JPS57196466A - Electron multiplier - Google Patents

Electron multiplier

Info

Publication number
JPS57196466A
JPS57196466A JP57083343A JP8334382A JPS57196466A JP S57196466 A JPS57196466 A JP S57196466A JP 57083343 A JP57083343 A JP 57083343A JP 8334382 A JP8334382 A JP 8334382A JP S57196466 A JPS57196466 A JP S57196466A
Authority
JP
Japan
Prior art keywords
electron multiplier
multiplier
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57083343A
Other languages
English (en)
Japanese (ja)
Inventor
Buto Jiyannpieeru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of JPS57196466A publication Critical patent/JPS57196466A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H01J43/04—Electron multipliers
    • H01J43/06—Electrode arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H01J43/04—Electron multipliers
    • H01J43/06—Electrode arrangements
    • H01J43/18—Electrode arrangements using essentially more than one dynode
    • H01J43/24—Dynodes having potential gradient along their surfaces
    • H01J43/246—Microchannel plates [MCP]
JP57083343A 1981-05-20 1982-05-19 Electron multiplier Pending JPS57196466A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8110007A FR2506518A1 (fr) 1981-05-20 1981-05-20 Structure multiplicatrice d'electrons comportant un multiplicateur a galettes de microcanaux suivi d'un etage amplificateur a dynode, procede de fabrication et utilisation dans un tube photoelectrique

Publications (1)

Publication Number Publication Date
JPS57196466A true JPS57196466A (en) 1982-12-02

Family

ID=9258670

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57083343A Pending JPS57196466A (en) 1981-05-20 1982-05-19 Electron multiplier

Country Status (5)

Country Link
US (1) US4568853A (enExample)
JP (1) JPS57196466A (enExample)
DE (1) DE3217405A1 (enExample)
FR (1) FR2506518A1 (enExample)
GB (1) GB2098796B (enExample)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014078388A (ja) * 2012-10-10 2014-05-01 Hamamatsu Photonics Kk Ｍｃｐユニット、ｍｃｐ検出器および飛行時間型質量分析器
JP2014078501A (ja) * 2013-09-19 2014-05-01 Hamamatsu Photonics Kk Ｍｃｐユニット、ｍｃｐ検出器および飛行時間型質量分析器
JP2016139607A (ja) * 2015-01-23 2016-08-04 浜松ホトニクス株式会社 走査型電子顕微鏡
JP2016139606A (ja) * 2015-01-23 2016-08-04 浜松ホトニクス株式会社 飛行時間計測型質量分析装置
JP2017037782A (ja) * 2015-08-10 2017-02-16 浜松ホトニクス株式会社 荷電粒子検出器およびその制御方法
JP2017037783A (ja) * 2015-08-10 2017-02-16 浜松ホトニクス株式会社 荷電粒子検出器およびその制御方法
JP2019220431A (ja) * 2018-06-22 2019-12-26 浜松ホトニクス株式会社 Ｍｃｐアセンブリおよび荷電粒子検出器
WO2019244806A1 (ja) 2018-06-22 2019-12-26 浜松ホトニクス株式会社 Ｍｃｐアセンブリおよび荷電粒子検出器
JP2023108257A (ja) * 2022-01-25 2023-08-04 浜松ホトニクス株式会社 荷電粒子検出器
WO2024176600A1 (ja) 2023-02-22 2024-08-29 浜松ホトニクス株式会社 Ｍｃｐ検出器及び分析装置
WO2024176601A1 (ja) 2023-02-22 2024-08-29 浜松ホトニクス株式会社 Ｍｃｐ検出器及び分析装置

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4677342A (en) * 1985-02-01 1987-06-30 Raytheon Company Semiconductor secondary emission cathode and tube
JPH0244639A (ja) * 1988-08-04 1990-02-14 Hamamatsu Photonics Kk 光電子増倍管の製造方法
US4988867A (en) * 1989-11-06 1991-01-29 Galileo Electro-Optics Corp. Simultaneous positive and negative ion detector
US5493111A (en) * 1993-07-30 1996-02-20 Litton Systems, Inc. Photomultiplier having cascaded microchannel plates, and method for fabrication
DE4425691C2 (de) * 1994-07-20 1996-07-11 Siemens Ag Röntgenstrahler
GB2293685B (en) * 1994-09-29 1998-02-04 Era Patents Ltd Photomultiplier
US6215232B1 (en) * 1996-03-05 2001-04-10 Litton Systems, Inc. Microchannel plate having low ion feedback, method of its manufacture, and devices using such a microchannel plate
US6019913A (en) * 1998-05-18 2000-02-01 The Regents Of The University Of California Low work function, stable compound clusters and generation process
KR100496281B1 (ko) * 2000-02-07 2005-06-17 삼성에스디아이 주식회사 2차 전자 증폭 구조체를 채용한 마이크로 채널 플레이트및 이를 이용한 전계 방출 소자
GB201203561D0 (en) * 2012-02-29 2012-04-11 Photek Ltd Electron multiplying apparatus
US9640378B2 (en) 2015-01-23 2017-05-02 Hamamatsu Photonics K.K. Time-of-flight mass spectrometer
US9613781B2 (en) 2015-01-23 2017-04-04 Hamamatsu Photonics K.K. Scanning electron microscope
JP6340102B1 (ja) * 2017-03-01 2018-06-06 浜松ホトニクス株式会社 マイクロチャンネルプレート及び電子増倍体

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS511730U (enExample) * 1974-06-19 1976-01-08

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL94756C (enExample) * 1952-05-01
US2821637A (en) * 1953-11-30 1958-01-28 Westinghouse Electric Corp Light image reproduction devices
US3374380A (en) * 1965-11-10 1968-03-19 Bendix Corp Apparatus for suppression of ion feedback in electron multipliers
GB1159347A (en) * 1967-07-12 1969-07-23 Mullard Ltd Improvements in or relating to Image Intensifiers and the like
US3672989A (en) * 1968-08-03 1972-06-27 Japan Broadcasting Corp Porous layer of a secondary electron multiplier and a method of manufacturing the same
US3603828A (en) * 1969-01-28 1971-09-07 Sheldon Edward E X-ray image intensifier tube with secondary emission multiplier tunnels constructed to confine the x-rays to individual tunnels
FR2168861B1 (enExample) * 1972-01-24 1974-09-13 Labo Electronique Physique
GB1439822A (en) * 1973-02-06 1976-06-16 Standard Telephones Cables Ltd Gallium arsenide photocathodes
JPS523263B2 (enExample) * 1973-06-21 1977-01-27
US3854066A (en) * 1973-11-21 1974-12-10 Us Army Electron device incorporating a microchannel secondary emitter
FR2260863B1 (enExample) * 1974-02-13 1977-09-16 Labo Electronique Physique
DE2509180A1 (de) * 1974-03-04 1975-09-11 Rca Corp Verfahren zum aktivieren einer elektronenemittierenden multialkali- kathodenschicht
DE2507149C3 (de) * 1975-02-19 1980-02-21 Siemens Ag, 1000 Berlin Und 8000 Muenchen Verfahren zur Herstellung einer Bildwandler- oder Bildverstärkerröhre
US4019082A (en) * 1975-03-24 1977-04-19 Rca Corporation Electron emitting device and method of making the same
GB2028577A (en) * 1978-08-11 1980-03-05 Emi Ltd Electron multipliers
GB2048561B (en) * 1979-04-02 1983-02-23 Philips Electronic Associated Method of forming a secondary emissive coating on a dynode

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS511730U (enExample) * 1974-06-19 1976-01-08

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014078388A (ja) * 2012-10-10 2014-05-01 Hamamatsu Photonics Kk Ｍｃｐユニット、ｍｃｐ検出器および飛行時間型質量分析器
JP2014078501A (ja) * 2013-09-19 2014-05-01 Hamamatsu Photonics Kk Ｍｃｐユニット、ｍｃｐ検出器および飛行時間型質量分析器
JP2016139607A (ja) * 2015-01-23 2016-08-04 浜松ホトニクス株式会社 走査型電子顕微鏡
JP2016139606A (ja) * 2015-01-23 2016-08-04 浜松ホトニクス株式会社 飛行時間計測型質量分析装置
JP2017037782A (ja) * 2015-08-10 2017-02-16 浜松ホトニクス株式会社 荷電粒子検出器およびその制御方法
JP2017037783A (ja) * 2015-08-10 2017-02-16 浜松ホトニクス株式会社 荷電粒子検出器およびその制御方法
US9934952B2 (en) 2015-08-10 2018-04-03 Hamamatsu Photonics K.K. Charged-particle detector and method of controlling the same
WO2019244805A1 (ja) 2018-06-22 2019-12-26 浜松ホトニクス株式会社 Ｍｃｐアセンブリおよび荷電粒子検出器
WO2019244806A1 (ja) 2018-06-22 2019-12-26 浜松ホトニクス株式会社 Ｍｃｐアセンブリおよび荷電粒子検出器
JP2019220432A (ja) * 2018-06-22 2019-12-26 浜松ホトニクス株式会社 Ｍｃｐアセンブリおよび荷電粒子検出器
JP2019220431A (ja) * 2018-06-22 2019-12-26 浜松ホトニクス株式会社 Ｍｃｐアセンブリおよび荷電粒子検出器
KR20210021442A (ko) * 2018-06-22 2021-02-26 하마마츠 포토닉스 가부시키가이샤 Mcp 어셈블리 및 하전 입자 검출기
US11139153B2 (en) 2018-06-22 2021-10-05 Hamamatsu Photonics K.K. MCP assembly and charged particle detector
US11315772B2 (en) 2018-06-22 2022-04-26 Hamamatsu Photonics K.K. MCP assembly and charged particle detector
JP2023108257A (ja) * 2022-01-25 2023-08-04 浜松ホトニクス株式会社 荷電粒子検出器
US12431342B2 (en) 2022-01-25 2025-09-30 Hamamatsu Photonics K.K. Charged particle detector
WO2024176600A1 (ja) 2023-02-22 2024-08-29 浜松ホトニクス株式会社 Ｍｃｐ検出器及び分析装置
WO2024176601A1 (ja) 2023-02-22 2024-08-29 浜松ホトニクス株式会社 Ｍｃｐ検出器及び分析装置
EP4636803A1 (en) 2023-02-22 2025-10-22 Hamamatsu Photonics K.K. Mcp detector and analysis device
EP4636802A1 (en) 2023-02-22 2025-10-22 Hamamatsu Photonics K.K. Mcp detector and analysis device
KR20250152589A (ko) 2023-02-22 2025-10-23 하마마츠 포토닉스 가부시키가이샤 Mcp 검출기 및 분석 장치
KR20250152588A (ko) 2023-02-22 2025-10-23 하마마츠 포토닉스 가부시키가이샤 Mcp 검출기 및 분석 장치

Also Published As

Publication number Publication date
US4568853A (en) 1986-02-04
FR2506518A1 (fr) 1982-11-26
GB2098796B (en) 1985-04-11
DE3217405A1 (de) 1982-12-09
FR2506518B1 (enExample) 1984-04-20
GB2098796A (en) 1982-11-24

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