JPS58145556U - Ultrasonic flaw detection equipment - Google Patents
Ultrasonic flaw detection equipmentInfo
- Publication number
- JPS58145556U JPS58145556U JP4273282U JP4273282U JPS58145556U JP S58145556 U JPS58145556 U JP S58145556U JP 4273282 U JP4273282 U JP 4273282U JP 4273282 U JP4273282 U JP 4273282U JP S58145556 U JPS58145556 U JP S58145556U
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- ultrasonic flaw
- circuit
- detection equipment
- echo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の超音波探傷装置における問題点を示す説
明図、第２図は本考案の一実施例になる超音波探傷装置
の構成とその使用態様を示す説明図、第３図は第２図に
おけるエコー処理回路の− 。
作用を示す説明図、第４図は第２図における表示装置１
０の表示例を示す図である。
１１・・・超音波探傷器、１−２１〜１２．・・・探傷
触子、１３・・・エコー処理回路、１４・・・表示制御
回路、１５・・・表示装置、１６・・・形状作図回路、
２０・・・被験体の外形形状、２１・・・エコー源を示
すプロット。Fig. 1 is an explanatory diagram showing problems in conventional ultrasonic flaw detection equipment, Fig. 2 is an explanatory diagram showing the configuration and usage of an ultrasonic flaw detection equipment which is an embodiment of the present invention, and Fig. 3 is an explanatory diagram showing problems in conventional ultrasonic flaw detection equipment. - of the echo processing circuit in Figure 2. An explanatory diagram showing the operation, FIG. 4 is the display device 1 in FIG.
It is a figure which shows the example of a display of 0. 11... Ultrasonic flaw detector, 1-21 to 12. ...Flaw detection probe, 13...Echo processing circuit, 14...Display control circuit, 15...Display device, 16...Shape drawing circuit,
20... External shape of subject, 21... Plot showing echo source.
Claims (1)
の複数の探触子を有する超音波探傷器と、該超音波探傷
器により得られた探傷信号に含まれる所定の設定レベル
以上のエコーについてそのビーム路程を算出すると共に
、該算出されたビーム路程、前記探触子の位置およびビ
ーム方向から前記エコーの発生源位置を算出する回路と
、該回路に接続されて前記算出されたエコーの発生源位
置を平面上に表示する表示装置とを具備したことを特徴
とする超音波探傷装置。Regarding ultrasonic flaw detectors having multiple probes for flaw detection from multiple directions with different beam directions, and echoes exceeding a predetermined set level included in flaw detection signals obtained by the ultrasonic flaw detector. a circuit that calculates the beam path and also calculates the source position of the echo from the calculated beam path, the position of the probe, and the beam direction; and a circuit that is connected to the circuit to generate the calculated echo. 1. An ultrasonic flaw detection device comprising: a display device that displays a source position on a flat surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4273282U JPS58145556U (en) | 1982-03-26 | 1982-03-26 | Ultrasonic flaw detection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4273282U JPS58145556U (en) | 1982-03-26 | 1982-03-26 | Ultrasonic flaw detection equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58145556U true JPS58145556U (en) | 1983-09-30 |
| JPH0222695Y2 JPH0222695Y2 (en) | 1990-06-19 |
Family
ID=30053842
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4273282U Granted JPS58145556U (en) | 1982-03-26 | 1982-03-26 | Ultrasonic flaw detection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58145556U (en) |
-
1982
- 1982-03-26 JP JP4273282U patent/JPS58145556U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0222695Y2 (en) | 1990-06-19 |
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