JPS5763447A - Ultrasonic flaw detector - Google Patents

Ultrasonic flaw detector

Info

Publication number
JPS5763447A
JPS5763447A JP55138704A JP13870480A JPS5763447A JP S5763447 A JPS5763447 A JP S5763447A JP 55138704 A JP55138704 A JP 55138704A JP 13870480 A JP13870480 A JP 13870480A JP S5763447 A JPS5763447 A JP S5763447A
Authority
JP
Japan
Prior art keywords
display
substance
detector
signal
array probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55138704A
Other languages
Japanese (ja)
Inventor
Kuniharu Uchida
Satoshi Nagai
Ichiro Furumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55138704A priority Critical patent/JPS5763447A/en
Publication of JPS5763447A publication Critical patent/JPS5763447A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G01N29/0627—Cathode-ray tube displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To display image on a cathode ray tube always in normal view sense, by a method wherein a slanting angle of an array probe to the surface of an inspected substance is detected, coordinate conversion is effected, and pattern image display is controlled. CONSTITUTION:An array probe 2 has an arm 9 attached thereto and a detector 11 for detecting the relative rotation angle to a fixed shaft 10 is attached to the top end of the arm 9. Signal of the detector 11 is entered in a pattern processing display 12 and electric operation is performed, thereby the surface of substance 1 or a defect 7 is normally displayed. Assuming that sound speed in water be designated by C1, sound speed propagated through the substance by C2, and a slanting angle of the substance 1 to the array probe 2 according to the detector 11 by theta, pattern image display in the conventional display method is inclined by phi=tan-<1(>C2/C1 tantheta). Accordingly, the signal of angle phi to X, Y signal to be entered in a conventional cathode ray tube is used in the pattern processing display 12 and coordinate conversion is effected by the operation processing, thereby normal pattern image is obtained.
JP55138704A 1980-10-06 1980-10-06 Ultrasonic flaw detector Pending JPS5763447A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55138704A JPS5763447A (en) 1980-10-06 1980-10-06 Ultrasonic flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55138704A JPS5763447A (en) 1980-10-06 1980-10-06 Ultrasonic flaw detector

Publications (1)

Publication Number Publication Date
JPS5763447A true JPS5763447A (en) 1982-04-16

Family

ID=15228170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55138704A Pending JPS5763447A (en) 1980-10-06 1980-10-06 Ultrasonic flaw detector

Country Status (1)

Country Link
JP (1) JPS5763447A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5165280A (en) * 1990-08-28 1992-11-24 Nukem Gmbh Device for testing of oblong objects by means of ultrasonic waves

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5292778A (en) * 1976-01-30 1977-08-04 Hitachi Ltd Section indicating apparatus in use of ultrasonic wave
JPS5482884A (en) * 1977-12-14 1979-07-02 Ito Kenichi Twoodimensional scan ultrasonic wave probe

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5292778A (en) * 1976-01-30 1977-08-04 Hitachi Ltd Section indicating apparatus in use of ultrasonic wave
JPS5482884A (en) * 1977-12-14 1979-07-02 Ito Kenichi Twoodimensional scan ultrasonic wave probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5165280A (en) * 1990-08-28 1992-11-24 Nukem Gmbh Device for testing of oblong objects by means of ultrasonic waves

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