JPS57172205A - Head device for measuring plating thickness by x rays - Google Patents
Head device for measuring plating thickness by x raysInfo
- Publication number
- JPS57172205A JPS57172205A JP5745881A JP5745881A JPS57172205A JP S57172205 A JPS57172205 A JP S57172205A JP 5745881 A JP5745881 A JP 5745881A JP 5745881 A JP5745881 A JP 5745881A JP S57172205 A JPS57172205 A JP S57172205A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- collimator
- assembly
- ray tube
- window
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5745881A JPS57172205A (en) | 1981-04-16 | 1981-04-16 | Head device for measuring plating thickness by x rays |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5745881A JPS57172205A (en) | 1981-04-16 | 1981-04-16 | Head device for measuring plating thickness by x rays |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57172205A true JPS57172205A (en) | 1982-10-23 |
JPS646682B2 JPS646682B2 (ja) | 1989-02-06 |
Family
ID=13056222
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5745881A Granted JPS57172205A (en) | 1981-04-16 | 1981-04-16 | Head device for measuring plating thickness by x rays |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57172205A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107655919A (zh) * | 2017-09-11 | 2018-02-02 | 江苏天瑞仪器股份有限公司 | 一种用于x荧光光谱仪多准直器的定位结构 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20210109926A (ko) * | 2020-02-28 | 2021-09-07 | 한국에너지기술연구원 | 부하변동 대응형 수소 발생 전극 및 이의 제조방법 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5359455A (en) * | 1976-11-09 | 1978-05-29 | Seiko Instr & Electronics Ltd | Radiation measuring apparatus |
JPS5582007A (en) * | 1978-12-15 | 1980-06-20 | Seiko Instr & Electronics Ltd | Thickness measuring unit for plain bearing material using radiant ray |
-
1981
- 1981-04-16 JP JP5745881A patent/JPS57172205A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5359455A (en) * | 1976-11-09 | 1978-05-29 | Seiko Instr & Electronics Ltd | Radiation measuring apparatus |
JPS5582007A (en) * | 1978-12-15 | 1980-06-20 | Seiko Instr & Electronics Ltd | Thickness measuring unit for plain bearing material using radiant ray |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107655919A (zh) * | 2017-09-11 | 2018-02-02 | 江苏天瑞仪器股份有限公司 | 一种用于x荧光光谱仪多准直器的定位结构 |
CN107655919B (zh) * | 2017-09-11 | 2020-04-03 | 江苏天瑞仪器股份有限公司 | 一种用于x荧光光谱仪多准直器的定位结构 |
Also Published As
Publication number | Publication date |
---|---|
JPS646682B2 (ja) | 1989-02-06 |
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