JPS58106442A - 煙霧透過率測定装置の自動校正回路 - Google Patents

煙霧透過率測定装置の自動校正回路

Info

Publication number
JPS58106442A
JPS58106442A JP56207654A JP20765481A JPS58106442A JP S58106442 A JPS58106442 A JP S58106442A JP 56207654 A JP56207654 A JP 56207654A JP 20765481 A JP20765481 A JP 20765481A JP S58106442 A JPS58106442 A JP S58106442A
Authority
JP
Japan
Prior art keywords
output
light
amount
time
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56207654A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6336457B2 (enrdf_load_stackoverflow
Inventor
Makoto Ryuba
柳葉　誠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP56207654A priority Critical patent/JPS58106442A/ja
Publication of JPS58106442A publication Critical patent/JPS58106442A/ja
Publication of JPS6336457B2 publication Critical patent/JPS6336457B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP56207654A 1981-12-21 1981-12-21 煙霧透過率測定装置の自動校正回路 Granted JPS58106442A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56207654A JPS58106442A (ja) 1981-12-21 1981-12-21 煙霧透過率測定装置の自動校正回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56207654A JPS58106442A (ja) 1981-12-21 1981-12-21 煙霧透過率測定装置の自動校正回路

Publications (2)

Publication Number Publication Date
JPS58106442A true JPS58106442A (ja) 1983-06-24
JPS6336457B2 JPS6336457B2 (enrdf_load_stackoverflow) 1988-07-20

Family

ID=16543350

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56207654A Granted JPS58106442A (ja) 1981-12-21 1981-12-21 煙霧透過率測定装置の自動校正回路

Country Status (1)

Country Link
JP (1) JPS58106442A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012189353A (ja) * 2011-03-09 2012-10-04 Panasonic Corp 煙霧透過率測定装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0432665U (enrdf_load_stackoverflow) * 1990-07-11 1992-03-17

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012189353A (ja) * 2011-03-09 2012-10-04 Panasonic Corp 煙霧透過率測定装置

Also Published As

Publication number Publication date
JPS6336457B2 (enrdf_load_stackoverflow) 1988-07-20

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