JPS5740660A - Testing method for semiconductor device - Google Patents

Testing method for semiconductor device

Info

Publication number
JPS5740660A
JPS5740660A JP55117388A JP11738880A JPS5740660A JP S5740660 A JPS5740660 A JP S5740660A JP 55117388 A JP55117388 A JP 55117388A JP 11738880 A JP11738880 A JP 11738880A JP S5740660 A JPS5740660 A JP S5740660A
Authority
JP
Japan
Prior art keywords
current
absorb
driver
ability
memory cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55117388A
Other languages
Japanese (ja)
Inventor
Hajime Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55117388A priority Critical patent/JPS5740660A/en
Publication of JPS5740660A publication Critical patent/JPS5740660A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To enable checking of all of desired tests at a stage when products are delivered from a manufacturer, by a method wherein it is previously tested whether or not a driver of a P-PROM has an ability to absorb a writing current. CONSTITUTION:A P-ROM has several output terminals and a terminal, wherethrough a writing current flows, is combined with the output terminal, which is utilized for testing an ability for a driver, selected by a decoder, to absorb a current by a method wherein a current, having no possibility of simultaneously writing a memory cell, is caused to flow from each output terminal to the memory cell connected to each output terminal selected by a decoder. Thus, it can be tested whether or not the driver has an ability to absorb a writing current without destroying the memory cell, and all of the desired tests can be checked at a stage when poducts are delivered from the manufacturer.
JP55117388A 1980-08-26 1980-08-26 Testing method for semiconductor device Pending JPS5740660A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55117388A JPS5740660A (en) 1980-08-26 1980-08-26 Testing method for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55117388A JPS5740660A (en) 1980-08-26 1980-08-26 Testing method for semiconductor device

Publications (1)

Publication Number Publication Date
JPS5740660A true JPS5740660A (en) 1982-03-06

Family

ID=14710407

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55117388A Pending JPS5740660A (en) 1980-08-26 1980-08-26 Testing method for semiconductor device

Country Status (1)

Country Link
JP (1) JPS5740660A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01111380A (en) * 1987-10-23 1989-04-28 Sumitomo Metal Ind Ltd Photovoltaic device and its manufacture
JP2002350209A (en) * 2001-05-30 2002-12-04 Matsushita Electric Ind Co Ltd Gas protection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01111380A (en) * 1987-10-23 1989-04-28 Sumitomo Metal Ind Ltd Photovoltaic device and its manufacture
JP2002350209A (en) * 2001-05-30 2002-12-04 Matsushita Electric Ind Co Ltd Gas protection device

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