JPS5750629A - Method and device for measuring surface temperature and emissivity - Google Patents

Method and device for measuring surface temperature and emissivity

Info

Publication number
JPS5750629A
JPS5750629A JP55126907A JP12690780A JPS5750629A JP S5750629 A JPS5750629 A JP S5750629A JP 55126907 A JP55126907 A JP 55126907A JP 12690780 A JP12690780 A JP 12690780A JP S5750629 A JPS5750629 A JP S5750629A
Authority
JP
Japan
Prior art keywords
temp
measured
cavities
opening
emissivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55126907A
Other languages
Japanese (ja)
Inventor
Kiyoshi Tamura
Kunio Kurita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP55126907A priority Critical patent/JPS5750629A/en
Publication of JPS5750629A publication Critical patent/JPS5750629A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53—Reference sources, e.g. standard lamps; Black bodies
    • G01J5/532—Reference sources, e.g. standard lamps; Black bodies using a reference heater of the emissive surface type, e.g. for selectively absorbing materials

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To independently measure surface temps. and emissivities by disposing a pair of cavities provided with temp. controllers with the opening part of one of these located in proximity to the surface to be measured and the other spaced by a fixed distance, and measuring the luminance temp. of the surface to be measured through the small holes in the upper part. CONSTITUTION:A pair of cavities 20, 22 are disposed with the opening of the one cavity 20 located in proximity to the surface 16 to be measured and the opening of the other cavity 20 spaced at a fixed distance from the surface 16. The inside wall temps. of the cavities are controlled to a constant temp. Tw by temp. controllers 24 and thermocouples Tc. The luminance temp. of the surface 16 is detected with radiation thermometers 26, 28 through the small holes in the upper part of the cavities 20, 22. The indicated values S1, S2 thereof are inputted to an arithmetic device 30, by which a surface temp. T and an emissivity epsilon are calculated. These are displayed in a display device 32 and are monitored 44. Thereby, the surface temp. T and the emissivity epsilon are independently measured.
JP55126907A 1980-09-12 1980-09-12 Method and device for measuring surface temperature and emissivity Pending JPS5750629A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55126907A JPS5750629A (en) 1980-09-12 1980-09-12 Method and device for measuring surface temperature and emissivity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55126907A JPS5750629A (en) 1980-09-12 1980-09-12 Method and device for measuring surface temperature and emissivity

Publications (1)

Publication Number Publication Date
JPS5750629A true JPS5750629A (en) 1982-03-25

Family

ID=14946837

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55126907A Pending JPS5750629A (en) 1980-09-12 1980-09-12 Method and device for measuring surface temperature and emissivity

Country Status (1)

Country Link
JP (1) JPS5750629A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57161521A (en) * 1981-03-31 1982-10-05 Chino Works Ltd Radiation thermometer
JPS6227633A (en) * 1985-07-29 1987-02-05 Kawasaki Steel Corp Method and apparatus for measuring temperature of body
JP2020165794A (en) * 2019-03-29 2020-10-08 株式会社チノー Inclined mirror multiple reflection type radiation thermometer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4918384A (en) * 1972-06-10 1974-02-18

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4918384A (en) * 1972-06-10 1974-02-18

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57161521A (en) * 1981-03-31 1982-10-05 Chino Works Ltd Radiation thermometer
JPS634651B2 (en) * 1981-03-31 1988-01-29 Chino Corp
JPS6227633A (en) * 1985-07-29 1987-02-05 Kawasaki Steel Corp Method and apparatus for measuring temperature of body
JP2020165794A (en) * 2019-03-29 2020-10-08 株式会社チノー Inclined mirror multiple reflection type radiation thermometer

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