JPS5752146A - Controlling method for wafer probe - Google Patents

Controlling method for wafer probe

Info

Publication number
JPS5752146A
JPS5752146A JP12755280A JP12755280A JPS5752146A JP S5752146 A JPS5752146 A JP S5752146A JP 12755280 A JP12755280 A JP 12755280A JP 12755280 A JP12755280 A JP 12755280A JP S5752146 A JPS5752146 A JP S5752146A
Authority
JP
Japan
Prior art keywords
test
probe body
wafer
wafer probe
external tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12755280A
Other languages
English (en)
Inventor
Tomihito Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP12755280A priority Critical patent/JPS5752146A/ja
Publication of JPS5752146A publication Critical patent/JPS5752146A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP12755280A 1980-09-12 1980-09-12 Controlling method for wafer probe Pending JPS5752146A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12755280A JPS5752146A (en) 1980-09-12 1980-09-12 Controlling method for wafer probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12755280A JPS5752146A (en) 1980-09-12 1980-09-12 Controlling method for wafer probe

Publications (1)

Publication Number Publication Date
JPS5752146A true JPS5752146A (en) 1982-03-27

Family

ID=14962825

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12755280A Pending JPS5752146A (en) 1980-09-12 1980-09-12 Controlling method for wafer probe

Country Status (1)

Country Link
JP (1) JPS5752146A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59174275A (ja) * 1983-03-23 1984-10-02 Sumitomo Metal Ind Ltd 金属材の溶削手入装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59174275A (ja) * 1983-03-23 1984-10-02 Sumitomo Metal Ind Ltd 金属材の溶削手入装置
JPH0448547B2 (ja) * 1983-03-23 1992-08-07 Sumitomo Metal Ind

Similar Documents

Publication Publication Date Title
JPS6465848A (en) Alignment
ES454276A1 (es) Perfeccionamientos en un dispositivo para detectar la gona- dotropina corionica humana o su subunidad beta en la orina oel suero en la prueba de embarazo.
JPS5752146A (en) Controlling method for wafer probe
JPS5262043A (en) Automatic testing instrument
JPS5720991A (en) Margin measuring method
JPS5582039A (en) Evaluation method of soldering and its unit
JPS5759115A (en) Calibrating data writing method applied externally to information measuring device and information measuring device stored with calibra ting data
JPS5554440A (en) Reagent kit for agglutination measurment
JPS56103428A (en) Sensing method of wafer limit
JPS5723117A (en) Automatic measuring device for dynamic characteristic of process
JPS5312218A (en) Automatic detection range setting circuit
JPS5790140A (en) Measuring device for adhesive force
JPS5342632A (en) Stability continous test method of bubble information
JPS5745942A (en) Semiconductor integrated circuit device
JPS57172558A (en) Magnetic recording and reproducing device
JPS5683045A (en) Wafer probe
ATE16049T1 (de) Verfahren zum erkennen des geschlechtes von eierlegenden tieren in weibchen in vitellogenese durch einen immunoagglutinationstest.
Schherbinskii Methods of Setting the Sensitivity Time Controls in Ultrasonic Flaw Detectors
JPS5632740A (en) Defect observing apparatus
JPS52152783A (en) Tester for sintered porous body
JPS5753674A (en) Emission ct
JPS52111785A (en) Flaw detector
Degner et al. A New Non-Contact Method for Determining the Physico- Chemical Surface Finish of Workpieces
Zibarova et al. An Extraction-Photometric Determination of Small Quantities of Iron in Quartzes
Maly et al. Fluorimetric Determination of Submicrogram Concentrations of Beryllium