JPS576305A - Method and apparatus for plane part inspection of circular member - Google Patents

Method and apparatus for plane part inspection of circular member

Info

Publication number
JPS576305A
JPS576305A JP7983380A JP7983380A JPS576305A JP S576305 A JPS576305 A JP S576305A JP 7983380 A JP7983380 A JP 7983380A JP 7983380 A JP7983380 A JP 7983380A JP S576305 A JPS576305 A JP S576305A
Authority
JP
Japan
Prior art keywords
plane
circular member
slit
electric signal
reflected light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7983380A
Other languages
Japanese (ja)
Other versions
JPS637323B2 (en
Inventor
Hiroshi Ito
Mitsuru Ezaki
Hiroshi Kuno
Kanji Kitou
Morihiro Matsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Central R&D Labs Inc
Original Assignee
Toyota Central R&D Labs Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Central R&D Labs Inc filed Critical Toyota Central R&D Labs Inc
Priority to JP7983380A priority Critical patent/JPS576305A/en
Publication of JPS576305A publication Critical patent/JPS576305A/en
Publication of JPS637323B2 publication Critical patent/JPS637323B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable noncontacting automatic inspection of failure of a plane part, by irradiating a slit light flux to the plane of a rotating circular member with a greater incident angle, receiving the regular reflected light and converting it into an electric signal, and processing it electrically. CONSTITUTION:While rotating a circular member, a slit light flux is irradiated on the plane with a greater incident angle, the regular reflected light is received and it is converted into an electric signal, it is processed electrically and a signal corresponding to failures of the plane is picked up, allowing to make noncontacting detection of failures. For example, to a ring-shaped plane 10a at the upper end of a circular member 10 placed on a rotating stand 12, a slit light flux from a light source 26 having a slit is given to a greater radiation angle theta, the regular reflected light is received at a photoelectric detector 34 and it is converted into an electric signal. If burr or rugged skin of the plane is present, the signal shows a failure, then immediate detection can be made. With this method, quick automatic inspection without contacting can be made.
JP7983380A 1980-06-13 1980-06-13 Method and apparatus for plane part inspection of circular member Granted JPS576305A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7983380A JPS576305A (en) 1980-06-13 1980-06-13 Method and apparatus for plane part inspection of circular member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7983380A JPS576305A (en) 1980-06-13 1980-06-13 Method and apparatus for plane part inspection of circular member

Publications (2)

Publication Number Publication Date
JPS576305A true JPS576305A (en) 1982-01-13
JPS637323B2 JPS637323B2 (en) 1988-02-16

Family

ID=13701204

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7983380A Granted JPS576305A (en) 1980-06-13 1980-06-13 Method and apparatus for plane part inspection of circular member

Country Status (1)

Country Link
JP (1) JPS576305A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0450711A (en) * 1990-06-18 1992-02-19 Kaiyo Kagaku Gijutsu Center Measuring instrument for underwater suspension shape

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0450711A (en) * 1990-06-18 1992-02-19 Kaiyo Kagaku Gijutsu Center Measuring instrument for underwater suspension shape

Also Published As

Publication number Publication date
JPS637323B2 (en) 1988-02-16

Similar Documents

Publication Publication Date Title
JPS576307A (en) Method and apparatus of surface failure inspection of circular member
EP0148497A3 (en) Method and device for guiding and collecting light in photometry or the like
JPS569763A (en) Beam recording device
JPS55125439A (en) Defect inspection device
JPS54161325A (en) Focus detector
JPS576305A (en) Method and apparatus for plane part inspection of circular member
ATE38436T1 (en) DEVICE FOR TREATMENT AND STUDY OF A SURFACE.
GB963587A (en) A device for indicating marks and the like on a surface
JPS5355983A (en) Automatic micro defect detector
GB8702321D0 (en) Welding
JPS576306A (en) Method and apparatus for inspection of edge boundary part of circular member
JPS5262043A (en) Automatic testing instrument
JPS57128834A (en) Inspecting apparatus of foreign substance
JPS6488237A (en) Surface inspecting apparatus
JPS5667739A (en) Defect inspecting apparatus
JPS57208404A (en) Configuration detecting method
JPS5520454A (en) Testing unit of light transmitting object dependent upon laser
JPS576304A (en) Method and apparatus for cone plane inspection of circular member
JPS5427972A (en) Method of detecting conduction in cable core breakage test
JPS6454304A (en) Surface state inspection device
JPS57168384A (en) Detecting method for shape of object
JPS5388782A (en) Method of inspecting abnormality of surface of long material
JPS6428837A (en) Defect inspection device
JPS57160004A (en) Detecting method and device for position of crane
JPS62257741A (en) Inspection device for surface of semiconductor substrate