JPS58137773A - 回路基板テストシステムに用いるフイクスチア - Google Patents

回路基板テストシステムに用いるフイクスチア

Info

Publication number
JPS58137773A
JPS58137773A JP57020397A JP2039782A JPS58137773A JP S58137773 A JPS58137773 A JP S58137773A JP 57020397 A JP57020397 A JP 57020397A JP 2039782 A JP2039782 A JP 2039782A JP S58137773 A JPS58137773 A JP S58137773A
Authority
JP
Japan
Prior art keywords
test
well
board
glove
positions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57020397A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0224346B2 (enrdf_load_stackoverflow
Inventor
Mitsunori Ogata
尾形　充紀
Yasuo Machino
町野　靖雄
Takashi Harashima
原島　孝
Kyoya Aoyama
青山　恭也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
M I TECHNICAL SERVICE KK
Original Assignee
M I TECHNICAL SERVICE KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by M I TECHNICAL SERVICE KK filed Critical M I TECHNICAL SERVICE KK
Priority to JP57020397A priority Critical patent/JPS58137773A/ja
Publication of JPS58137773A publication Critical patent/JPS58137773A/ja
Publication of JPH0224346B2 publication Critical patent/JPH0224346B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57020397A 1982-02-10 1982-02-10 回路基板テストシステムに用いるフイクスチア Granted JPS58137773A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57020397A JPS58137773A (ja) 1982-02-10 1982-02-10 回路基板テストシステムに用いるフイクスチア

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57020397A JPS58137773A (ja) 1982-02-10 1982-02-10 回路基板テストシステムに用いるフイクスチア

Publications (2)

Publication Number Publication Date
JPS58137773A true JPS58137773A (ja) 1983-08-16
JPH0224346B2 JPH0224346B2 (enrdf_load_stackoverflow) 1990-05-29

Family

ID=12025878

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57020397A Granted JPS58137773A (ja) 1982-02-10 1982-02-10 回路基板テストシステムに用いるフイクスチア

Country Status (1)

Country Link
JP (1) JPS58137773A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200115844A (ko) * 2019-03-27 2020-10-08 주식회사 경신 회로 기판 검사 장치 및 방법
US11390430B2 (en) 2012-09-25 2022-07-19 Fisher & Paykel Healthcare Limited Lid construction for breathing apparatus
US12220383B2 (en) 2018-11-27 2025-02-11 The Regents Of The University Of Colorado Securement assembly for enteral and vesical access devices and related methods

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04102439U (ja) * 1991-01-25 1992-09-03 石川島播磨重工業株式会社 熱電対による温度測定装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11390430B2 (en) 2012-09-25 2022-07-19 Fisher & Paykel Healthcare Limited Lid construction for breathing apparatus
US11565856B2 (en) 2012-09-25 2023-01-31 Fisher & Paykel Healthcare Limited Lid construction for breathing apparatus
US11858695B2 (en) 2012-09-25 2024-01-02 Fisher & Paykel Healthcare Limited Lid construction for breathing apparatus
US12291377B2 (en) 2012-09-25 2025-05-06 Fisher & Paykel Healthcare Limited Lid construction for breathing apparatus
US12220383B2 (en) 2018-11-27 2025-02-11 The Regents Of The University Of Colorado Securement assembly for enteral and vesical access devices and related methods
KR20200115844A (ko) * 2019-03-27 2020-10-08 주식회사 경신 회로 기판 검사 장치 및 방법

Also Published As

Publication number Publication date
JPH0224346B2 (enrdf_load_stackoverflow) 1990-05-29

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