JPS5810354U - Field emission cathode - Google Patents

Field emission cathode

Info

Publication number
JPS5810354U
JPS5810354U JP10386681U JP10386681U JPS5810354U JP S5810354 U JPS5810354 U JP S5810354U JP 10386681 U JP10386681 U JP 10386681U JP 10386681 U JP10386681 U JP 10386681U JP S5810354 U JPS5810354 U JP S5810354U
Authority
JP
Japan
Prior art keywords
field emission
emission cathode
cathode
needle
emission type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10386681U
Other languages
Japanese (ja)
Inventor
平井　康晴
Original Assignee
株式会社日立製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立製作所 filed Critical 株式会社日立製作所
Priority to JP10386681U priority Critical patent/JPS5810354U/en
Publication of JPS5810354U publication Critical patent/JPS5810354U/en
Pending legal-status Critical Current

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  • Electron Sources, Ion Sources (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案による電界放射型陰極においてタングス
テン尖針の（３１０）面の温度Ｔを変えた時に得られる
放射電流のエネルギー幅と輝度との関係を測定した結果
を示すグラフ、第２図は本考案による電界放射型陰極の
構成図である。 １・・・ガラスベース、２・・・電極、３・・・タング
ステン線、４・・・タングステン尖針、５・・・アノー
ド板、６．７・・・電源。Figure 1 is a graph showing the results of measuring the relationship between the energy width of the radiation current and the brightness obtained when the temperature T of the (310) plane of the tungsten point is varied in the field emission cathode of the present invention. 1 is a block diagram of a field emission type cathode according to the present invention. DESCRIPTION OF SYMBOLS 1...Glass base, 2...Electrode, 3...Tungsten wire, 4...Tungsten point, 5...Anode plate, 6.7...Power source.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 針状に形成された先端を有し、上記尖針が陽極に対向す
るように保持され、上記尖針から電子放出を行なわせる
ように構成された電界放射型陰極において、ビルドアッ
プした上記尖針をｌ１００Ｋ〜１４００にの温度範囲に
保持して電子放出を行なわせることを特徴とする電界放
射型陰極。In a field emission type cathode having a tip formed in a needle shape, the pointed needle is held so as to face an anode, and the built-up pointed needle is configured to emit electrons from the pointed needle. 1. A field emission type cathode, characterized in that the cathode is maintained at a temperature range of 1100K to 1400K to emit electrons.
JP10386681U 1981-07-15 1981-07-15 Field emission cathode Pending JPS5810354U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10386681U JPS5810354U (en) 1981-07-15 1981-07-15 Field emission cathode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10386681U JPS5810354U (en) 1981-07-15 1981-07-15 Field emission cathode

Publications (1)

Publication Number Publication Date
JPS5810354U true JPS5810354U (en) 1983-01-22

Family

ID=29898474

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10386681U Pending JPS5810354U (en) 1981-07-15 1981-07-15 Field emission cathode

Country Status (1)

Country Link
JP (1) JPS5810354U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01162234U (en) * 1988-04-26 1989-11-10
JPH09219427A (en) * 1997-01-20 1997-08-19 Hitachi Ltd Electron beam inspection device
JPH09219428A (en) * 1997-01-20 1997-08-19 Hitachi Ltd Electron beam inspection device
JPH09218171A (en) * 1997-01-20 1997-08-19 Hitachi Ltd Method for inspecting defect

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01162234U (en) * 1988-04-26 1989-11-10
JPH09219427A (en) * 1997-01-20 1997-08-19 Hitachi Ltd Electron beam inspection device
JPH09219428A (en) * 1997-01-20 1997-08-19 Hitachi Ltd Electron beam inspection device
JPH09218171A (en) * 1997-01-20 1997-08-19 Hitachi Ltd Method for inspecting defect

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