JPS5736841A - Chip testing device - Google Patents

Chip testing device

Info

Publication number
JPS5736841A
JPS5736841A JP11280380A JP11280380A JPS5736841A JP S5736841 A JPS5736841 A JP S5736841A JP 11280380 A JP11280380 A JP 11280380A JP 11280380 A JP11280380 A JP 11280380A JP S5736841 A JPS5736841 A JP S5736841A
Authority
JP
Japan
Prior art keywords
substrate
chip
tested
mercury
inlet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11280380A
Other languages
Japanese (ja)
Other versions
JPS6138857B2 (en
Inventor
Isamu Odaka
Katsuhiko Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP11280380A priority Critical patent/JPS5736841A/en
Publication of JPS5736841A publication Critical patent/JPS5736841A/en
Publication of JPS6138857B2 publication Critical patent/JPS6138857B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To enable the electric connection of a chip to an external circuit without damage to the chip to be tested by utilizing the projection of mercury filled in a substrate as the end of a probe. CONSTITUTION:A chip 5 to be tested is supported by a support 9 for the chip to be tested, and a socket substrate 10 is secured by a guide post 11 to a base substrate 8. An elevationally movable wiring substrate 12 is mounted on the post 11. The substrate 10 has a lower half part 10-1 and an upper half part 10-2 with a plurality of cavities 10 having wide interior and narrow inlet and mercury 13 filled therein. A terminal 6 of the chip 5 to be tested is inserted into one inlet of the substrate 10, and a test pin 15 on the wire 14 of a strip line formed on the substrate 12 is inserted into the other inlet. In this manner the chip 5 to be tested and the wire 14 on the substrate 12 are electrically connected via the mercury 13.
JP11280380A 1980-08-15 1980-08-15 Chip testing device Granted JPS5736841A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11280380A JPS5736841A (en) 1980-08-15 1980-08-15 Chip testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11280380A JPS5736841A (en) 1980-08-15 1980-08-15 Chip testing device

Publications (2)

Publication Number Publication Date
JPS5736841A true JPS5736841A (en) 1982-02-27
JPS6138857B2 JPS6138857B2 (en) 1986-09-01

Family

ID=14595913

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11280380A Granted JPS5736841A (en) 1980-08-15 1980-08-15 Chip testing device

Country Status (1)

Country Link
JP (1) JPS5736841A (en)

Also Published As

Publication number Publication date
JPS6138857B2 (en) 1986-09-01

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