JPS58134441A - Treating device for wafer - Google Patents
Treating device for waferInfo
- Publication number
- JPS58134441A JPS58134441A JP1691082A JP1691082A JPS58134441A JP S58134441 A JPS58134441 A JP S58134441A JP 1691082 A JP1691082 A JP 1691082A JP 1691082 A JP1691082 A JP 1691082A JP S58134441 A JPS58134441 A JP S58134441A
- Authority
- JP
- Japan
- Prior art keywords
- pallet
- wafer
- transfer path
- carrier
- washing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【発明の詳細な説明】
本発明はLSI1lI造プロセスの自動化技術の改良に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to improvements in automation technology for LSI manufacturing processes.
1Ojli業は64Kbit RAM 量産開始によ
り超LSI時代を迎え九。又、実在、試作研究段階にあ
る256Kl)it RAMも数年で商品化されるよ
うKしている。256Kbit RAMではパターン寸
法1−LJSμat、 lチップ内に集積され九素子
数60製造するためKは、製造環境の高りリーン化、製
造工程の精密。imm化を図る必要があり・7’042
プロセス自動化は、L8I製造ラインを構成する数十種
以上の製造装置をすべて自動化すると共に、ウェハ移送
装置により製造i!置から製造装置ヘウェハを自動的に
移哀できるようにし、計算機システムにより、これら装
置を集中−御することるL8工自動製造システムが望ま
れている。かかるLSIの製造の工椙数は洗浄・熱処理
、不純物導入工程等100,150工程であるといわれ
てLSIの微細化・高集積化は製造環境の高クリーン化
を必要とする。1 Ojili industry entered the era of ultra-LSI with the start of mass production of 64Kbit RAM. In addition, 256Kl)it RAM, which is currently in the prototype research stage, is expected to be commercialized in a few years. For 256Kbit RAM, the pattern size is 1-LJSμat, and K is a highly lean manufacturing environment and precision manufacturing process because it is integrated into a chip and produces 60 nine elements. It is necessary to convert it to imm・7'042
Process automation involves automating all the dozens of types of manufacturing equipment that make up the L8I manufacturing line, and using wafer transfer equipment to manufacture i! There is a need for an L8 automated manufacturing system that can automatically transfer wafers from one location to another and centrally control these devices using a computer system. It is said that manufacturing such an LSI requires 100,150 steps such as cleaning, heat treatment, impurity introduction steps, etc., and the miniaturization and high integration of LSIs requires a highly clean manufacturing environment.
L8工製造談置では、ガス流量・ガス組成、ff1度、
真空度−を制御することによりつ・・・上で進行してい
る物!的・化学的変化を間接的に制御しているので、装
置形状に依存する均熱性等の条件が満足しておれば、1
枚処理で奄、バッチ処理部も制御性・再現性の点で区別
がなく、むしろ、量産性の点でバッチ処理が優れている
こともあり、バッチ処理での自動化も考えられている。At the L8 manufacturing station, gas flow rate, gas composition, ff1 degree,
By controlling the degree of vacuum... things that are progressing above! Since physical and chemical changes are indirectly controlled, if conditions such as thermal uniformity that depend on the device shape are satisfied, 1
There is no distinction between sheet processing and batch processing sections in terms of controllability and reproducibility.In fact, batch processing is superior in terms of mass production, and automation of batch processing is also being considered.
そこで、ウェハのハンドリングとしてはテフロンキャリ
アと石英キャリア間のウニ・・の移1換えにより行われ
、カセットツウカセット式が行われる。Therefore, wafer handling is performed by transferring urchins between a Teflon carrier and a quartz carrier, and a cassette-to-cassette method is used.
ウェハ移送方式としては空気トラックによる1枚移送方
式とウニノ・をテフロンキャリア等のカセットに収納し
て移送する一括移送方式が考えられる。Possible wafer transfer methods include a single wafer transfer method using an air truck and a batch transfer method in which wafers are stored in a cassette such as a Teflon carrier and transferred.
ウェハ単体の移送の方法で、現在−搬的に使用されてい
るものは、エアーベアリング方式、ゴムベルト方式1機
械方式等があります。これらの方式は、いずれも、移送
路自−些駆動機構を持っており■清浄度の維持 ■設備
レイアウト変更への対処 ■移送路の変更等に欠点を持
っています。The methods currently used for transporting single wafers include air bearing methods, rubber belt methods, and mechanical methods. All of these methods have a self-driving mechanism for the transfer path, and have drawbacks such as ■maintenance of cleanliness, ■dealing with changes in equipment layout, and ■changes in the transfer path.
まえ、ウェハの一括移送方法では空のウェハキャリアを
ウニノ・アンローダに装てんできる位置まで移動し、ハ
ンドにより空のウェハキャリアをウェハアンローダに装
てんする。ウェハローダに処aするウェハをウェハアン
ローダに処理され九ウェハを収納する空のウェtハキャ
リアt−装てんし九のちウェハ処理が開始できる。処理
が終るとウェハの入っ九ウェハキャリアをウェハアンロ
ーダからハンドにより積み込み、次のウニノ・処理を行
う処理部へ移送する。First, in the wafer bulk transfer method, empty wafer carriers are moved to a position where they can be loaded onto the UNINO unloader, and the empty wafer carriers are loaded onto the wafer unloader using a hand. A wafer to be processed is loaded into a wafer loader and an empty wafer carrier is loaded into a wafer unloader, and then wafer processing can be started. When the processing is completed, the nine wafer carriers containing the wafers are manually loaded from the wafer unloader and transferred to the processing section where the next processing will be performed.
ところでウェハの一括移送方法ではウェハのキャリアを
移送するパレットは長時間連続して使用されるものであ
るから蒸着膜のはく離等によるダスト或いは空気中から
のダストが蓄積し不具合を生ずることが考えられる。By the way, in the wafer bulk transfer method, the pallet that transfers the wafer carriers is used continuously for a long time, so it is possible that dust due to peeling of the vapor deposited film or dust from the air may accumulate and cause problems. .
本発明は上述0点瞥鑑“てなされえも′)′″thす・
ウェハを移送するパレットと、該パレットの移送路と、
該パレット移−路に接続する少くとも1つ、11.・、
、1.、。The present invention is based on the above-mentioned 0-point review
A pallet for transferring wafers, a transfer path for the pallet,
at least one connected to said pallet transfer path; 11.・、
, 1. ,.
のウェハ処理部と、該パレットを所定のウェハ処理部に
移送しパレット中のウェハを該ウニノ・処理部で処理す
る制御装置を有する処理装置において、該パレットの移
送路にパレットの液体洗浄処理部を設け、該パンツ)K
洗浄液切9部を設は九ことを特徴とするウェハ処理装置
を提供するものである。In a processing device that has a wafer processing section and a control device that transfers the pallet to a predetermined wafer processing section and processes the wafers on the pallet in the processing section, a pallet liquid cleaning processing section is provided on the pallet transfer path. and the pants) K
The present invention provides a wafer processing apparatus characterized by having nine cleaning liquid drains.
本発明はウェハの搬送中での汚染をなくすべく、洗浄工
程を有したウニノー搬送システムであり、ウェハを収納
し九キャリアもしくはウニ/1単体をのせるウェハ収納
部とウニノ・収納部を移送する駆動部を有するパレット
を定期的に洗浄(自動)する事によシ、2常にウニノー
はクリーンはノくレット上に搭載される事を特徴とじ九
ものでありますO以下本発明の実施例を詳述する。The present invention is a Unino transport system that has a cleaning process in order to eliminate contamination during wafer transport, and transports the wafer storage section where wafers are stored and a 9 carrier or Uni/1 unit is placed, and the UniNo/Storage section. By periodically (automatically) cleaning the pallet with the drive part, the 2 Always Clean Uninow is characterized by being mounted on a noklet.O Below, embodiments of the present invention will be described in detail. Describe.
第1図は本発明のパレットの斜視図であり、1はウニノ
1単体もしくはウニノ・を載置したキャリアを収納する
ウニノ・収納箱である。ウニノー収納箱1の底面もしく
は側面にはノくレットの液体洗浄時に液切れを良くし、
乾燥が容易なように洗浄液切り部としての小孔2が設け
られている。3はウニノー収納箱に設けた自在車である
。番は駆動部で1通信制御部、駆動機構を有し、中央制
御処理装置からの指令で駆動される。6は駆動軸である
。FIG. 1 is a perspective view of the pallet of the present invention, and numeral 1 is a storage box for storing a single sea urchin or a carrier on which a sea urchin is placed. On the bottom or side of the UniNo storage box 1, there is a hole to make it easier to drain the liquid when cleaning the Noclet.
A small hole 2 is provided as a cleaning liquid cutter to facilitate drying. 3 is a freewheel installed in the Uni-No storage box. The drive section has one communication control section and a drive mechanism, and is driven by commands from the central control processing unit. 6 is a drive shaft.
ウェハ収納箱1はテフロン、塩ビ等の樹脂を用いること
ができる。駆動部番は樹脂等で密閉され九構造であり、
洗浄液での洗浄に%用いることができる0なお、6のよ
うに耐洗浄用にし九アンテナを設けることもできる。The wafer storage box 1 can be made of resin such as Teflon or PVC. The drive part number is sealed with resin etc. and has a nine structure.
In addition, it is also possible to provide a cleaning-resistant antenna like 6, which can be used for cleaning with a cleaning liquid.
II2図は本発明のウニノ・処理装置の概略図であシ、
21はパレット洗浄処理部、22〜25は拡散、ODD
、蒸着、現儂轡の処1lt−行う処理部であり、26は
ロット雇貌取、パレットからのウェハのハンドリングを
行うウェハキャリアノ1ンドリンクロボツトであるo2
1はパレットの移送路、28はパレットの待機路である
0パレツトの移送、パレットO洗S、ハンドリングロボ
ット26(16作、拡散、ODD、蒸着等の処理は図示
しない中央制御装置からの指令で制御される。Figure II2 is a schematic diagram of the unino processing device of the present invention.
21 is a pallet cleaning processing section, 22 to 25 are diffusion, ODD
, evaporation, and the current processing unit 1lt-; 26 is a wafer carrier node link robot that performs lot collection and handling of wafers from pallets; o2;
1 is a pallet transfer path, and 28 is a pallet waiting path. 0 Pallet transfer, pallet O-washing S, handling robot 26 (16 productions, processes such as diffusion, ODD, vapor deposition, etc. are carried out by commands from a central controller (not shown). controlled.
本発明により下記機能【持九せることができるO■ パ
レットの清浄[を保つえめに、ツクレット洗浄装置を移
送路より分岐され九個所に設け、定期的に洗浄を行なう
O)(レットに搭載され九キャリアも一繍に洗浄を行な
う事が出来る。The present invention has the following functions: In order to maintain the cleanliness of the pallets, Tsukuret cleaning devices are installed at nine locations branching off from the transfer path to periodically clean the pallets. Nine carriers can also be washed in one go.
■ ウェハはキャリアに収容された状態で、パレットの
上に搭載されて移送されろ。■ The wafer is housed in a carrier and is loaded onto a pallet and transported.
■ パレットは自走機能を有し、中央制御盤の指令によ
り動く。■ The pallet has a self-propelling function and moves according to commands from the central control panel.
■ 使用されないパレットはパレット待機通路で待機状
態となる。■ Unused pallets are kept on standby in the pallet waiting aisle.
Cウェハ各工程を結ぶ丸めの移送路を持つ((連結組立
は自在)。It has a round transfer path that connects each C wafer process ((connection and assembly can be done freely).
Cパレットはキャリアよりも若干大きい1度Kl)コン
パクト化できる。The C pallet is slightly larger than the carrier and can be made more compact.
■ 各工程のIN及びOUT部にウェハキャリ□アハン
ドリングロボットを持ち、ロットムの貌み取シ及びパレ
ットからのキャリアのハンドリング機能を持つ。■ There is a wafer carrier □handling robot at the IN and OUT sections of each process, and it has the function of picking up the rotor and handling carriers from pallets.
本発明は次の特長及び効果を有する。The present invention has the following features and effects.
■ パレット及びキヤ?アの洗浄がラインから外すこと
なく洗浄出来る。■ Palette and gear? A can be cleaned without removing it from the line.
■ 清浄[Kついては直接ウェハが接することなく搬送
される丸めパレットの清浄度とキャリアの清浄度を管理
しておけば、ウニノ・O清浄度は充■ 移送路は簡単な
構造にでき、コスト、スペース効率もよく移送路変更も
容易に出来る。■ Regarding cleanliness [K], if you manage the cleanliness of the rounding pallet and the carrier that are transported without wafers coming in direct contact with them, the cleanliness of UNINO-O can be satisfied. It is space efficient and transfer route can be changed easily.
菖1511は本発明のパレットの斜視図、IN2図は本
発−のウェハ処垣装置の概略図である。
1:ウェハ収納箱、番;駆動部、21:ウェハ洗浄処理
部、21:パレットの移送路。Iris 1511 is a perspective view of the pallet of the present invention, and figure IN2 is a schematic diagram of the wafer processing device of the present invention. 1: Wafer storage box, number: drive section, 21: wafer cleaning processing section, 21: pallet transfer path.
Claims (1)
移送路と、該パレット移送路に接続する少くとも1つΩ
つ、エバ処境部と、該パレットヲ所定のウェハ処境部に
移送しパレット中のウェハt−蚊つエバ処理部で処理す
る制御装−とを有し、該パレットの移送路にパレットの
液体洗浄処理部を設は九ことt%黴とするウェノ・処理
装置。 (勾 上記パレットがウェノ・収納箱と駆動部とを有す
る特許請求の範囲第1項記載のウェノ1処理装置。(1) A pallet for transferring wafers, a transfer path for the pallet, and at least one ohm connected to the pallet transfer path
It has an evaporation processing section and a control device for transferring the pallet to a predetermined wafer processing section and processing the wafers in the pallet in the evaporation processing section, and the pallet liquid is connected to the transfer path of the pallet. Weno treatment equipment that has a cleaning treatment section that removes 9 t% mold. The weno 1 processing apparatus according to claim 1, wherein the pallet includes a weno storage box and a drive section.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1691082A JPS58134441A (en) | 1982-02-04 | 1982-02-04 | Treating device for wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1691082A JPS58134441A (en) | 1982-02-04 | 1982-02-04 | Treating device for wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58134441A true JPS58134441A (en) | 1983-08-10 |
Family
ID=11929288
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1691082A Pending JPS58134441A (en) | 1982-02-04 | 1982-02-04 | Treating device for wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58134441A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60187027A (en) * | 1984-03-07 | 1985-09-24 | Marine Instr Co Ltd | Washing method of parts |
JPS61153340U (en) * | 1985-03-13 | 1986-09-22 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5389671A (en) * | 1977-01-19 | 1978-08-07 | Hitachi Ltd | Continuous treating apparatus |
JPS5619635A (en) * | 1979-07-27 | 1981-02-24 | Hitachi Ltd | Manufacturing apparatus |
-
1982
- 1982-02-04 JP JP1691082A patent/JPS58134441A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5389671A (en) * | 1977-01-19 | 1978-08-07 | Hitachi Ltd | Continuous treating apparatus |
JPS5619635A (en) * | 1979-07-27 | 1981-02-24 | Hitachi Ltd | Manufacturing apparatus |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60187027A (en) * | 1984-03-07 | 1985-09-24 | Marine Instr Co Ltd | Washing method of parts |
JPS61153340U (en) * | 1985-03-13 | 1986-09-22 | ||
JPH058675Y2 (en) * | 1985-03-13 | 1993-03-04 |
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