JPS5854551U - Sample mounting table - Google Patents

Sample mounting table

Info

Publication number
JPS5854551U
JPS5854551U JP15049581U JP15049581U JPS5854551U JP S5854551 U JPS5854551 U JP S5854551U JP 15049581 U JP15049581 U JP 15049581U JP 15049581 U JP15049581 U JP 15049581U JP S5854551 U JPS5854551 U JP S5854551U
Authority
JP
Japan
Prior art keywords
sample
mounting table
sample mounting
placement surface
mounting surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15049581U
Other languages
Japanese (ja)
Inventor
尚武 田中
関 昌浩
及川 政夫
Original Assignee
日本電信電話株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電信電話株式会社 filed Critical 日本電信電話株式会社
Priority to JP15049581U priority Critical patent/JPS5854551U/en
Publication of JPS5854551U publication Critical patent/JPS5854551U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

デ   第1図は従来の載置用台を示す側面図、第2メ
=  及び第3図はその平面図、第・4図〜第′8図は
本考シ  案による載置台の一例を示す平面図である。
Fig. 1 is a side view showing a conventional mounting table, Figs. 2 and 3 are plan views thereof, and Figs. 4 to 8 show examples of the mounting table according to the present invention. FIG.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 真空雰囲気中に於て電子線、X線、放射線等C照射を受
けるべき試料を載置するに用いられる、導電性を有する
試料載置面を有する試料載置面上に於て、上記試料載置
面上に、互に異なる色調苓\有する複数の導電性層が、
上記試料の上記試料載置面上の位置を試別するための試
料載置位置試別)  用層として附されてなる試料載置
用台。
The sample is placed on a sample placement surface having a conductive sample placement surface, which is used to place a sample to be subjected to C irradiation such as electron beams, X-rays, and radiation in a vacuum atmosphere. A plurality of conductive layers having mutually different color tones are placed on the mounting surface.
A sample mounting stand attached as a layer for testing the position of the sample on the sample mounting surface.
JP15049581U 1981-10-08 1981-10-08 Sample mounting table Pending JPS5854551U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15049581U JPS5854551U (en) 1981-10-08 1981-10-08 Sample mounting table

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15049581U JPS5854551U (en) 1981-10-08 1981-10-08 Sample mounting table

Publications (1)

Publication Number Publication Date
JPS5854551U true JPS5854551U (en) 1983-04-13

Family

ID=29943217

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15049581U Pending JPS5854551U (en) 1981-10-08 1981-10-08 Sample mounting table

Country Status (1)

Country Link
JP (1) JPS5854551U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60170481U (en) * 1984-04-23 1985-11-12 ワイケイケイ株式会社 Heat insulation cover body

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60170481U (en) * 1984-04-23 1985-11-12 ワイケイケイ株式会社 Heat insulation cover body
JPH0247736Y2 (en) * 1984-04-23 1990-12-14

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