JPS5744999A - Apparatus for improving precision of examination by fluoroscopy - Google Patents

Apparatus for improving precision of examination by fluoroscopy

Info

Publication number
JPS5744999A
JPS5744999A JP55119688A JP11968880A JPS5744999A JP S5744999 A JPS5744999 A JP S5744999A JP 55119688 A JP55119688 A JP 55119688A JP 11968880 A JP11968880 A JP 11968880A JP S5744999 A JPS5744999 A JP S5744999A
Authority
JP
Japan
Prior art keywords
rays
radiated
grid
radiant
focus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55119688A
Other languages
Japanese (ja)
Inventor
Tadao Kubota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OOBAYASHI SEISAKUSHO KK
Original Assignee
OOBAYASHI SEISAKUSHO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by OOBAYASHI SEISAKUSHO KK filed Critical OOBAYASHI SEISAKUSHO KK
Priority to JP55119688A priority Critical patent/JPS5744999A/en
Publication of JPS5744999A publication Critical patent/JPS5744999A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

PURPOSE:To filter radiated X-rays and allow only effective X-rays to be radiated to an object by a method wherein a grid made of, for instance, lead is provided in such a way that the grid and the axis of radiant X-rays cross at right angles at the position close to the focus of radiant X-rays from an anode in an X-ray tube. CONSTITUTION:A rotary anode 3 and a cathode 4 in an X-ray tube 1 are made to face each other to form a radiant focus S by allowing thermions to bombard the anode 3. Then the X-rays generated are radiated from an emitter 5 to an object. At this time, a lead grid A is mounted on the bottom inside the cone 6 of the emitter 5 close to the radiant focus S, so that the X-rays advancing straightly are allowed to pass through an aperture of the grid A before being radiated. Therefore, the secondary X-rays which make indistinct an image radiated from the focus S can be captured and removed by the lead foil of the grid A. Thus effective X-rays only are usable for forming a clear image.
JP55119688A 1980-09-01 1980-09-01 Apparatus for improving precision of examination by fluoroscopy Pending JPS5744999A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55119688A JPS5744999A (en) 1980-09-01 1980-09-01 Apparatus for improving precision of examination by fluoroscopy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55119688A JPS5744999A (en) 1980-09-01 1980-09-01 Apparatus for improving precision of examination by fluoroscopy

Publications (1)

Publication Number Publication Date
JPS5744999A true JPS5744999A (en) 1982-03-13

Family

ID=14767585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55119688A Pending JPS5744999A (en) 1980-09-01 1980-09-01 Apparatus for improving precision of examination by fluoroscopy

Country Status (1)

Country Link
JP (1) JPS5744999A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62224827A (en) * 1986-03-25 1987-10-02 Nec Corp Buffer circuit
WO2002004932A1 (en) * 2000-07-10 2002-01-17 Hitachi Medical Corporation X-ray measuring apparatus
JP2003018463A (en) * 2001-07-03 2003-01-17 Hitachi Medical Corp X-ray inspection apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62224827A (en) * 1986-03-25 1987-10-02 Nec Corp Buffer circuit
WO2002004932A1 (en) * 2000-07-10 2002-01-17 Hitachi Medical Corporation X-ray measuring apparatus
JP2003018463A (en) * 2001-07-03 2003-01-17 Hitachi Medical Corp X-ray inspection apparatus

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