JPS58117440A - Automatic inspecting apparatus for through-hole in printed circuit board - Google Patents

Automatic inspecting apparatus for through-hole in printed circuit board

Info

Publication number
JPS58117440A
JPS58117440A JP48682A JP48682A JPS58117440A JP S58117440 A JPS58117440 A JP S58117440A JP 48682 A JP48682 A JP 48682A JP 48682 A JP48682 A JP 48682A JP S58117440 A JPS58117440 A JP S58117440A
Authority
JP
Japan
Prior art keywords
hole
printed board
light
inspection
defective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP48682A
Other languages
Japanese (ja)
Inventor
Takeshi Murayama
村山 壮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP48682A priority Critical patent/JPS58117440A/en
Publication of JPS58117440A publication Critical patent/JPS58117440A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95692Patterns showing hole parts, e.g. honeycomb filtering structures

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To improve the accuracy of the inspection results and substantially shorten the time required for inspection, by a method wherein the quality of through holes in a printed board is inspected by detecting and measuring the level of light quantity. CONSTITUTION:A printed board 1b is set on a printed board feeder 21 through an operation panel 24. The light which is projected from a projector 1a and reflected by the inner wall of a through hole 1c in the printed board to pass therethrough is detected by a light detector 1d and converted into an electric level. A controller 23 makes comparison and judgement as to whether the through hole is good or bad, and drives a defective part marking device 26 when the through hole is bad. Such a series of operations is continuously and repeatedly conducted at the through hole reference lattice pitch to complete the inspection of all the through holes in the printed board. This judgement of the quality is comprehensively made, and non-defective and non-conforming articles are selected and sorted by a selector 22.

Description

【発明の詳細な説明】 本発明はプリント板のスルーホールの状態を自動的に検
査する検査装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an inspection device that automatically inspects the condition of through holes in a printed board.

従来、プリント板のスルーホールの検査は、プリント板
の背面よシ党をあて、スルーホール内壁の反射光の変化
を目視によシメVキの良、不良を判定している。したが
って作業者の目の熟11!fによって検査結果が左右さ
れるうえ、肉体的、精神的な破骨を伴なうものであった
Conventionally, through-holes in printed circuit boards are inspected by placing an object on the back side of the printed board and visually observing changes in reflected light from the inner wall of the through-holes to determine whether the shims are good or bad. Therefore, the operator's eye is ripe! Test results were affected by f, and it was accompanied by physical and mental bone destruction.

本発明の目的は、プリント板の不良スルーホールを自動
的に検出する検査装置を提供することにある。
An object of the present invention is to provide an inspection device that automatically detects defective through holes in printed circuit boards.

本発明の自動検出装置は一定の光量を内壁に投光する投
光手段、内壁の反射光を検出する光量検出手段、プリン
ト板を供給する装置、良、不良のプリント板を選別する
装置、不良スルーホールをマークする装置および該各装
置を制御する制御装置を有し、該制御装置を介した入出
力結果により。
The automatic detection device of the present invention includes a light projection means for projecting a constant amount of light onto an inner wall, a light amount detection means for detecting reflected light from the inner wall, a device for supplying printed boards, a device for sorting out good and bad printed boards, and a device for sorting out good and bad printed boards. It has a device for marking through holes and a control device for controlling each of the devices, according to input/output results via the control device.

不良スルーホールの検出を行なうこと1に特徴としてい
る。
The first feature is that defective through holes are detected.

次に図を参照して本発明の一賽施例を詳細に説明する。Next, one embodiment of the present invention will be described in detail with reference to the drawings.

第1図(a)、 (b)は本発明の光学的検出に関する
原理図である。(a)図はプリント板1bのスルーホー
ルメッキ1cに一定量の集光された投入元Linを投光
装置(手段)1mよ〕投光し1反射光Loutt元検出
装置ldで受光検出する。この検出結果は電気レベルに
変換し不良スルーホールが測定される。を九(b)図F
i前述と同じように、プリント板lbの不良スルーホー
ル1・に光を投光し1反射光toutt元検出装置1d
で受光検出し7tJIIII成図である。この(b)図
において、不良スルーホール1eは例えはメッキがされ
ていないため、投入元Linは乱反射し1反射光tou
tは減少する。すなわち、(a)図のLoutと(扮図
のAoutは光量のレベルとしてs Lout ) A
outの関係にある。
FIGS. 1(a) and 1(b) are diagrams of the principle of optical detection according to the present invention. (a) In the figure, a fixed amount of focused light source Lin is projected onto a through-hole plating 1c of a printed board 1b from a light projecting device (means) 1 m, and one reflected light Lout is received and detected by a source detection device ld. This detection result is converted to an electrical level and defective through holes are measured. 9 (b) Figure F
i In the same way as described above, light is emitted into the defective through hole 1 of the printed board lb, and the reflected light toutt is detected by the source detection device 1d.
The light was detected at 7tJIII. In this figure (b), since the defective through hole 1e is not plated, the input source Lin is diffusely reflected and one reflected light tou
t decreases. That is, (a) Lout in the figure and (Aout in the figure is the level of light intensity) A
There is an out relationship.

従って%光量のレベルを検出測定することにより、プリ
ント板のスルーホールの良、不良の検査を行なうことが
出来る。
Therefore, by detecting and measuring the level of the % light amount, it is possible to inspect whether the through holes in the printed board are good or bad.

第2図はこの原理管用いた検査装置の一実施例を示す、
操作パネル24によシブリント板供給装置121にセッ
トされたプリント板1bは投光装置1&よ多投光された
元がプリント板のスルーホール1cの内壁に反射頁通し
光検出装置1dで検出されると、電気レベルに変換され
る。制御装w、23ではこのスルーホールの良、不良の
比較判断が行なわれ、不良の場合は、不良箇所マーキン
グ装置26を駆動させ、例えはインクでプリント板1b
のスルーホールlcにマークを行なうとともに。
Figure 2 shows an example of an inspection device using this principle tube.
The printed board 1b set on the printed board supply device 121 by the operation panel 24 is illuminated by the light projecting device 1 and the source of the light is reflected on the inner wall of the through hole 1c of the printed board and is detected by the light detection device 1d. and converted to electrical level. The control device w, 23 compares and determines whether the through hole is good or bad, and if it is defective, it drives the defective spot marking device 26 and marks the printed board 1b with ink, for example.
At the same time as making a mark on the through hole lc.

制御装置23はプリンタ25でプリント板のスルーホー
ルのaS値(x、y)を出力する。この一連の動作をス
ルーホールの基準格子のピッチで連続的に操返し行ない
、プリント板の全スルーホールの検査を完了する。この
良、不良の判定は総合的に行なわれ、    °   
   ・    −参由寸匈良および不良品は選別装置
22で選別区分される。なお、本装置は光量を検出測定
するタイ建ングおよびプリント板供給装置の駆動タイミ
ングは同期していることは首うまでもない、また。
The control device 23 uses the printer 25 to output the aS value (x, y) of the through hole of the printed board. This series of operations is repeated continuously at the pitch of the through-hole reference grid to complete the inspection of all the through-holes on the printed board. This judgment of good and bad is done comprehensively, °
- Unsatisfactory and defective products are sorted and sorted by the sorting device 22. It goes without saying that in this device, the drive timings of the tie erecting device for detecting and measuring the amount of light and the printed board supply device are synchronized.

投光装置と光検出装置を複数個対応させて設置すると同
時に%プリント板供給装置を高速に作動させることによ
p1検査速度の向上が計れることは首うまでもない。
It goes without saying that the p1 inspection speed can be improved by installing a plurality of light projectors and light detection devices in correspondence and at the same time operating the % printed board supply device at high speed.

以上説明したように、本発明によれば従来プリント板の
スルーホール検査を目視で行なりていたのを機械化する
ことが出来、検査結果の正確性。
As explained above, according to the present invention, it is possible to mechanize the conventional visual inspection of through-holes on printed circuit boards, thereby improving the accuracy of the inspection results.

且つ大巾な検査時間の短縮が達成でき1人為的作条の改
善にを与することが大である。
In addition, it is possible to achieve a significant reduction in inspection time, which greatly contributes to the improvement of artificial production conditions.

【図面の簡単な説明】[Brief explanation of drawings]

m1図(a)(b)Fi不発明の検量原理管説明する光
学的説明図で(−図は良スルーホールメッキに投光−1
足する斜視図s (b)bは、不良スルーホールに投光
−1足する斜視図、第2図は本発明の一実施例であるプ
リント板スルーホール検査装普のブロック構成図である
。 1に投光装置、1bニブリント板%lcニスルーホール
メッキ内壁、1d:光検出装置、1e:不良スルーホー
ル、Lin :投入光s Lout 5tout:反射
光、21ニブリント板供給装置、22:選別装置、23
:制#装置%24:操作パネル、25:プリンタ、26
;不良マーキング装置。 第1!¥] 第2図 手続補正書(自発) 特許庁長官 殿 1、事件の表示   昭和57年特 許 願第 486
号2、発明の名称   プリント園路板のスルーホール
自動検査装置3、補正をする者 事件との関係       出 願 人東京都港区芝五
丁目33番1号 4、代理人 〒108  東京都港区芝五丁目37番8号 住人三田
ビJし& 補正の対象 明細書の発明の詳細な説明の欄 6、補正の内容 (1)  明細書第3頁、第3行に「不良スルーホール
」とあるを「良スルーホール」に訂正する。
m1 diagrams (a) and (b) are optical explanatory diagrams explaining the uninvented calibration principle of Fi-1.
Figure 2 is a block diagram of a printed board through hole inspection system according to an embodiment of the present invention. 1 is a light projector, 1b is a niblint plate %lc varnished through-hole plated inner wall, 1d is a photodetector, 1e is a defective through hole, Lin is input light s Lout 5tout is reflected light, 21 is a niblint plate supply device, 22 is a sorting device , 23
: Control #device% 24: Operation panel, 25: Printer, 26
; Defective marking device. 1st! ¥] Figure 2 Procedural Amendment (Voluntary) Commissioner of the Patent Office 1, Indication of Case 1981 Patent Application No. 486
No. 2, Title of the invention: Automatic through-hole inspection device for printed garden road boards 3, Relationship with the person making the amendment: Applicant: 5-33-1-4 Shiba, Minato-ku, Tokyo, Agent: 108 Minato-ku, Tokyo 37-8 Shiba 5-chome Resident Mita Bi J & Column 6 of the detailed description of the invention in the specification subject to amendment, Contents of amendment (1) ``Defective through hole'' on page 3, line 3 of the specification Correct "Yes" to "Good through hole".

Claims (1)

【特許請求の範囲】[Claims] プリント板のスルーホールの内壁に元を投光する投光手
段と内−で反射された光量を検出測定する光検出手段と
不良個所のマーキング手段とプリント板供給手段、およ
び1紀すべての手段を制御する制御回路とを有し、該制
御回路を介して入力し且つ不良スルーホールの検査結果
を出力するよう圧したことを4?黴とするプリント回路
板のスルーホール自動検査装置。
A light projecting means for projecting light onto the inner wall of the through hole of the printed board, a light detecting means for detecting and measuring the amount of light reflected inside, a means for marking defective areas, a means for supplying the printed board, and all other means. 4? It has a control circuit to control the input through the control circuit and is pressed to output the inspection result of the defective through hole. Automatic through-hole inspection equipment for printed circuit boards that contain mold.
JP48682A 1982-01-05 1982-01-05 Automatic inspecting apparatus for through-hole in printed circuit board Pending JPS58117440A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP48682A JPS58117440A (en) 1982-01-05 1982-01-05 Automatic inspecting apparatus for through-hole in printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48682A JPS58117440A (en) 1982-01-05 1982-01-05 Automatic inspecting apparatus for through-hole in printed circuit board

Publications (1)

Publication Number Publication Date
JPS58117440A true JPS58117440A (en) 1983-07-13

Family

ID=11475094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48682A Pending JPS58117440A (en) 1982-01-05 1982-01-05 Automatic inspecting apparatus for through-hole in printed circuit board

Country Status (1)

Country Link
JP (1) JPS58117440A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS641940A (en) * 1987-06-25 1989-01-06 Hitachi Ltd Through hole void inspection
JPH02124453A (en) * 1988-11-01 1990-05-11 Riide Electron:Kk Method and apparatus for checking plating on board
EP0400777A2 (en) * 1989-03-01 1990-12-05 Ngk Insulators, Ltd. Method of inspecting die for forming honeycomb structure
JP2006177847A (en) * 2004-12-24 2006-07-06 Matsushita Electric Ind Co Ltd Visual inspection device and visual inspection method of substrate
CN104764712A (en) * 2015-04-29 2015-07-08 浙江工业大学 Method for detecting quality of inner wall of via hole of PCB
CN107727665A (en) * 2016-08-10 2018-02-23 株式会社捷太格特 Appearance inspection device and appearance inspection method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS641940A (en) * 1987-06-25 1989-01-06 Hitachi Ltd Through hole void inspection
JPH02124453A (en) * 1988-11-01 1990-05-11 Riide Electron:Kk Method and apparatus for checking plating on board
EP0400777A2 (en) * 1989-03-01 1990-12-05 Ngk Insulators, Ltd. Method of inspecting die for forming honeycomb structure
JP2006177847A (en) * 2004-12-24 2006-07-06 Matsushita Electric Ind Co Ltd Visual inspection device and visual inspection method of substrate
CN104764712A (en) * 2015-04-29 2015-07-08 浙江工业大学 Method for detecting quality of inner wall of via hole of PCB
CN104764712B (en) * 2015-04-29 2017-08-25 浙江工业大学 A kind of detection method of PCB vias inwall quality
CN107727665A (en) * 2016-08-10 2018-02-23 株式会社捷太格特 Appearance inspection device and appearance inspection method

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