JPS58108853A - 電子交換プログラムの試験装置 - Google Patents

電子交換プログラムの試験装置

Info

Publication number
JPS58108853A
JPS58108853A JP20893881A JP20893881A JPS58108853A JP S58108853 A JPS58108853 A JP S58108853A JP 20893881 A JP20893881 A JP 20893881A JP 20893881 A JP20893881 A JP 20893881A JP S58108853 A JPS58108853 A JP S58108853A
Authority
JP
Japan
Prior art keywords
information
test
electronic exchange
pseudo call
test procedure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20893881A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0221708B2 (enExample
Inventor
Shigeo Ochiai
落合　重夫
Akio Nakamura
中村　陽生
Takehiro Nishimori
西森　武弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP20893881A priority Critical patent/JPS58108853A/ja
Publication of JPS58108853A publication Critical patent/JPS58108853A/ja
Publication of JPH0221708B2 publication Critical patent/JPH0221708B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/32—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges
    • H04M3/323—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges for the arrangements providing the connection (test connection, test call, call simulation)

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Exchange Systems With Centralized Control (AREA)
JP20893881A 1981-12-23 1981-12-23 電子交換プログラムの試験装置 Granted JPS58108853A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20893881A JPS58108853A (ja) 1981-12-23 1981-12-23 電子交換プログラムの試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20893881A JPS58108853A (ja) 1981-12-23 1981-12-23 電子交換プログラムの試験装置

Publications (2)

Publication Number Publication Date
JPS58108853A true JPS58108853A (ja) 1983-06-29
JPH0221708B2 JPH0221708B2 (enExample) 1990-05-15

Family

ID=16564613

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20893881A Granted JPS58108853A (ja) 1981-12-23 1981-12-23 電子交換プログラムの試験装置

Country Status (1)

Country Link
JP (1) JPS58108853A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62253256A (ja) * 1986-04-18 1987-11-05 Fujitsu Ltd 試験条件自動生成方法
JPH0338956A (ja) * 1989-07-05 1991-02-20 Nec Corp 自動試験装置
JP2009297324A (ja) * 2008-06-16 2009-12-24 Mitsubishi Heavy Ind Ltd 放射線治療装置およびガントリ角度制限方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136009A (ja) * 1974-09-24 1976-03-26 Oki Electric Ind Co Ltd Fuakushimirishingonadonokiokuhoho
JPS53100711A (en) * 1977-02-15 1978-09-02 Nec Corp Automatic call test equipment

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136009A (ja) * 1974-09-24 1976-03-26 Oki Electric Ind Co Ltd Fuakushimirishingonadonokiokuhoho
JPS53100711A (en) * 1977-02-15 1978-09-02 Nec Corp Automatic call test equipment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62253256A (ja) * 1986-04-18 1987-11-05 Fujitsu Ltd 試験条件自動生成方法
JPH0338956A (ja) * 1989-07-05 1991-02-20 Nec Corp 自動試験装置
JP2009297324A (ja) * 2008-06-16 2009-12-24 Mitsubishi Heavy Ind Ltd 放射線治療装置およびガントリ角度制限方法

Also Published As

Publication number Publication date
JPH0221708B2 (enExample) 1990-05-15

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