JPS58147066A - Gate turn off thyristor - Google Patents

Gate turn off thyristor

Info

Publication number
JPS58147066A
JPS58147066A JP3077482A JP3077482A JPS58147066A JP S58147066 A JPS58147066 A JP S58147066A JP 3077482 A JP3077482 A JP 3077482A JP 3077482 A JP3077482 A JP 3077482A JP S58147066 A JPS58147066 A JP S58147066A
Authority
JP
Japan
Prior art keywords
gto
layer
type
auxiliary
gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3077482A
Other languages
Japanese (ja)
Inventor
Hiroyasu Hagino
萩野 浩靖
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3077482A priority Critical patent/JPS58147066A/en
Publication of JPS58147066A publication Critical patent/JPS58147066A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/74Thyristor-type devices, e.g. having four-zone regenerative action
    • H01L29/744Gate-turn-off devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thyristors (AREA)

Abstract

PURPOSE:To enable the impression of sufficient reverse bias between the gate electrode and cathode of an auxiliary gate turn-of thyristor (GTO) resulting in the improvement of turn-off ability by a method wherein the gate electrode of a main GTO is connected to the cathode of the auxiliary GTO via a connection electrode, when the main GTO and the auxiliary GTO are provided with an isolation region placed therebetween. CONSTITUTION:With the isolation region 17 placed between, the main and auxiliary GTO elements 8 and 9 are provided on the both sides thereof into the GTO with the auxiliary GTO built-in. In this constitution, a layer 3 used for the main GTO and a layer 12 used for the auxiliary GTO are formed as the emitter layers, then n type layers thereon are respectively used for the base layers 1 and 10, and p layers thereon are respectively used for the base layers 2 and 11. Further, a plurality of n type emitter layers 4 are formed on the main GTO layer 2, and an n type emitter layer 13 is formed on the auxiliary GTO, and an isolation n type region 18 is provided in the region 17. Thereafter, the gate electrode 7 of the main GTO provided on the layer 2 and the cathode 14 of the auxiliary GTO are coupled via the connection electrode 19.

Description

【発明の詳細な説明】 この!J!明唸補助サイリスタを内蔵するゲート・ター
ンオフサ4リスクに関するものである。
[Detailed description of the invention] This! J! This relates to a gate turn-off switch with a built-in auxiliary thyristor.

一般に、大電流をしや1するのに適したP】Pn4層構
造から表る電力用のゲート・ターンオフサ4リスク(以
下単にGTOと言う)は麺1図に示すように、−島状エ
ミッタ(1つ1つの風ミッタをセグメントと宣う)をゲ
ート電極がと多凹む構造面図である。同図において、(
1111a形ペース層1(21はP形ベース層、(3)
はP形エミッタ層、(4)は多島状に形成したn形エミ
ッタ層、(5)は前記P形エミッタ層(31にオーミッ
ク接触する陽電極、(61#i前記l形エミッタ層(4
)にオーミック接触する陰電極、(7)は前記P形ベー
ス層(21にオーミック接触するゲート電極である。
In general, the power gate turn-off switch (hereinafter simply referred to as GTO) that appears from the P]Pn four-layer structure, which is suitable for suppressing large currents, has an island-like emitter ( FIG. 2 is a structural plan view in which each wind transmitter (hereinafter referred to as a segment) is recessed into a gate electrode. In the same figure, (
1111a type pace layer 1 (21 is P type base layer, (3)
is a P-type emitter layer, (4) is an n-type emitter layer formed in the form of an archipelago, (5) is a positive electrode in ohmic contact with the P-type emitter layer (31), (61#i is the L-type emitter layer (4)
) is a cathode in ohmic contact with the P-type base layer (21), and (7) is a gate electrode in ohmic contact with the P-type base layer (21).

次に、上記構成によるG’f’Oではターンオンし九G
TOをターンオフさせるにはゲート電極(7)と陰電極
(61間を逆バイアスすることによって、電流をひき抜
く。このため、大電流のしゃ断には細長い島状のU形エ
ミッタ層(4)を多数個形成すると共に、この1形工ミ
゛ツタ層(4)直下のP形ベース層(21の横方向抵抗
R(第1図参jl)を減少させる必要がある。
Next, in G'f'O with the above configuration, turn on and 9G
To turn off the TO, current is drawn out by applying a reverse bias between the gate electrode (7) and the cathode (61).For this reason, a long and narrow island-shaped U-shaped emitter layer (4) is used to cut off the large current. In addition to forming a large number of them, it is necessary to reduce the lateral resistance R (jl in FIG. 1) of the P-type base layer (21) directly below the first-former Ivy layer (4).

しかしkから、この構造によるGTOはn形エミッタ層
(4)、P形ベース層(21および態形ベース層(1)
で構成されるトランジスタ部の電流増幅率の低下により
、各セグメントのゲート・トリガ電流Ittが増大する
。しかも、一般のサイリスタに比べてゲート対こうエミ
ッタ局長がはるかに長くなるため、GTO全体のゲート
・トリガ電流Iftは1〜2ムと非常に大きなものとな
る。また、とのGTOを完全にひろげターンオンさせる
ために社ゲート・トリガ電流Xttの10倍以上のハイ
・ゲート・ドライブが必要と力るので、0丁00オンゲ
ート電流としてIOA以上のものが必要となる。このオ
ンゲートは1,000ム、2.000ムのしゃ断が要求
辿れるGTOにおいては更に太きく−e6、ターンオン
損失が大きくなるうえ、ターンゲート回路も大きく危シ
、特に高周波動作において大きな欠点となる。
However, from k, the GTO with this structure consists of an n-type emitter layer (4), a P-type base layer (21) and a morphology base layer (1).
The gate trigger current Itt of each segment increases due to a decrease in the current amplification factor of the transistor section constituted by . Moreover, since the gate-to-emitter length is much longer than that of a general thyristor, the gate trigger current Ift of the entire GTO becomes very large, 1 to 2 μm. Also, in order to completely expand and turn on the GTO, a high gate drive of more than 10 times the gate trigger current Xtt is required, so an on-gate current of more than IOA is required. . This on-gate is even thicker in the GTO-e6, which requires a cut-off of 1,000 μm or 2,000 μm, resulting in a large turn-on loss and a large and dangerous turn gate circuit, which is a major drawback especially in high-frequency operation.

そこで、従来、前記の欠点を除くものとして、補助GT
OをV3m!したGTOか提案されている。
Therefore, conventionally, in order to eliminate the above-mentioned drawbacks, auxiliary GT
O to V3m! A new GTO has been proposed.

すなわち、第2図は従来の補助GTOを内蔵したGTO
を示す断面図である。同図において、(8)は主G’l
’O,(9)は補助G’rO,Qlは前記主G T 0
(8)のl形ベース層(11と共有する補助G’f’0
(9)の態形ベース層、al)は前記10丁0(8)の
P形ペース層(21と共有する補助GTO(9)OP 
形ヘー ス層、a3t[rll= cto(a+Op形
エミッタ層(3)と共有する補助G T 0(9)のP
形エミッタ層、αjは補助G T 0(9)の態形エミ
ッタ層、α憂はこのn形エミッタ層a3にオーミック接
触し、主GTO(81のゲート電極(7)に接触する陰
電極、(Isは補助G T 0(9)のゲート電極、翰
は前記主GTσ8)の陽電極(5)に接続する補助G 
T 0(9)の陽電極である。
In other words, Figure 2 shows a conventional GTO with a built-in auxiliary GTO.
FIG. In the same figure, (8) is the main G'l
'O, (9) is the auxiliary G'rO, Ql is the main G T 0
(8) l-shaped base layer (auxiliary G'f'0 shared with 11)
The form base layer (al) of (9) is the auxiliary GTO (9) OP shared with the P-type space layer (21) of the 10-0 (8).
type Heath layer, a3t[rll=cto(a+P of auxiliary G T 0 (9) shared with Op type emitter layer (3)
The type emitter layer, αj, is the type emitter layer of the auxiliary GT 0 (9), α is in ohmic contact with this n-type emitter layer a3, and the negative electrode, ( Is is the gate electrode of the auxiliary GT 0 (9), and the wire is the auxiliary G connected to the positive electrode (5) of the main GT σ8).
It is the positive electrode of T 0 (9).

この構造によるGiOは前記の欠点を除去することがで
きるが、しかし%P形ベース層(2)が主GTO(8)
と補助G T 0(9)で連結されておシ、さらに、補
助G T 0(9)の陰電極a−が主Gテ0(8)のゲ
ート電極(7)に短絡している丸め、補助G T 0(
9)のゲート・陰電極に十分な逆バイアスがかからなく
なシ、補助G T 0(9)のターンオフ能力が低下す
る欠点があった。
GiO with this structure can eliminate the above-mentioned drawbacks, but the %P type base layer (2) is the main GTO (8).
and an auxiliary G T 0 (9) connected to the auxiliary G T 0 (9), and further, a rounded shape in which the negative electrode a- of the auxiliary G T 0 (9) is short-circuited to the gate electrode (7) of the main G T 0 (8); Auxiliary G T 0 (
There is a drawback that the turn-off ability of the auxiliary G T 0 (9) is deteriorated because a sufficient reverse bias is not applied to the gate/cathode of (9).

したがって、この発明の目的は補助GTOのゲート・陰
電極を十分に逆パイーアスすることができ、補助Gテ0
のターンオン能力を向上することができるGTOを提供
するものである。
Therefore, an object of the present invention is to sufficiently reverse bias the gate and cathode of the auxiliary GTO.
The purpose of the present invention is to provide a GTO that can improve the turn-on ability of the vehicle.

このような目的を達成するため、この発明は主GTOと
補助GTOの間で、P形ベース層に形成した分離態形領
域と、主G’TOのゲート電極と補助GTOO陰電極鵞
接続する!lW!を電極と、前記分離n形領賊とこの接
続電極との間に形成し九絶縁暎とを設Hたものであシ、
以下実施例を用いて詳細に説明する。
To achieve this purpose, the present invention connects the main GTO and the auxiliary GTO with a separate region formed in the P-type base layer, and the gate electrode of the main G'TO and the negative electrode of the auxiliary GTOO! lW! and nine insulating holes formed between the separated n-type conductor and the connecting electrode,
This will be explained in detail below using examples.

第3図はこの発明に係るGTOの一実施例を示す断面図
である。同図において、aηは主GTO(泪と補 6助
G T 0(9)との間に形成し九分離領域、篩は前記
P形ペース層にリン等の不純物によって形成した分離繭
形領域、alは10丁0(8)のゲート電極(7)と補
助G T 0(9)の陰電極α4とを接続する接続電極
、(至)はこの分離n形領域錦と接続電極alとの間に
形成した8102などの絶縁膜、(21)U前記分離a
形領域錦の深さと幅によって決定されゐ抵抗値RDの分
離抵抗である。
FIG. 3 is a sectional view showing an embodiment of the GTO according to the present invention. In the same figure, aη is a separated region formed between the main GTO (Year and auxiliary GTO (9)), and a sieve is a separated cocoon-shaped region formed in the P-type paste layer with impurities such as phosphorus; al is a connection electrode that connects the gate electrode (7) of 10-0 (8) and the negative electrode α4 of auxiliary G T 0 (9), and (to) is between this separated n-type region brocade and the connection electrode al (21)U said separation a
It is a separation resistor with a resistance value RD determined by the depth and width of the shape area.

この構造によるGTOでは分離抵抗(21)の大きさが
、補助c T 0(9)のゲート逆バイアスの大きさを
決定するので、この分離抵抗(21)D大きさを適性値
、例えば数1000に設定することにより、補助GTO
(9)のゲート・陰電極に十分な逆バイアスをかけるこ
とができる。このため、補助GTO(91がターンオン
したのち、主G T 0(81をターンオンさせること
ができる。
In the GTO with this structure, the magnitude of the isolation resistor (21) determines the magnitude of the gate reverse bias of the auxiliary c By setting the auxiliary GTO
(9) A sufficient reverse bias can be applied to the gate/cathode. Therefore, after the auxiliary GTO (91) is turned on, the main GTO (81) can be turned on.

以上詳細に説明したように、この発明に係るゲート・タ
ーンオフ能力リ2り、によれば補助GTOのゲート・陰
極間に十分な逆バイアスをかけることができる丸め、こ
の補助GTOのターンオフ能力が向上し、オン損失の少
をいGTOを構成することができる効果がある。
As explained in detail above, according to the gate turn-off ability improvement according to the present invention, it is possible to apply a sufficient reverse bias between the gate and cathode of the auxiliary GTO, and the turn-off ability of this auxiliary GTO is improved. However, it is possible to construct a GTO with less on-loss.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のゲート・ターンオフサイリスタを示す断
面図、第2図社従来の補助ゲート・タンオフサイリスタ
を内置したゲート・ターンオフサイリスタを示す断面図
、第3図はこの発明に係るゲート・ターンオフサイリス
タの一実施例を示す断面図である。 (11−・・・1形ベ一ス層、(21・・・−P形ペー
ス層、(31・・・・P形エミッタ層、(4)・・−・
n形エミッタ層、(5)・・−・陽電極、(6)・・・
・陰電極、(7)・・・・ゲート電極、(8)・・・・
主GTO1(9)・・・・補助G’rO%(II・・・
en形ペース層、al)・・・・P形ベース層、α2・
・魯・P形エミッタ層、0・・・eII形エミッタ層、
α尋・・・−陰電極、αり・・・・ゲート電極、(le
・′・・・陽電極、aη・・・・分離領域、篩・・・・
分離n影領域、al・・・1接続電極、翰・・・・絶縁
膜、(21)・・・・分離抵抗。 代理人 葛 野 信 −(外1名)
Fig. 1 is a sectional view showing a conventional gate turn-off thyristor, Fig. 2 is a sectional view showing a gate turn-off thyristor with a conventional auxiliary gate turn-off thyristor installed therein, and Fig. 3 is a sectional view showing a gate turn-off thyristor according to the present invention. FIG. 2 is a sectional view showing an example of a thyristor. (11-...1 type base layer, (21...-P type paste layer, (31...P type emitter layer, (4)...
N-type emitter layer, (5)... positive electrode, (6)...
・Cathode electrode, (7)...Gate electrode, (8)...
Main GTO1 (9)... Auxiliary G'rO% (II...
en-type pace layer, al)...P-type base layer, α2.
・P-type emitter layer, 0... eII-type emitter layer,
α fathom...-cathode, αri...gate electrode, (le
・′・・・Positive electrode, aη...Separation area, sieve...
Separation n shadow area, al...1 connection electrode, wire...insulating film, (21)...separation resistor. Agent Shin Kuzuno - (1 other person)

Claims (1)

【特許請求の範囲】[Claims] P形エミッタ層、n形ペース層、P形ベース層および一
形工ンツタ層、このn形エミッタ層にオーミック接触す
る陰電極、前記P形成−ス層にオーミック接触すネゲー
ト電極、前記P形エミッタ層にオーミック接触する陽電
極から構成するT’npn4層構造の主ゲート・ターン
オフサイリスタと、この主ゲート・ターンオフサイリス
タのP形エミッタ層、n形ベーメ層およびP形ベース層
を共有し、このP形ベース層上に形成したn形エミッタ
層、このl形エミッタ層に1−ミック接触すると共に主
ゲート・ターンオフサイリスタのゲート電極とIl絞す
る陰電極、前記共有のP形ベース層上にオーミック接触
するゲート電極から構成するPnPn4層構造の、補助
ゲート・ターンオフサイリスタとを儒えたゲート・ター
ンオフサ4リスクにおいて、前記主ゲート・ターンオフ
サイリスタと補助ゲート・ターンオフサイリスタの間で
、前記P形ベース層に形成した分離n形領琥と、主ゲー
ト・ターンオフサ4リスクのゲート電極と補助ゲートの
ターンオフサイリスタの陰電極をII綬する**電極と
、前記分離n影領域ととの接続電極との間に形成しえ絶
縁膜とを設ヒたことを特徴とするゲート・ターンオフサ
イリスタ。  □
a P-type emitter layer, an n-type space layer, a P-type base layer and a one-type conductor layer, a cathode in ohmic contact with the n-type emitter layer, a negating electrode in ohmic contact with the P-type space layer, and the P-type emitter. A main gate/turn-off thyristor with a T'npn four-layer structure consisting of a positive electrode in ohmic contact with the main gate/turn-off thyristor, and a P-type emitter layer, an n-type Boehme layer, and a P-type base layer of this main gate/turn-off thyristor are shared. an n-type emitter layer formed on the shared p-type base layer; a negative electrode in 1-mic contact with the l-type emitter layer and in contact with the gate electrode of the main gate turn-off thyristor; and an ohmic contact on the shared p-type base layer. In the gate turn-off switch 4 having an auxiliary gate turn-off thyristor and having a PnPn four-layer structure consisting of a gate electrode of formed between the separated n-type connecting electrode, the gate electrode of the main gate turn-off sensor 4 risk, the cathode electrode of the turn-off thyristor of the auxiliary gate, and the connecting electrode with the separated n-type shadow region. A gate turn-off thyristor characterized by having a thin insulating film. □
JP3077482A 1982-02-25 1982-02-25 Gate turn off thyristor Pending JPS58147066A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3077482A JPS58147066A (en) 1982-02-25 1982-02-25 Gate turn off thyristor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3077482A JPS58147066A (en) 1982-02-25 1982-02-25 Gate turn off thyristor

Publications (1)

Publication Number Publication Date
JPS58147066A true JPS58147066A (en) 1983-09-01

Family

ID=12313026

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3077482A Pending JPS58147066A (en) 1982-02-25 1982-02-25 Gate turn off thyristor

Country Status (1)

Country Link
JP (1) JPS58147066A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62204353U (en) * 1986-06-18 1987-12-26

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50102275A (en) * 1974-01-07 1975-08-13
JPS51116683A (en) * 1975-04-04 1976-10-14 Mitsubishi Electric Corp Semiconductor control unit
JPS54163686A (en) * 1978-06-15 1979-12-26 Nippon Electric Co Semiconductor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50102275A (en) * 1974-01-07 1975-08-13
JPS51116683A (en) * 1975-04-04 1976-10-14 Mitsubishi Electric Corp Semiconductor control unit
JPS54163686A (en) * 1978-06-15 1979-12-26 Nippon Electric Co Semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62204353U (en) * 1986-06-18 1987-12-26
JPH0528781Y2 (en) * 1986-06-18 1993-07-23

Similar Documents

Publication Publication Date Title
JPS6043032B2 (en) gate turn off thyristor
US4092703A (en) Gate controlled semiconductor device
JPS6019147B2 (en) gate turn off thyristor
JPH0691244B2 (en) Gate turn-off thyristor manufacturing method
JPS6353702B2 (en)
JPH0138381B2 (en)
JPS58147066A (en) Gate turn off thyristor
JPS5938056Y2 (en) semiconductor switchgear
JPH01253274A (en) Reverse conduction gto thyristor
JPS58194366A (en) Semiconductor control rectifier
JPH0682832B2 (en) Semiconductor switching device
JPH0691246B2 (en) Semiconductor device
JPS61182259A (en) Gate turn-off thyristor
JPH0448024Y2 (en)
JPS587068B2 (en) thyristor
JPS583388B2 (en) Hand tie souchi
JPH0117266B2 (en)
JPS58206159A (en) Gate turn-off thyristor
JPS6146983B2 (en)
JPS6348135Y2 (en)
JPS55108765A (en) Semiconductor device
JPS60957B2 (en) Manufacturing method for semiconductor devices
JPH01111375A (en) Gate turn-off thyristor
JPH0752777B2 (en) Fast diode
JPS60170934A (en) Manufacture of semiconductor device