JPS57169673A - Two probe flaw detection method for piping - Google Patents

Two probe flaw detection method for piping

Info

Publication number
JPS57169673A
JPS57169673A JP56055376A JP5537681A JPS57169673A JP S57169673 A JPS57169673 A JP S57169673A JP 56055376 A JP56055376 A JP 56055376A JP 5537681 A JP5537681 A JP 5537681A JP S57169673 A JPS57169673 A JP S57169673A
Authority
JP
Japan
Prior art keywords
piping
probes
flaw detection
axial line
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56055376A
Other languages
English (en)
Other versions
JPS6411142B2 (ja
Inventor
Takahiro Arakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IHI Corp
Original Assignee
IHI Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IHI Corp filed Critical IHI Corp
Priority to JP56055376A priority Critical patent/JPS57169673A/ja
Publication of JPS57169673A publication Critical patent/JPS57169673A/ja
Publication of JPS6411142B2 publication Critical patent/JPS6411142B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2487—Directing probes, e.g. angle probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/056—Angular incidence, angular propagation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/263—Surfaces
    • G01N2291/2634—Surfaces cylindrical from outside
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/267—Welds
    • G01N2291/2675—Seam, butt welding

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP56055376A 1981-04-13 1981-04-13 Two probe flaw detection method for piping Granted JPS57169673A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56055376A JPS57169673A (en) 1981-04-13 1981-04-13 Two probe flaw detection method for piping

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56055376A JPS57169673A (en) 1981-04-13 1981-04-13 Two probe flaw detection method for piping

Publications (2)

Publication Number Publication Date
JPS57169673A true JPS57169673A (en) 1982-10-19
JPS6411142B2 JPS6411142B2 (ja) 1989-02-23

Family

ID=12996761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56055376A Granted JPS57169673A (en) 1981-04-13 1981-04-13 Two probe flaw detection method for piping

Country Status (1)

Country Link
JP (1) JPS57169673A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010038820A (ja) * 2008-08-07 2010-02-18 Hitachi-Ge Nuclear Energy Ltd 超音波検査装置
US8746070B2 (en) 2011-04-08 2014-06-10 Tejas Testing & Inspection, Inc. Phased array ultrasonic examination system and method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5282380A (en) * 1975-12-29 1977-07-09 Nippon Steel Corp Insepeting method of welding part by supersonic waves
JPS5320864A (en) * 1976-08-11 1978-02-25 Hitachi Ltd Film forming method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5282380A (en) * 1975-12-29 1977-07-09 Nippon Steel Corp Insepeting method of welding part by supersonic waves
JPS5320864A (en) * 1976-08-11 1978-02-25 Hitachi Ltd Film forming method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010038820A (ja) * 2008-08-07 2010-02-18 Hitachi-Ge Nuclear Energy Ltd 超音波検査装置
US8746070B2 (en) 2011-04-08 2014-06-10 Tejas Testing & Inspection, Inc. Phased array ultrasonic examination system and method

Also Published As

Publication number Publication date
JPS6411142B2 (ja) 1989-02-23

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