JPS58137743A - 電着絶縁皮膜検査装置 - Google Patents

電着絶縁皮膜検査装置

Info

Publication number
JPS58137743A
JPS58137743A JP2021182A JP2021182A JPS58137743A JP S58137743 A JPS58137743 A JP S58137743A JP 2021182 A JP2021182 A JP 2021182A JP 2021182 A JP2021182 A JP 2021182A JP S58137743 A JPS58137743 A JP S58137743A
Authority
JP
Japan
Prior art keywords
conductive
liquid
electrodeposited
insulating film
nozzle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021182A
Other languages
English (en)
Japanese (ja)
Other versions
JPH025270B2 (enrdf_load_stackoverflow
Inventor
Tsugio Nishimura
西村 次男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2021182A priority Critical patent/JPS58137743A/ja
Publication of JPS58137743A publication Critical patent/JPS58137743A/ja
Publication of JPH025270B2 publication Critical patent/JPH025270B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20Investigating the presence of flaws
    • G01N27/205Investigating the presence of flaws in insulating materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP2021182A 1982-02-09 1982-02-09 電着絶縁皮膜検査装置 Granted JPS58137743A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2021182A JPS58137743A (ja) 1982-02-09 1982-02-09 電着絶縁皮膜検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2021182A JPS58137743A (ja) 1982-02-09 1982-02-09 電着絶縁皮膜検査装置

Publications (2)

Publication Number Publication Date
JPS58137743A true JPS58137743A (ja) 1983-08-16
JPH025270B2 JPH025270B2 (enrdf_load_stackoverflow) 1990-02-01

Family

ID=12020825

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021182A Granted JPS58137743A (ja) 1982-02-09 1982-02-09 電着絶縁皮膜検査装置

Country Status (1)

Country Link
JP (1) JPS58137743A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH025270B2 (enrdf_load_stackoverflow) 1990-02-01

Similar Documents

Publication Publication Date Title
EP3088877A1 (en) Electrical impedance hematocrit sensor comprising sample plate and sample apparatus
SE518642C2 (sv) Förfarande, anordning för att förse ett substrat med visköst medium, anordning för korrigering av applikationsfel samt användningen av utskjutnings- organ för korrigering av appliceringsfel
KR910016434A (ko) 완전한 삼-차원 물체를 가동하기 위한 장치 및 그 방법
JPH0557870A (ja) 流動体塗布方法および装置
EP0112002B1 (en) Liquid level detecting probe
CA2088016A1 (en) Solder wave parameters analyzer
US20040134684A1 (en) Laminate comprised of flat conductor elements
JPS58137743A (ja) 電着絶縁皮膜検査装置
KR970073249A (ko) 다층의 프린트회로 기판용의 제조라인(manufacturing line for multi-layered printed circuit board)
CN103954819B (zh) 近零偏时半导体红外光电探测器表面暗电流的测量方法
SE9601565L (sv) Anordning för mätning av en elektrisk storhet hos mjölk
TW382880B (en) Horizontal soldering system with oil blanket
US4983270A (en) Device for controlling the amount of a solid paint component in electrodeposition coating
KR860003469Y1 (ko) 전착(電着) 절연피막 검사장치
US5554412A (en) Solder spray leveller
WO2022265943A3 (en) Device and methods for characterization of semiconductor films
JPS642886B2 (enrdf_load_stackoverflow)
JPH04343076A (ja) 電着絶縁皮膜検査装置
JP2538007Y2 (ja) 溶融半田の噴流高さ測定装置
JP3911635B2 (ja) 板状基板の貼り合わせ方法及び板状基板の貼り合わせ装置
JPH0210453Y2 (enrdf_load_stackoverflow)
JPS60149956A (ja) 抵抗器における塗膜の検査装置
JPH01229958A (ja) 誘電体ガラス膜のピンホール特性評価方法
JP3344412B2 (ja) 塗布装置
JP4135489B2 (ja) 電気銅めっき装置および電気銅めっき方法