JPS5798195A - Sample holding circuit - Google Patents
Sample holding circuitInfo
- Publication number
- JPS5798195A JPS5798195A JP55171996A JP17199680A JPS5798195A JP S5798195 A JPS5798195 A JP S5798195A JP 55171996 A JP55171996 A JP 55171996A JP 17199680 A JP17199680 A JP 17199680A JP S5798195 A JPS5798195 A JP S5798195A
- Authority
- JP
- Japan
- Prior art keywords
- sample holding
- amplifier
- high frequency
- filter
- switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
- G11C27/024—Sample-and-hold arrangements using a capacitive memory element
- G11C27/026—Sample-and-hold arrangements using a capacitive memory element associated with an amplifier
Landscapes
- Channel Selection Circuits, Automatic Tuning Circuits (AREA)
Abstract
PURPOSE:To decrease a high frequency noise against a DC control voltage signal, and to satisfactorily hold the frequency stability of a sample holding circuit, by providing 2 loop filters for sample holding, and removing a high frequency noise. CONSTITUTION:A phase detecting output signal IN1 is sampled by a switch SW1 and a capacitor, and a sampling signal is outputted through a buffer amplifier IC1, a loop filter 1 and a buffer amplifier IC2. Between this switch SW1 and a resistance R3 connected to a positive input terminal of the amplifier IC1, the loop filter 1 for sample holding is connected, the phase detecting output signal is sampled by the switch SW1 and the capacitor C1 in the filter 1, and also high frequency is decreased by the filter 1. Also, the high frequency noise is decreased by inserting a loop filter 2 between the amplifier IC1 and the amplifier IC2.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55171996A JPS6047678B2 (en) | 1980-12-08 | 1980-12-08 | sample hold circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55171996A JPS6047678B2 (en) | 1980-12-08 | 1980-12-08 | sample hold circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5798195A true JPS5798195A (en) | 1982-06-18 |
JPS6047678B2 JPS6047678B2 (en) | 1985-10-23 |
Family
ID=15933588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55171996A Expired JPS6047678B2 (en) | 1980-12-08 | 1980-12-08 | sample hold circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6047678B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57158097A (en) * | 1981-03-25 | 1982-09-29 | Nippon Telegr & Teleph Corp <Ntt> | Sample holding circuit |
JPS60154399A (en) * | 1984-01-24 | 1985-08-14 | Nippon Telegr & Teleph Corp <Ntt> | Sample and hold circuit |
JP2015138560A (en) * | 2014-01-20 | 2015-07-30 | 株式会社デンソー | Electronic device |
EP3490148A3 (en) * | 2017-11-28 | 2019-07-24 | Aisin Seiki Kabushiki Kaisha | Capacitance detecting device |
-
1980
- 1980-12-08 JP JP55171996A patent/JPS6047678B2/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57158097A (en) * | 1981-03-25 | 1982-09-29 | Nippon Telegr & Teleph Corp <Ntt> | Sample holding circuit |
JPS60154399A (en) * | 1984-01-24 | 1985-08-14 | Nippon Telegr & Teleph Corp <Ntt> | Sample and hold circuit |
JP2015138560A (en) * | 2014-01-20 | 2015-07-30 | 株式会社デンソー | Electronic device |
EP3490148A3 (en) * | 2017-11-28 | 2019-07-24 | Aisin Seiki Kabushiki Kaisha | Capacitance detecting device |
Also Published As
Publication number | Publication date |
---|---|
JPS6047678B2 (en) | 1985-10-23 |
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