CN105277566B - Method for setting shared setting parameters between optical detection machines - Google Patents
Method for setting shared setting parameters between optical detection machines Download PDFInfo
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- CN105277566B CN105277566B CN201410359003.4A CN201410359003A CN105277566B CN 105277566 B CN105277566 B CN 105277566B CN 201410359003 A CN201410359003 A CN 201410359003A CN 105277566 B CN105277566 B CN 105277566B
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- 230000003287 optical effect Effects 0.000 title claims abstract description 94
- 238000001514 detection method Methods 0.000 title claims abstract description 88
- 238000000034 method Methods 0.000 title claims abstract description 41
- 238000012360 testing method Methods 0.000 claims abstract description 36
- 238000012937 correction Methods 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000007689 inspection Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000265 homogenisation Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000008450 motivation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0162—Arrangements or apparatus for facilitating the optical investigation using microprocessors for control of a sequence of operations, e.g. test, powering, switching, processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
The invention discloses a method for setting shared setting parameters among optical detection machines, which is used for correspondingly transferring a reference light source output setting value of a reference optical detection machine to other optical detection machines, and comprises the following steps: the method comprises a reference gray value obtaining step, a test gray value obtaining step, a light source device adjusting step and a light source device setting step, wherein a standard sheet is used as a calibration target object among a plurality of machines, so that the actual irradiation conditions of all the machines can be automatically homogenized among the machines according to a standard specification.
Description
Technical field
The present invention relates to a kind of establishing method of optical detection board, more particularly to share and set between a kind of optical detection board
Determine the establishing method of parameter.
Background technology
Detection of the automatic optics inspection (AOI) on soft or rigid circuit board plays very important role.Citing
For, precision must be all passed through in the manufacturing process of liquid crystal display, the chip of semiconductor integrated circuit and interlock circuit
Automatic optics inspection.
Automatic optics inspection is carried out by optical detection board, in detection process, is exposed to light on circuit board, then
The judgement of flaw is carried out by image of the image-taking device acquisition circuitry plate after illuminated, also therefore, on optical detection board
The source mass that lighting device is provided just has considerable influence in detection, once source mass is bad, detection process
Erroneous judgement is likely to occur, causes the unstable product quality of shipment.
Traditionally, the light supply apparatus on optical detection board is all by manually being adjusted respectively according to actually detected result one by one
The light source output setting value of the light supply apparatus of optical detection board, the light source output setting value are to drive the light source of light supply apparatus
The motivation value of driver, the light supply apparatus on single board is set as meeting to light needed for test specification by manually adjusting
Output valve.However, when board is large number of, either in installation setting stage or day after table maintenance phase, pass through
The artificial adjustment of setting one by one is not only time-consuming and the examination criteria between each board can not also uniformed, it is such the shortcomings that often make
Stable product quality is unable to maintain that into the product by detection.
The content of the invention
It is an object of the present invention to uniform the testing conditions between each optical detection board.
It is rapidly completed another object of the present invention is to the parameter setting for enabling multiple optical detection boards and reaches phase
Same sets target.
For the above-mentioned purpose and other purposes, the present invention propose a kind of setting of shared setup parameter between optical detection board
Method, other optical detection boards are correspondingly passed to a baseline optical to be detected to the reference light source output setting value of board,
Comprising：Benchmark gray value acquisition step, test gray value acquisition step, light supply apparatus set-up procedure and light supply apparatus setting step
Suddenly.Wherein, the benchmark gray value acquisition step provides a standard film to the baseline optical and detected in board, passes through the baseline optical
The light supply apparatus of detection board irradiates the standard film and obtains the standard film to detect the image-taking device of board by the baseline optical
Benchmark image under irradiation, from benchmark gray value corresponding to benchmark image acquirement；The test gray value acquisition step provides
The standard film into other optical detection boards, by the light supply apparatus of other optical detection boards irradiate the standard film with by
The image-taking device of other optical detection boards obtains the test image of the standard film under irradiation, is obtained from the test image corresponding
Test gray value；The light supply apparatus set-up procedure adjusts it according to the test gray value is more corresponding with the benchmark gray value
The output light intensity of the light supply apparatus of his optical detection board, until the difference of the test gray value and the benchmark gray value meets
Preparatory condition；And the light supply apparatus setting procedure, meeting in the light supply apparatus set-up procedure are defeated under the preparatory condition
Go out luminous intensity, record the light source output setting value of light supply apparatus of other optical detection boards to be examined as other corresponding optics
Survey the correction parameter of board.
In one embodiment of the invention, with the standard film to be adjusted another after the completion of the light supply apparatus setting procedure
Other optical detection boards carry out the test gray value acquisition step, the light supply apparatus set-up procedure and the light supply apparatus and set again
Step is determined, to complete the setting of the correction parameter of all other optical detection boards to be adjusted.
In one embodiment of the invention, detecting board and other optical detection boards in the baseline optical has multiple light sources
During device, benchmark of the light supply apparatus of baseline optical detection board under the standard film is sequentially obtained for single light source device
Gray value, so that light supply apparatus corresponding to other optical detection boards corresponds to setting in order.
In one embodiment of the invention, in the light supply apparatus set-up procedure, the preparatory condition be the test gray value with
The absolute value of the difference of the benchmark gray value is necessarily less than a predetermined value, and determines whether the survey when not being less than the predetermined value
Whether examination gray value is more than the benchmark gray value, and other optical detections are reduced when the test gray value is more than the benchmark gray value
The light source output setting value of light supply apparatus corresponding to board, and increase it when the test gray value is less than the benchmark gray value
The light source output setting value of light supply apparatus corresponding to his optical detection board.
In one embodiment of the invention, the acquirement of reference light source output setting value is by one circuit board of offer to the base
In quasi-optics detection board, and based under conditions of the image for obtaining the correct circuit board, board is detected to the baseline optical
Light supply apparatus set by output light intensity, using be used as the reference light source output setting value.
Whereby, the align objects between multiple computer desk are used as by a standard film so that criterion can be followed between multiple computer desk
Specification automatically uniforms the actual irradiation condition of each board, and further, the present invention can make all optical detection boards
Examination criteria reaches unanimity, and then makes the quality standard for having homogenization by all products of detection.
Brief description of the drawings
Fig. 1 is the schematic diagram of the optical detection board in one embodiment of the invention.
Fig. 2 is the establishing method flow chart of shared setup parameter between the optical detection board in one embodiment of the invention.
Fig. 3 is the establishing method detailed process of shared setup parameter between the optical detection board in one embodiment of the invention
Figure.
Critical piece reference：
111 first light supply apparatuses
112 secondary light source devices
120 image-taking devices
130 computing hosts
140 plummers
200 objects to be measured
S100~S430 steps
Embodiment
To be fully understood by the purpose of the present invention, feature and technique effect, hereby by following specific embodiments, and with reference to accompanying drawing,
The present invention is elaborated, is described as follows：
Fig. 1 is refer to first, and it is the schematic diagram of the optical detection board in one embodiment of the invention.Carry out various circuits
Included on the optical detection board of plate detection：(Fig. 1 shows the first light supply apparatus 111 and secondary light source dress to an at least light supply apparatus
Put 112), image-taking device 120, computing host 130 and plummer 140.It is used to put object 200 to be measured on the plummer 140,
Irradiated by the light of first light supply apparatus 111 and the secondary light source device 112 to make the 200 corresponding real estate of object to be measured
The light such as raw reflected light or scattering light is simultaneously obtained the image of the object 200 to be measured by the image-taking device 120, for computing master
Machine 130 is handled and recognized whether with defect.Wherein first light supply apparatus 111 and secondary light source device 112 are generally by computing
Main frame 130 makees unified exposure intensity setting and management.
The present invention is detected in board by a circuit board (as the object 200 to be measured) to baseline optical is provided, and base
The output light intensity set by light supply apparatus now is obtained under conditions of the correctly image of the circuit board is obtained, as rear
Continue the setting template (exporting setting value as reference light source) of other optical detection boards, that is, the present invention is by by an optics
Detect board selection and detect board for the baseline optical, and to the target to be measured of this volume production in the baseline optical detects board
Thing 200 sets the condition of appropriate irradiation light intensity, and the output light intensity setting value of the corresponding light source device under the conditions of with this is made
On the basis of light source output setting value, for the setting of other follow-up optical detection boards.
Then Fig. 2 is refer to, it is the setting of shared setup parameter between the optical detection board in one embodiment of the invention
Method flow diagram.The establishing method of setup parameter is shared between the optical detection board of the present invention, a baseline optical to be detected
The reference light source output setting value of board is correspondingly passed to other optical detection boards, comprising：Benchmark gray value acquisition step
S100, test gray value acquisition step S200, light supply apparatus set-up procedure S300 and light supply apparatus setting procedure S400.In addition,
The test gray value can be then returned when being intended to set another optical detection board after light supply apparatus setting procedure S400 terminates
Acquisition step S200 transfers program to perform the reference light source of another optical detection board output setting value.
Benchmark gray value acquisition step S100 provides a standard film to the baseline optical and detected in board, passes through the benchmark
The light supply apparatus of optical detection board irradiates the standard film and obtains the mark to detect the image-taking device of board by the baseline optical
The benchmark image of quasi- piece under irradiation, from benchmark gray value corresponding to benchmark image acquirement.
The test gray value acquisition step S200 provide the standard film into other optical detection boards, passes through other optics
The light supply apparatus of detection board, which irradiates the standard film and obtains the standard film with the image-taking device by other optical detection boards, to exist
Test image under irradiation, corresponding test gray value is obtained from the test image.
The light supply apparatus set-up procedure S300 adjusts it according to the test gray value is more corresponding with the benchmark gray value
The output light intensity of the light supply apparatus of his optical detection board, until the difference of the test gray value and the benchmark gray value meets
One preparatory condition.
The light supply apparatus setting procedure S400 meeting in the light supply apparatus set-up procedure, is defeated under the preparatory condition
Go out luminous intensity, record the light source output setting value of light supply apparatus of other optical detection boards to be examined as other corresponding optics
Survey the correction parameter of board.
Then Fig. 3 is refer to, it is the setting of shared setup parameter between the optical detection board in one embodiment of the invention
Method detail flowchart.Wherein, first board is baseline optical detection board, and second board is the inspection of other optics
Survey board.
In Fig. 3, step S110~S160 belongs to benchmark gray value acquisition step S100, and as it was previously stated, in the benchmark
Detect in board by one circuit board of offer to the baseline optical before gray value acquisition step S100, and be correctly somebody's turn to do based on obtaining
Under conditions of the image of circuit board, to the baseline optical detect board light supply apparatus set by output light intensity, using as
Reference light source output setting value (i.e. light source drive numerical value Di).Baseline optical detection board and other light are added in Fig. 3
The setting means that detection board is learned when there is multiple light sources device, between baseline optical detection board and other optical detection boards
Light supply apparatus in correspondence with each other, for example, when optical detection board has UV light generating devices and visible light generating device,
The setting value of UV light generating devices is just only corresponded to the UV light generating devices of other boards, accordingly, in the baseline optical detection machine
When platform and other optical detector platforms have multiple light sources device, baseline optical detection is sequentially obtained for single light source device
Benchmark gray value Gi of the light supply apparatus of board under the standard film, for light supply apparatus corresponding to other optical detection boards according to
Sequence corresponding setting (that is, obtain the light source drive numerical value Di of each light supply apparatus, each light source drive numerical value Di respectively has
Corresponding benchmark gray value Gi).
In Fig. 3, step S210~S230 belongs to test gray value acquisition step S200；Step S310~S340 belongs to this
Light supply apparatus set-up procedure S300；Step S410~S430 belongs to light supply apparatus setting procedure S400.
In Fig. 3, such as step S210~S230, the light source that the first board is directly first taken when the second board operates at the beginning drives
Dynamic device numerical value Di (takes corresponding Di respectively when optical detection board has multiple light sources device for corresponding light supply apparatus
Value, such as the setting value Di just only settings of the corresponding UV light generating devices to the second board of the UV light generating devices of the first board
Value Di), it is corresponding further according to gray value Gj and the first board (baseline optical detection board) of acquired each light supply apparatus of correspondence
The benchmark gray value Gi comparison of light supply apparatus be automatically set the second board (other optical detection boards to be adjusted)
Each light supply apparatus suitable parameter of oneself, that is, the light source drive numerical value Di of each light supply apparatus of the second board is set, it is such as follow-up
Step S310~S340.
In Fig. 3, such as step S310~S340, it is under the jurisdiction of light supply apparatus set-up procedure S300, the preparatory condition is the survey
The absolute value of examination gray value Gj and benchmark gray value Gi difference is necessarily less than a predetermined value (step S310), and be not less than
Determine whether the test gray value is more than the benchmark gray value (step S320) during the predetermined value, in the test gray value
Light source output setting value (the step of light supply apparatus corresponding to other optical detection boards is reduced during more than the benchmark gray value
S330), and when the test gray value is less than the benchmark gray value light supply apparatus corresponding to other optical detection boards is increased
Light source output setting value (step S340).
Summary, the present invention are used as the align objects between multiple computer desk by a standard film so that between multiple computer desk
A standard norm can be followed, and automatically (image-taking device of the second board can directly read the capture of the first board via remote connection
The light source drive parameter of device reaches automation with gray value parameter, it is only necessary to manually or mechanically places the standard film) by each machine
The actual irradiation condition homogenization (parameter value by compensating each light source drive respectively reaches estimated gray value) of platform, is borrowed
This, the present invention can make the examination criteria of all optical detection boards reach unanimity, and then make to have by all products of detection
The quality standard of homogenization.
The present invention has hereinbefore been disclosed with preferred embodiment, but it will be understood by those skilled in the art that the implementation
Example is only used for describing the present invention, and is not construed as limiting the scope of the present invention.It is it should be noted that every equivalent with the embodiment
Change and displacement, be regarded as being covered by scope of the invention.Therefore, protection scope of the present invention is when with claims
The content limited is defined.
Claims (4)
1. the establishing method of automatic setup parameter between a kind of optical detection board, it is characterised in that include：
Benchmark gray value acquisition step a, there is provided standard film to baseline optical is detected in board, passes through the baseline optical detection machine
The light supply apparatus of platform irradiates the standard film and obtains the standard film to detect the image-taking device of board by the baseline optical and irradiating
Under benchmark image, from the benchmark image obtain corresponding to benchmark gray value and reference light source output setting value；
Test gray value acquisition step, there is provided the standard film passes through other optical detection boards into other optical detection boards
Light supply apparatus irradiate the standard film standard film obtained under irradiation with the image-taking device by other optical detection boards
Test image, corresponding test gray value is obtained from the test image；
Light supply apparatus set-up procedure, other optical detections are adjusted according to the test gray value is more corresponding with the benchmark gray value
The output light intensity of the light supply apparatus of board, until the difference of the test gray value and the benchmark gray value meets preparatory condition；
Wherein, the preparatory condition is that the test gray value and the absolute value of the difference of the benchmark gray value are necessarily less than a predetermined value, and
Determine whether the test gray value is more than the benchmark gray value when not being less than the predetermined value, it is big in the test gray value
The light source output setting value of light supply apparatus corresponding to other optical detection boards is reduced when the benchmark gray value, and in the survey
Examination gray value increases the light source output setting value of light supply apparatus corresponding to other optical detection boards when being less than the benchmark gray value；
And
Light supply apparatus setting procedure, according to the output light intensity met under the preparatory condition in the light supply apparatus set-up procedure,
The light source output setting value of the light supply apparatus of other optical detection boards is recorded to be used as other corresponding optical detection boards
Correction parameter.
2. establishing method as claimed in claim 1, it is characterised in that after the completion of the light supply apparatus setting procedure, with the mark
Quasi- piece carries out the test gray value acquisition step, light supply apparatus adjustment to other another optical detection boards to be adjusted again
Step and the light supply apparatus setting procedure, to complete the setting of the correction parameter of all other optical detection boards to be adjusted.
3. establishing method as claimed in claim 1 or 2, it is characterised in that detect board and other optics in the baseline optical
When detection board has multiple light sources device, the light source that baseline optical detection board is sequentially obtained for single light source device fills
The benchmark gray value under the standard film is put, so that light supply apparatus corresponding to other optical detection boards corresponds to setting in order.
4. establishing method as claimed in claim 3, it is characterised in that the acquirement of reference light source output setting value is by carrying
Detected for a circuit board to the baseline optical in board, and under conditions of the image based on the correct circuit board of acquirement, to this
Output light intensity set by the light supply apparatus of baseline optical detection board, to export setting value as the reference light source.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW103123873 | 2014-07-10 | ||
| TW103123873A TWI526683B (en) | 2014-07-10 | 2014-07-10 | Method of setting parameters for common setting between optical inspection units |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105277566A CN105277566A (en) | 2016-01-27 |
| CN105277566B true CN105277566B (en) | 2017-11-28 |
Family
ID=55146949
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410359003.4A Active CN105277566B (en) | 2014-07-10 | 2014-07-25 | Method for setting shared setting parameters between optical detection machines |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP5961226B2 (en) |
| KR (1) | KR20160007318A (en) |
| CN (1) | CN105277566B (en) |
| TW (1) | TWI526683B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101922991B1 (en) * | 2016-12-23 | 2018-11-28 | 효성중공업 주식회사 | Power device cooling device for power conversion device |
| CN109001118A (en) * | 2018-09-27 | 2018-12-14 | 广东奥普特科技股份有限公司 | A kind of method for polishing for distinguishing product different materials gray scale |
| CN109587476B (en) * | 2019-01-10 | 2020-10-02 | 横店集团东磁有限公司 | Method for reducing influence of machine station difference on consistency of modules |
| CN109903708B (en) * | 2019-03-21 | 2022-04-26 | Tcl华星光电技术有限公司 | Measurement system and measurement parameter setting method thereof |
| CN113009142B (en) * | 2021-02-18 | 2024-05-24 | 上海艾瑞德生物科技有限公司 | Adaptive calibration method, device, electronic equipment and readable storage medium |
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| CN1076102A (en) * | 1993-05-04 | 1993-09-15 | 刘长兴 | The method and the device thereof that are used for reproducing imaging parameters of diagnostic transmission equipment |
| CN101221122A (en) * | 2007-01-08 | 2008-07-16 | 牧德科技股份有限公司 | Adjustable light source and automatic optical detecting system with the same |
| US7589783B2 (en) * | 2003-07-14 | 2009-09-15 | Rudolph Technologies, Inc. | Camera and illumination matching for inspection system |
| CN103237177A (en) * | 2013-04-24 | 2013-08-07 | 广州视睿电子科技有限公司 | Light source brightness adjustment method and device |
| CN103281825A (en) * | 2013-05-21 | 2013-09-04 | 惠州市威莱斯电子科技有限公司 | AOI (Automated Optical Inspection) digital LED (Light-Emitting Diode) light source controller and control method thereof |
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| JPH11183390A (en) * | 1997-12-19 | 1999-07-09 | Fuji Xerox Co Ltd | Surface inspecting method and device |
| US8045788B2 (en) * | 2003-07-14 | 2011-10-25 | August Technology Corp. | Product setup sharing for multiple inspection systems |
| JP2007139676A (en) * | 2005-11-21 | 2007-06-07 | Nec Tohoku Sangyo System Kk | Device and method for inspecting substrate |
| JP2008170207A (en) * | 2007-01-10 | 2008-07-24 | Olympus Corp | Macro lighting system for visual inspection apparatus, visual inspection apparatus, and visual inspection method of glass substrate |
| JP2009002669A (en) * | 2007-06-19 | 2009-01-08 | Fuji Electric Systems Co Ltd | Visual inspection device |
| JP5665552B2 (en) * | 2011-01-06 | 2015-02-04 | Hoya株式会社 | Calibration apparatus and calibration method |
| JP5608722B2 (en) * | 2012-11-16 | 2014-10-15 | 株式会社日立ハイテクノロジーズ | Inspection device and method for adjusting inspection device |
-
2014
- 2014-07-10 TW TW103123873A patent/TWI526683B/en active
- 2014-07-25 CN CN201410359003.4A patent/CN105277566B/en active Active
- 2014-08-20 KR KR1020140108296A patent/KR20160007318A/en not_active Application Discontinuation
- 2014-08-22 JP JP2014169637A patent/JP5961226B2/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1076102A (en) * | 1993-05-04 | 1993-09-15 | 刘长兴 | The method and the device thereof that are used for reproducing imaging parameters of diagnostic transmission equipment |
| US7589783B2 (en) * | 2003-07-14 | 2009-09-15 | Rudolph Technologies, Inc. | Camera and illumination matching for inspection system |
| CN101221122A (en) * | 2007-01-08 | 2008-07-16 | 牧德科技股份有限公司 | Adjustable light source and automatic optical detecting system with the same |
| CN103237177A (en) * | 2013-04-24 | 2013-08-07 | 广州视睿电子科技有限公司 | Light source brightness adjustment method and device |
| CN103281825A (en) * | 2013-05-21 | 2013-09-04 | 惠州市威莱斯电子科技有限公司 | AOI (Automated Optical Inspection) digital LED (Light-Emitting Diode) light source controller and control method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2016017956A (en) | 2016-02-01 |
| JP5961226B2 (en) | 2016-08-02 |
| CN105277566A (en) | 2016-01-27 |
| TWI526683B (en) | 2016-03-21 |
| TW201602557A (en) | 2016-01-16 |
| KR20160007318A (en) | 2016-01-20 |
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