JPS57179609A - Configuration detecting device - Google Patents

Configuration detecting device

Info

Publication number
JPS57179609A
JPS57179609A JP6603681A JP6603681A JPS57179609A JP S57179609 A JPS57179609 A JP S57179609A JP 6603681 A JP6603681 A JP 6603681A JP 6603681 A JP6603681 A JP 6603681A JP S57179609 A JPS57179609 A JP S57179609A
Authority
JP
Japan
Prior art keywords
video signal
circuit
steel plate
histogram
width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6603681A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6258443B2 (enrdf_load_stackoverflow
Inventor
Toyoichi Saito
Shizuyoshi Sannomiya
Akio Hosooka
Kazuo Takashima
Minoru Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Nippon Steel Corp
Original Assignee
Mitsubishi Electric Corp
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp, Nippon Steel Corp filed Critical Mitsubishi Electric Corp
Priority to JP6603681A priority Critical patent/JPS57179609A/ja
Publication of JPS57179609A publication Critical patent/JPS57179609A/ja
Publication of JPS6258443B2 publication Critical patent/JPS6258443B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP6603681A 1981-04-29 1981-04-29 Configuration detecting device Granted JPS57179609A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6603681A JPS57179609A (en) 1981-04-29 1981-04-29 Configuration detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6603681A JPS57179609A (en) 1981-04-29 1981-04-29 Configuration detecting device

Publications (2)

Publication Number Publication Date
JPS57179609A true JPS57179609A (en) 1982-11-05
JPS6258443B2 JPS6258443B2 (enrdf_load_stackoverflow) 1987-12-05

Family

ID=13304249

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6603681A Granted JPS57179609A (en) 1981-04-29 1981-04-29 Configuration detecting device

Country Status (1)

Country Link
JP (1) JPS57179609A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0352157A1 (fr) * 1988-07-20 1990-01-24 Institut De Recherches De La Siderurgie Francaise (Irsid) Procédé et dispositif d'identification du fini d'une surface métallique
JPH04286572A (ja) * 1991-03-15 1992-10-12 Fujitsu Ltd 連続用紙のスタック機構
US5798925A (en) * 1995-05-16 1998-08-25 L-S Electro-Galvanizing Company Method and apparatus for monitoring a moving strip

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0352157A1 (fr) * 1988-07-20 1990-01-24 Institut De Recherches De La Siderurgie Francaise (Irsid) Procédé et dispositif d'identification du fini d'une surface métallique
FR2634551A1 (fr) * 1988-07-20 1990-01-26 Siderurgie Fse Inst Rech Procede et dispositif d'identification du fini d'une surface metallique
JPH04286572A (ja) * 1991-03-15 1992-10-12 Fujitsu Ltd 連続用紙のスタック機構
US5798925A (en) * 1995-05-16 1998-08-25 L-S Electro-Galvanizing Company Method and apparatus for monitoring a moving strip

Also Published As

Publication number Publication date
JPS6258443B2 (enrdf_load_stackoverflow) 1987-12-05

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