JPS58153144A - 反射率が異なる複数の組織を有する塊状物質における組織構成比率測定装置 - Google Patents

反射率が異なる複数の組織を有する塊状物質における組織構成比率測定装置

Info

Publication number
JPS58153144A
JPS58153144A JP3589182A JP3589182A JPS58153144A JP S58153144 A JPS58153144 A JP S58153144A JP 3589182 A JP3589182 A JP 3589182A JP 3589182 A JP3589182 A JP 3589182A JP S58153144 A JPS58153144 A JP S58153144A
Authority
JP
Japan
Prior art keywords
reflectance
sample
calculating
composition ratio
histogram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3589182A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6362692B2 (OSRAM
Inventor
Takeo Yamada
健夫 山田
Mitsuaki Uesugi
上杉　満昭
Noriyasu Isaka
居阪　則保
Tatsuo Fukuyama
福山　辰夫
Yoshio Suzuki
喜夫 鈴木
Yoshihiro Funabiki
船曳　佳弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
NKK Corp
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NKK Corp, Nippon Kokan Ltd filed Critical NKK Corp
Priority to JP3589182A priority Critical patent/JPS58153144A/ja
Publication of JPS58153144A publication Critical patent/JPS58153144A/ja
Publication of JPS6362692B2 publication Critical patent/JPS6362692B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP3589182A 1982-03-09 1982-03-09 反射率が異なる複数の組織を有する塊状物質における組織構成比率測定装置 Granted JPS58153144A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3589182A JPS58153144A (ja) 1982-03-09 1982-03-09 反射率が異なる複数の組織を有する塊状物質における組織構成比率測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3589182A JPS58153144A (ja) 1982-03-09 1982-03-09 反射率が異なる複数の組織を有する塊状物質における組織構成比率測定装置

Publications (2)

Publication Number Publication Date
JPS58153144A true JPS58153144A (ja) 1983-09-12
JPS6362692B2 JPS6362692B2 (OSRAM) 1988-12-05

Family

ID=12454643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3589182A Granted JPS58153144A (ja) 1982-03-09 1982-03-09 反射率が異なる複数の組織を有する塊状物質における組織構成比率測定装置

Country Status (1)

Country Link
JP (1) JPS58153144A (OSRAM)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60100032A (ja) * 1983-11-04 1985-06-03 Nireko:Kk 焼結鉱等の顕微鏡画像における自動定量測定方法
JPH01219654A (ja) * 1988-02-29 1989-09-01 Nippon Abionikusu Kk カラー画像解析装置を用いた細胞の核酸量の顕微測光方法
JPH0245734A (ja) * 1988-08-05 1990-02-15 Mitsubishi Heavy Ind Ltd 自動組織解析処理装置
JP2009036716A (ja) * 2007-08-03 2009-02-19 Kansai Coke & Chem Co Ltd 炭素含有粉塵の粉塵種判別方法
JPWO2023054065A1 (OSRAM) * 2021-09-30 2023-04-06

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60100032A (ja) * 1983-11-04 1985-06-03 Nireko:Kk 焼結鉱等の顕微鏡画像における自動定量測定方法
JPH01219654A (ja) * 1988-02-29 1989-09-01 Nippon Abionikusu Kk カラー画像解析装置を用いた細胞の核酸量の顕微測光方法
JPH0245734A (ja) * 1988-08-05 1990-02-15 Mitsubishi Heavy Ind Ltd 自動組織解析処理装置
JP2009036716A (ja) * 2007-08-03 2009-02-19 Kansai Coke & Chem Co Ltd 炭素含有粉塵の粉塵種判別方法
JPWO2023054065A1 (OSRAM) * 2021-09-30 2023-04-06
EP4394353A4 (en) * 2021-09-30 2025-01-22 JFE Steel Corporation Coal analyzer, coal analysis method, mixed coal preparation method, and coke production method

Also Published As

Publication number Publication date
JPS6362692B2 (OSRAM) 1988-12-05

Similar Documents

Publication Publication Date Title
EP0352958A2 (en) Article inspection system
US6470285B1 (en) Method and apparatus for multi-parameter digital pulse pileup rejection
KR102415197B1 (ko) 분율 측정 장치 및 분율 측정 시스템
JPH0644278B2 (ja) 画像解析による組織自動定量測定方法およびその装置
US4453226A (en) Method and apparatus for particle size determination in a host material
JPS58153144A (ja) 反射率が異なる複数の組織を有する塊状物質における組織構成比率測定装置
US20010040217A1 (en) Connection inspecting apparatus, connection inspecting method, and recording medium for recording programs executing the method
JPS60249008A (ja) 荷電粒子マイクロプロ−ブ装置
JPS5822940A (ja) 石炭組織分析法及び装置
JP6892019B2 (ja) 粉率測定方法及び装置
Görz et al. Particle size and shape distributions of lunar fines by CESEMI
Davis et al. Developments in automated reflectance microscopy of coal
JPS6331721B2 (OSRAM)
JPH0575349B2 (OSRAM)
CN107255450B (zh) 一种碳化钨合金粉末的筛选方法
Crelling Automated petrographic characterization of coal lithotypes
JPS5835442A (ja) 石炭組織の自動分析方法
DE4018333A1 (de) Verfahren und vorrichtung zum automatischen erfassen der kanten von haertemesseindruecken
JPS6095354A (ja) 石炭組織の自動分析法
Pratt The use of composite and mosaic imaging of polished surfaces to enhance petrographic analysis of coal by image analysis
JPS60100032A (ja) 焼結鉱等の顕微鏡画像における自動定量測定方法
CN1146013A (zh) 炼焦原料煤纯度分析方法
Browne et al. Digital image recording, image display and characterisation in Stem
DE10393432T5 (de) Phasenverteilungs-Messvorrichtung und Phasenverteilungs-Messverfahren
RU2778816C1 (ru) Способ и аппарат для измерения доли мелких частиц