JPS58127320A - Device for liquid-phase epitaxial growth - Google Patents
Device for liquid-phase epitaxial growthInfo
- Publication number
- JPS58127320A JPS58127320A JP878482A JP878482A JPS58127320A JP S58127320 A JPS58127320 A JP S58127320A JP 878482 A JP878482 A JP 878482A JP 878482 A JP878482 A JP 878482A JP S58127320 A JPS58127320 A JP S58127320A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- melt
- growth
- main body
- peripheral part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02387—Group 13/15 materials
- H01L21/02395—Arsenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02625—Liquid deposition using melted materials
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【発明の詳細な説明】
この発明はスライド式カーlンボートを用ψた液相エピ
タキシャル成長装置の改良に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement of a liquid phase epitaxial growth apparatus using a sliding carbon boat.
一般に、スライド式カーボンが一トを用い、溶質原子で
飽和したメルトから徐冷によって化合物半導体を単結晶
からなる被成長基板上に液相エピタキシャル成長させる
場合、メルト溜のカーがン壁からの熱放散が大きいため
に、前記基板表面付近でメルト中に2次元的な温度勾配
が生ずる。この結果、相対的に低温となるカーがン壁付
近の基板上に異常結晶成長が生ずる。Generally, when a compound semiconductor is grown by liquid phase epitaxial growth on a single-crystal growth substrate by slowly cooling a melt saturated with solute atoms using a sliding type carbon, heat dissipates from the carbon wall of the melt reservoir. Since the temperature is large, a two-dimensional temperature gradient occurs in the melt near the substrate surface. As a result, abnormal crystal growth occurs on the substrate near the carbon wall where the temperature is relatively low.
このような基板周辺部上の異常結晶成長は、メルトの滑
らかな除去を阻害し、ワイプオフの不良、成長部表面の
引掻き傷、カーがンカートのエツジ部の損傷などを生じ
、とくに連続多層エピタキシャル成長の場合に結晶性悪
化の原因となる。Such abnormal crystal growth on the periphery of the substrate impedes the smooth removal of the melt, causing poor wipe-off, scratches on the surface of the growth area, and damage to the edges of the carton, especially in continuous multilayer epitaxial growth. In some cases, it may cause deterioration of crystallinity.
これらを避けるために、第1図に示すようなメルト濡壁
を形成するカーがンボート本体1と、メルト溜の底を形
成しかつ前記が一ト本体1に対してスライド可能に挿入
された基板ホルダ兼用のスライ〆2とからなるカー?ン
カートにおいて、第2図に示すように1メルト溜1aの
開口面積を被成長基板3よりも大きくシ、メルト4で前
記基板30表面を十分に覆いつくせるようにし、基板3
面内でのメルト4の温度分布を小さくすることが考えら
れる。しかし、これは、メルトに比べて密度が小さい基
板がメルト中に浮上してしまい、また基板の単位面積当
りの溶質の供給源が基板周辺部で大きくなることにより
異常成長が避けられないなどの不都合がある。In order to avoid these problems, a carburetor main body 1 forming a melt wetted wall as shown in FIG. A car consisting of a slide 2 that also serves as a holder? In the support cart, as shown in FIG. 2, the opening area of one melt reservoir 1a is made larger than that of the substrate 3 to be grown, so that the surface of the substrate 30 can be sufficiently covered with the melt 4, and the surface of the substrate 30 is
It is possible to reduce the temperature distribution of the melt 4 within the plane. However, this is because the substrate, which has a lower density than the melt, floats into the melt, and the source of solute per unit area of the substrate becomes larger at the periphery of the substrate, resulting in abnormal growth. It's inconvenient.
さらに、前述した不都合を避けるために、第3図に示す
ように、基板30周辺部3aを斜めに研摩することによ
って基板3の浮上を防止しようとするものもあるが、こ
れは成長前の基板そのものに余計な加工を加えるので、
工程を増加させるだけではなく、基板に新たな結晶欠陥
を導入する可能性が増加するという問題がある。Furthermore, in order to avoid the above-mentioned inconvenience, some methods attempt to prevent the substrate 3 from floating by obliquely polishing the peripheral portion 3a of the substrate 30, as shown in FIG. Because extra processing is added to the item,
This method not only increases the number of steps but also increases the possibility of introducing new crystal defects into the substrate.
この発明は、前述した事情に鑑みてなされたもので、適
当な面積の周辺部以外の中心部が成長温度よりも十分に
高い融点の絶縁膜で覆ってありかつ被成長物質と同材質
の基板を、スライド式カーゴンテートのメルト溜に嵌合
させて、メルト上に配置するようにした液相エピタキシ
ャル成長装置を提供することにより、化合物半導体の結
晶成長を行うに当って、組成比の広い範囲にわたり、基
板周辺部の異常結晶成長の発生を防止できるようにする
ことを目的としている。The present invention has been made in view of the above-mentioned circumstances, and includes a substrate having an appropriate area, the center of which is covered with an insulating film having a melting point sufficiently higher than the growth temperature, and which is made of the same material as the material to be grown. By providing a liquid phase epitaxial growth apparatus in which the above is fitted into a slide-type Cargontate melt reservoir and placed on top of the melt, it is possible to grow crystals of compound semiconductors over a wide range of composition ratios. The purpose is to prevent the occurrence of abnormal crystal growth around the substrate.
以下、この発明の一実施例につき第4図、第5図を参照
して説明する。An embodiment of the present invention will be described below with reference to FIGS. 4 and 5.
第3図はこの発明の一実施例によるGaAs 基板上
にA/ 、 Asの不純物元素を含むQa溶液からなる
メルトな用いて液相エピタキシャル成長を行う装置のス
ライド式カーがンボードを示すメルト溜部の断面を示す
。第3図において、1はメルト溜1a壁を構成するカー
がンカート本体、2はメルト溜1aの底を形成しかつ前
記ゲート本体lに対し滑らかにスライドする嘔うに挿入
されさらに被成長基板3を保持凹部2mに嵌合、支持す
るスライダである。前記基板3はメルト溜1aの横断面
積よりやや大きい面積を奄ち、周辺部がメルト溜1aか
ら突出してゲート本体1とスライダ2とで挾持され、メ
ルト溜りa内のメルト4の底から浮き上がらないように
されている@5はメルト溜1aに嵌合されてメルト4上
に配置される基板であり、この基板5け、第5図の底面
図にも示すように、所定の組成比をもつkl、 As
からなる不純物元素を含むQa溶液すなわちメルト4
の温度であるく900℃より十分に高い融点をもつSi
o、(融点1470’C)、A40s (融点2030
°G)、5iC(融点2200℃)などの絶縁膜5bで
、被成長基板3と同材質のQaAsからなる基板主体5
aの適当な面積の周辺部を除く中心部分が覆われている
。FIG. 3 shows a melt reservoir showing a sliding car board of an apparatus for performing liquid phase epitaxial growth on a GaAs substrate according to an embodiment of the present invention using a melt made of a Qa solution containing impurity elements of A/ and As. A cross section is shown. In FIG. 3, reference numeral 1 denotes a carton body that forms the wall of the melt reservoir 1a, and 2 a carton that forms the bottom of the melt reservoir 1a and is inserted into a groove that slides smoothly against the gate body 1, and further supports the growth substrate 3. This is a slider that fits into and supports the holding recess 2m. The substrate 3 has an area slightly larger than the cross-sectional area of the melt reservoir 1a, and its peripheral portion protrudes from the melt reservoir 1a and is held between the gate body 1 and the slider 2, so that it does not rise above the bottom of the melt 4 in the melt reservoir a. 5 is a substrate fitted into the melt reservoir 1a and placed on the melt 4, and as shown in the bottom view of FIG. 5, this substrate 5 has a predetermined composition ratio. kl, As
Qa solution or melt 4 containing impurity elements consisting of
Si with a melting point sufficiently higher than 900°C
o, (melting point 1470'C), A40s (melting point 2030'C)
The main substrate 5 is made of QaAs, which is the same material as the growth substrate 3, with an insulating film 5b made of 5iC (melting point 2200°C), etc.
The central portion of a is covered except for the peripheral portion of a suitable area.
前述のようなこの発明の一実施例による装置で、液相エ
ピタキシャル成長を行うと、メルト4の中心部分ではそ
の下部に配置された被成長基板3上にだけ液相エピタキ
シャル成長が行われるのに対し、周辺部分では被成長基
板3とメルト4上部に配置した基板50基板主体5a露
出部分の両方で結晶の成長が進行する。このため、被成
長基板3の周辺部の結晶成長速度は中心部のそれよりも
小さくなり、とくに得ようとするエピタキシャル成長層
の厚さに対するメルト4の厚さの比が小さいエピタキシ
ャル成長の場合には、溶質の供給源が小さいので、被成
長基板周辺部と中心部の結晶成長速度の差が顕著となる
。したがって、所定の厚さに中心部のエピタキシャル成
長層を得ようとする時に生ずる被成長基板上の周辺部の
異常結晶成長は低減される。また、被成長基板自体は通
常の表面処理以外に何ら特別の加工を施していないため
、その表面の損傷、汚染がなく、良好な界面で結晶成長
が進むことになる。When liquid phase epitaxial growth is performed using the apparatus according to the embodiment of the present invention as described above, liquid phase epitaxial growth is performed only on the growth target substrate 3 located below the central portion of the melt 4; In the peripheral area, crystal growth progresses on both the substrate 3 to be grown and the exposed portion of the main substrate 5a of the substrate 50 disposed above the melt 4. For this reason, the crystal growth rate at the periphery of the growth substrate 3 is lower than that at the center, especially in the case of epitaxial growth where the ratio of the thickness of the melt 4 to the thickness of the epitaxial growth layer to be obtained is small. Since the solute supply source is small, the difference in crystal growth rate between the peripheral area and the central area of the growth substrate becomes significant. Therefore, abnormal crystal growth at the periphery of the growth substrate, which occurs when attempting to obtain an epitaxially grown layer at the center with a predetermined thickness, is reduced. Moreover, since the growth substrate itself has not been subjected to any special processing other than normal surface treatment, the surface is not damaged or contaminated, and crystal growth proceeds at a good interface.
以上説明したように、この発明の液相エピタキシャル成
長装置は、スライド式カーデンカートのメルト溜に、周
辺部以外の中心部が高融点の絶縁膜で覆ってありかつ被
成長基板と同材質の基板を嵌合させて、メルト上に配置
したので、この装置を用いれば、被成長基板周辺部の異
常結晶成長を低減させることができ、しかも被成長基板
自体には何ら特別な加工が加えられないため、被成長基
板に新たな欠陥を導入することがなく、さらに固液界面
への異物の混入もなく、良好な状態でのエピタキシャル
成長ができ、とくに、多くのへテロ界面を有する連続エ
ピタキシャル成長に適用して大きな効果が得られる。As explained above, the liquid phase epitaxial growth apparatus of the present invention has a substrate in the melt reservoir of a sliding carden cart, the center part of which is covered with an insulating film having a high melting point except for the peripheral part, and which is made of the same material as the substrate to be grown. Since they were fitted and placed on the melt, using this device it is possible to reduce abnormal crystal growth around the growth substrate, and since no special processing is applied to the growth substrate itself. , it is possible to perform epitaxial growth in good conditions without introducing new defects into the growth substrate and without contaminating the solid-liquid interface, and is particularly applicable to continuous epitaxial growth with many hetero interfaces. A great effect can be obtained.
第1図はスライド式連続多層液相成長用カーボンポ゛−
トを示す斜視図、第2図および第3図は従来のカーデン
〆一トの互に異なる使用法を示すメルト溜部の断面図、
第4図はこの発明の一実施例によるスライド式カーボン
が−トのメルト溜部の断面図、第5図はこの発明の一実
施例でメルト上に配置する基板の底面図である0
1・・・ボート本体、1a・・・メルト溜、2・・・ス
ライダ、2a・・・保持凹部、3・・・被成長基板、4
・・・メルト、5・・・メルト上に配置する基板、5a
・・・基板主体、5b・・・絶縁膜。
特許出願人 沖電気工業株式会社Figure 1 shows a sliding carbon point for continuous multilayer liquid phase growth.
FIGS. 2 and 3 are cross-sectional views of the melt reservoir showing different ways of using the conventional cartridge.
FIG. 4 is a sectional view of the melt reservoir of a sliding type carbon plate according to an embodiment of the present invention, and FIG. 5 is a bottom view of a substrate placed on the melt according to an embodiment of the present invention. ...Boat body, 1a...Melt reservoir, 2...Slider, 2a...Holding recess, 3...Growth substrate, 4
...melt, 5...substrate placed on the melt, 5a
... Substrate main body, 5b... Insulating film. Patent applicant Oki Electric Industry Co., Ltd.
Claims (1)
ト本体に対しスライド可能に挿入されてメルト溜の底を
形成すると共に被成長〜板を支持するスライダとを備え
たスライド式カーメンが−トを用いる液相エピタキシャ
ル成長装置において、適当な面積の周辺部以外の中心部
が成長温度よりも十分に高い融点の絶縁膜で覆ってあり
かつ前記基板と同材質の基板を、メルト溜に嵌合させて
、メルト上に配置するようにしたことを特徴とする液相
エピタキシャル成長装置。A slide type carmen is provided with a main body for forming a melt wet wall, and a slider that is slidably inserted into the boat main body to form the bottom of the melt pool and support the growth plate. - In a liquid phase epitaxial growth apparatus using a melt tank, a substrate having an appropriate area, the center of which is covered with an insulating film having a melting point sufficiently higher than the growth temperature, and made of the same material as the substrate, is fitted into a melt reservoir. 1. A liquid phase epitaxial growth apparatus characterized in that the apparatus is arranged above a melt.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP878482A JPS58127320A (en) | 1982-01-25 | 1982-01-25 | Device for liquid-phase epitaxial growth |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP878482A JPS58127320A (en) | 1982-01-25 | 1982-01-25 | Device for liquid-phase epitaxial growth |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58127320A true JPS58127320A (en) | 1983-07-29 |
Family
ID=11702490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP878482A Pending JPS58127320A (en) | 1982-01-25 | 1982-01-25 | Device for liquid-phase epitaxial growth |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58127320A (en) |
-
1982
- 1982-01-25 JP JP878482A patent/JPS58127320A/en active Pending
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