JPS57178169A - Transistor measuring device - Google Patents

Transistor measuring device

Info

Publication number
JPS57178169A
JPS57178169A JP6247081A JP6247081A JPS57178169A JP S57178169 A JPS57178169 A JP S57178169A JP 6247081 A JP6247081 A JP 6247081A JP 6247081 A JP6247081 A JP 6247081A JP S57178169 A JPS57178169 A JP S57178169A
Authority
JP
Japan
Prior art keywords
measured
collector
current
transistors
capacitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6247081A
Other languages
English (en)
Inventor
Kazuo Kanbayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6247081A priority Critical patent/JPS57178169A/ja
Publication of JPS57178169A publication Critical patent/JPS57178169A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Bipolar Transistors (AREA)
JP6247081A 1981-04-27 1981-04-27 Transistor measuring device Pending JPS57178169A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6247081A JPS57178169A (en) 1981-04-27 1981-04-27 Transistor measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6247081A JPS57178169A (en) 1981-04-27 1981-04-27 Transistor measuring device

Publications (1)

Publication Number Publication Date
JPS57178169A true JPS57178169A (en) 1982-11-02

Family

ID=13201110

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6247081A Pending JPS57178169A (en) 1981-04-27 1981-04-27 Transistor measuring device

Country Status (1)

Country Link
JP (1) JPS57178169A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103809096A (zh) * 2014-02-28 2014-05-21 成都先进功率半导体股份有限公司 一种基于继电器的三极管振荡装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103809096A (zh) * 2014-02-28 2014-05-21 成都先进功率半导体股份有限公司 一种基于继电器的三极管振荡装置

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