JPS58102152A - 超音波顕微鏡 - Google Patents

超音波顕微鏡

Info

Publication number
JPS58102152A
JPS58102152A JP56200819A JP20081981A JPS58102152A JP S58102152 A JPS58102152 A JP S58102152A JP 56200819 A JP56200819 A JP 56200819A JP 20081981 A JP20081981 A JP 20081981A JP S58102152 A JPS58102152 A JP S58102152A
Authority
JP
Japan
Prior art keywords
sample
rotary drum
ultrasonic
parallel
sample stand
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56200819A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0140952B2 (enrdf_load_stackoverflow
Inventor
Koji Taguchi
耕司 田口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP56200819A priority Critical patent/JPS58102152A/ja
Publication of JPS58102152A publication Critical patent/JPS58102152A/ja
Publication of JPH0140952B2 publication Critical patent/JPH0140952B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Microscoopes, Condenser (AREA)
JP56200819A 1981-12-15 1981-12-15 超音波顕微鏡 Granted JPS58102152A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56200819A JPS58102152A (ja) 1981-12-15 1981-12-15 超音波顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56200819A JPS58102152A (ja) 1981-12-15 1981-12-15 超音波顕微鏡

Publications (2)

Publication Number Publication Date
JPS58102152A true JPS58102152A (ja) 1983-06-17
JPH0140952B2 JPH0140952B2 (enrdf_load_stackoverflow) 1989-09-01

Family

ID=16430723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56200819A Granted JPS58102152A (ja) 1981-12-15 1981-12-15 超音波顕微鏡

Country Status (1)

Country Link
JP (1) JPS58102152A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62255864A (ja) * 1986-04-28 1987-11-07 Olympus Optical Co Ltd 自動傾斜調整試料台
JP2007212387A (ja) * 2006-02-13 2007-08-23 Seiko Instruments Inc 薄切片作製装置及び薄切片作製方法
JP2009271049A (ja) * 2004-01-22 2009-11-19 Sakura Finetex Usa Inc マルチ軸ワークピースチャック
DE102016211126A1 (de) * 2016-06-22 2017-12-28 Osram Opto Semiconductors Gmbh Messeinrichtung für flächige Proben und Verfahren zum Messen

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62255864A (ja) * 1986-04-28 1987-11-07 Olympus Optical Co Ltd 自動傾斜調整試料台
JP2009271049A (ja) * 2004-01-22 2009-11-19 Sakura Finetex Usa Inc マルチ軸ワークピースチャック
JP2007212387A (ja) * 2006-02-13 2007-08-23 Seiko Instruments Inc 薄切片作製装置及び薄切片作製方法
DE102016211126A1 (de) * 2016-06-22 2017-12-28 Osram Opto Semiconductors Gmbh Messeinrichtung für flächige Proben und Verfahren zum Messen

Also Published As

Publication number Publication date
JPH0140952B2 (enrdf_load_stackoverflow) 1989-09-01

Similar Documents

Publication Publication Date Title
US8072663B2 (en) Scanning system for lidar
CN113015588A (zh) 三维造型方法和三维造型装置
CN110187495A (zh) 驱动器及光扫描装置
WO2020250343A1 (ja) 障害物検出装置
CN107803590B (zh) 检电扫描器
CN110133842A (zh) 一种振镜扫描装置及系统
JPH0428104B2 (enrdf_load_stackoverflow)
JPS58102152A (ja) 超音波顕微鏡
US20200088979A1 (en) Optical apparatus
US7239435B2 (en) High-speed, high resolution, wide-format Cartesian scanning systems
CN113253471B (zh) 旋转式三维光激发装置
JP2023144664A (ja) 光走査装置、光走査装置の駆動方法、及び測距装置
JP2002277812A (ja) レーザ走査方法並びに走査装置
JP3162779B2 (ja) 光レーダシステムの光学ヘッド
JP2743861B2 (ja) レーザスキャン装置
JP2639321B2 (ja) レーザビームスキャンニング装置
JP2709928B2 (ja) 二次元走査装置
JPH01262520A (ja) レーザビームスキャナ
EP4237897B1 (en) Deflection device for lissajous scanning
JP2655456B2 (ja) 機械的走査光学装置
JPH0643369A (ja) レーザ走査顕微鏡における２次元スキャナ
SU1089539A1 (ru) Сканирующее устройство
JPS6363016A (ja) 光ビ−ム走査装置
GB2130836A (en) Optical rotational printer
JPS63178208A (ja) レ−ザ光走査装置