JPS57207852A - Method of detecting three-dimensional object - Google Patents

Method of detecting three-dimensional object

Info

Publication number
JPS57207852A
JPS57207852A JP8082182A JP8082182A JPS57207852A JP S57207852 A JPS57207852 A JP S57207852A JP 8082182 A JP8082182 A JP 8082182A JP 8082182 A JP8082182 A JP 8082182A JP S57207852 A JPS57207852 A JP S57207852A
Authority
JP
Japan
Prior art keywords
detecting
dimensional object
dimensional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8082182A
Other languages
English (en)
Inventor
Deemensu Giyuntaa
Shiyunaidaa Rihiaruto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Schuckertwerke AG
Siemens AG
Original Assignee
Siemens Schuckertwerke AG
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Schuckertwerke AG, Siemens AG filed Critical Siemens Schuckertwerke AG
Publication of JPS57207852A publication Critical patent/JPS57207852A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP8082182A 1981-05-15 1982-05-13 Method of detecting three-dimensional object Pending JPS57207852A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19813119505 DE3119505A1 (de) 1981-05-15 1981-05-15 Optischer sensor fuer die erfassung von dreidimensionalen objekten

Publications (1)

Publication Number Publication Date
JPS57207852A true JPS57207852A (en) 1982-12-20

Family

ID=6132473

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8082182A Pending JPS57207852A (en) 1981-05-15 1982-05-13 Method of detecting three-dimensional object

Country Status (2)

Country Link
JP (1) JPS57207852A (ja)
DE (1) DE3119505A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59164973A (ja) * 1983-03-10 1984-09-18 Nippon Tsushin Gijutsu Kk ロボツト用ペア形計測ヘツド
JPS6244615A (ja) * 1985-08-22 1987-02-26 Mitsubishi Electric Corp 距離測定装置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4687324A (en) * 1983-05-18 1987-08-18 Gerd Selbach Laser-based measuring system
JPS6186606A (ja) * 1984-10-05 1986-05-02 Hitachi Ltd 非接触形状測定方法
DE3743363A1 (de) * 1987-12-21 1989-07-06 Zeiss Carl Fa Verfahren und einrichtung zur regelung der emissionslichtmenge in einem optischen tastkopf
EP2362936B1 (en) * 2008-10-28 2012-10-17 3Shape A/S Scanner with feedback control

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4983470A (ja) * 1972-11-18 1974-08-10
JPS519623A (en) * 1974-07-12 1976-01-26 Matsushita Electric Ind Co Ltd Isobunrigatakaraasatsuzosochi
JPS5596406A (en) * 1979-01-19 1980-07-22 Hitachi Ltd Device for determining roughness of surface
JPS55124005A (en) * 1979-03-20 1980-09-24 Hitachi Ltd Contour line display device
JPS55154402A (en) * 1979-05-21 1980-12-02 Anritsu Corp Shape measuring apparatus
JPS5636004A (en) * 1979-09-03 1981-04-09 Hitachi Ltd Detecting method of configuration and apparatus thereof

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1179161A (en) * 1967-01-20 1970-01-28 Vickers Ltd Electron-Beam Welding.
CA994865A (en) * 1972-05-03 1976-08-10 Eastman Kodak Company Apparatus for linearizing the responses of a mirror galvanometer
GB1402407A (en) * 1972-11-30 1975-08-06 Street Graham S B Apparatus for examining a record with a light beam
DE2735245A1 (de) * 1977-08-04 1979-02-15 Siemens Ag Anordnung zur erzeugung einer konstanten signalamplitude bei einem optoelektronischen abtastsystem

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4983470A (ja) * 1972-11-18 1974-08-10
JPS519623A (en) * 1974-07-12 1976-01-26 Matsushita Electric Ind Co Ltd Isobunrigatakaraasatsuzosochi
JPS5596406A (en) * 1979-01-19 1980-07-22 Hitachi Ltd Device for determining roughness of surface
JPS55124005A (en) * 1979-03-20 1980-09-24 Hitachi Ltd Contour line display device
JPS55154402A (en) * 1979-05-21 1980-12-02 Anritsu Corp Shape measuring apparatus
JPS5636004A (en) * 1979-09-03 1981-04-09 Hitachi Ltd Detecting method of configuration and apparatus thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59164973A (ja) * 1983-03-10 1984-09-18 Nippon Tsushin Gijutsu Kk ロボツト用ペア形計測ヘツド
JPS6244615A (ja) * 1985-08-22 1987-02-26 Mitsubishi Electric Corp 距離測定装置
JPH0412804B2 (ja) * 1985-08-22 1992-03-05 Mitsubishi Electric Corp

Also Published As

Publication number Publication date
DE3119505A1 (de) 1983-01-27

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