector
sound waves
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10878981U
Other languages
Japanese (ja)
Inventor
又井 定男
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP10878981U priority Critical patent/JPS5815351U/en
Publication of JPS5815351U publication Critical patent/JPS5815351U/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は検出器に本考案の音波を使用している状態を示
す図である。第2図は検出器に光学系の検出器を使用し
ている従来技術を示す図である。 第3図はサファイヤ基板上の半導体装置に照射されてい
る様子を表わした平面図である。 図中1. 1’・・・・・・サファイヤ基板、2. 2
’・・・・・・半導体装置、3,3′・・・・・・照射
範囲、4.4′・・・・・・照射、5.5′・・・・・
・反射、6.6′・・・・・・回転上面、7,7′・・
・・・・側御装置、8,8′・・・・・・検出器、9・
・・・・・透過である。
FIG. 1 is a diagram showing a state in which the sound waves of the present invention are used in a detector. FIG. 2 is a diagram showing a conventional technique in which an optical system detector is used as a detector. FIG. 3 is a plan view showing how a semiconductor device on a sapphire substrate is irradiated. 1 in the figure. 1'... Sapphire substrate, 2. 2
'...Semiconductor device, 3,3'...Irradiation range, 4.4'...Irradiation, 5.5'...
・Reflection, 6.6'...Top surface of rotation, 7,7'...
...Side control device, 8, 8'...Detector, 9.
...It is transparent.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体装置の電気的特性試験に使用される半導体検査装
置において、半導体基板を検出するために音波を利用し
た検出器を有することを特徴とした半導体検査装置。
A semiconductor testing device used for electrical characteristic testing of semiconductor devices, characterized by having a detector that uses sound waves to detect a semiconductor substrate.
JP10878981U 1981-07-22 1981-07-22 Semiconductor inspection equipment Pending JPS5815351U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10878981U JPS5815351U (en) 1981-07-22 1981-07-22 Semiconductor inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10878981U JPS5815351U (en) 1981-07-22 1981-07-22 Semiconductor inspection equipment

Publications (1)

Publication Number Publication Date
JPS5815351U true JPS5815351U (en) 1983-01-31

Family

ID=29903180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10878981U Pending JPS5815351U (en) 1981-07-22 1981-07-22 Semiconductor inspection equipment

Country Status (1)

Country Link
JP (1) JPS5815351U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6070584U (en) * 1983-10-20 1985-05-18 株式会社ハイランド flexible container

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5258946A (en) * 1975-11-10 1977-05-14 Yokogawa Hokushin Electric Corp Displacement detector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5258946A (en) * 1975-11-10 1977-05-14 Yokogawa Hokushin Electric Corp Displacement detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6070584U (en) * 1983-10-20 1985-05-18 株式会社ハイランド flexible container

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