JPS5793529A - Processing method and tool for semiconductor wafer - Google Patents
Processing method and tool for semiconductor waferInfo
- Publication number
- JPS5793529A JPS5793529A JP17008180A JP17008180A JPS5793529A JP S5793529 A JPS5793529 A JP S5793529A JP 17008180 A JP17008180 A JP 17008180A JP 17008180 A JP17008180 A JP 17008180A JP S5793529 A JPS5793529 A JP S5793529A
- Authority
- JP
- Japan
- Prior art keywords
- rear surface
- strain
- differring
- cutting edge
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D61/00—Tools for sawing machines or sawing devices; Clamping devices for these tools
- B23D61/02—Circular saw blades
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
PURPOSE:To make a process unnecessary by which a strain is produced on the rear surface by cutting with a cutting edge having grinding grains differring in qualities and by forming a strain layer of a crystal defect on the wafer rear surface actively when a semiconductor ingot is cut. CONSTITUTION:Grinding grains differring in particle sizes and hardness are provided on both surface of an edge part of a stainless steel plate 4 of a cutting edge. When using such the cutting edge 9, a semiconductor ingot 1 fixed by means of wax 2 is cut on a pedestal 3, a processed wafer having both of right and left surfaces differring in mechanical damages being large and small are provided. A strain layer on the surface 11 is removed. Hereby, a strain layer is left on the rear surface, and thereby a strain forming process for the wafer rear surface is not required.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17008180A JPS5793529A (en) | 1980-12-02 | 1980-12-02 | Processing method and tool for semiconductor wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17008180A JPS5793529A (en) | 1980-12-02 | 1980-12-02 | Processing method and tool for semiconductor wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5793529A true JPS5793529A (en) | 1982-06-10 |
Family
ID=15898281
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17008180A Pending JPS5793529A (en) | 1980-12-02 | 1980-12-02 | Processing method and tool for semiconductor wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5793529A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02107406A (en) * | 1988-10-18 | 1990-04-19 | Furukawa Electric Co Ltd:The | Cutting method for wafer and cutting rotary blade |
-
1980
- 1980-12-02 JP JP17008180A patent/JPS5793529A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02107406A (en) * | 1988-10-18 | 1990-04-19 | Furukawa Electric Co Ltd:The | Cutting method for wafer and cutting rotary blade |
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