JPS579219B2 - - Google Patents
Info
- Publication number
- JPS579219B2 JPS579219B2 JP3384073A JP3384073A JPS579219B2 JP S579219 B2 JPS579219 B2 JP S579219B2 JP 3384073 A JP3384073 A JP 3384073A JP 3384073 A JP3384073 A JP 3384073A JP S579219 B2 JPS579219 B2 JP S579219B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Bipolar Transistors (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3384073A JPS579219B2 (en) | 1973-03-24 | 1973-03-24 | |
| GB1150774A GB1468378A (en) | 1973-03-24 | 1974-03-14 | Method for manufacturing a transistor |
| DE19742414222 DE2414222C3 (en) | 1973-03-24 | 1974-03-25 | Measurement and test methods for determining the current gain of a transistor during manufacture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3384073A JPS579219B2 (en) | 1973-03-24 | 1973-03-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS49122672A JPS49122672A (en) | 1974-11-22 |
| JPS579219B2 true JPS579219B2 (en) | 1982-02-20 |
Family
ID=12397673
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3384073A Expired JPS579219B2 (en) | 1973-03-24 | 1973-03-24 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS579219B2 (en) |
| DE (1) | DE2414222C3 (en) |
| GB (1) | GB1468378A (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5650561A (en) * | 1979-10-02 | 1981-05-07 | Mitsubishi Electric Corp | Semiconductor device |
| JPS5656668A (en) * | 1979-10-13 | 1981-05-18 | Mitsubishi Electric Corp | Manufacture of semiconductor device |
| DE2949590A1 (en) * | 1979-12-10 | 1981-06-11 | Robert Bosch do Brasil, Campinas | Integrated circuit with drive and load transistors - incorporates diffused test zones in emitter zones, combined with collector potential contact zone |
| JPS56134764A (en) * | 1980-03-26 | 1981-10-21 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Manufacturing of bipolar integrated circuit |
| US5457399A (en) * | 1992-12-14 | 1995-10-10 | Hughes Aircraft Company | Microwave monolithic integrated circuit fabrication, test method and test probes |
-
1973
- 1973-03-24 JP JP3384073A patent/JPS579219B2/ja not_active Expired
-
1974
- 1974-03-14 GB GB1150774A patent/GB1468378A/en not_active Expired
- 1974-03-25 DE DE19742414222 patent/DE2414222C3/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| DE2414222C3 (en) | 1979-11-29 |
| GB1468378A (en) | 1977-03-23 |
| DE2414222B2 (en) | 1979-04-05 |
| DE2414222A1 (en) | 1974-10-17 |
| JPS49122672A (en) | 1974-11-22 |