JPS57160072A - Tester for entanglement of wires - Google Patents

Tester for entanglement of wires

Info

Publication number
JPS57160072A
JPS57160072A JP56045610A JP4561081A JPS57160072A JP S57160072 A JPS57160072 A JP S57160072A JP 56045610 A JP56045610 A JP 56045610A JP 4561081 A JP4561081 A JP 4561081A JP S57160072 A JPS57160072 A JP S57160072A
Authority
JP
Japan
Prior art keywords
terminals
counter
gate
high level
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56045610A
Other languages
Japanese (ja)
Inventor
Noboru Oshima
Seiji Onoguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56045610A priority Critical patent/JPS57160072A/en
Publication of JPS57160072A publication Critical patent/JPS57160072A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To enable automatic detection of short-circuiting between a plurality of terminals by means of a relatively simple single logic circuit. CONSTITUTION:A counter 1 is initialized and the output of an inverter 191 is a ground potential on the output side of a decoder 9 while the outputs of all other inverters are at a high level. Therefore the output of an AND gate 231 is at a low level. A high level is applied to one input of an AND gate 232 by decoding 17 an initialized value 2 of a counter 11. Unless there is no electric short-circuiting between terminals T1 and T2, the other input of the AND gate 232 is also at a high level. A high level signal of the output is applied to an AND gate 13 and a clock signal CL2 is provided to the counter 11 giving a counted value 3. A conduction test is conducted between terminals T1 and T3... and T1 and T8 to bring the counted value up to 8. If a shortcircuit occurs between any of terminals, no clock signal comes to the counter 11, leaving the action halted thereby enables the detection of any entanglement of wires.
JP56045610A 1981-03-30 1981-03-30 Tester for entanglement of wires Pending JPS57160072A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56045610A JPS57160072A (en) 1981-03-30 1981-03-30 Tester for entanglement of wires

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56045610A JPS57160072A (en) 1981-03-30 1981-03-30 Tester for entanglement of wires

Publications (1)

Publication Number Publication Date
JPS57160072A true JPS57160072A (en) 1982-10-02

Family

ID=12724131

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56045610A Pending JPS57160072A (en) 1981-03-30 1981-03-30 Tester for entanglement of wires

Country Status (1)

Country Link
JP (1) JPS57160072A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59128666A (en) * 1983-01-14 1984-07-24 Fuji Xerox Co Ltd Issuing device of slip, form or the like

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59128666A (en) * 1983-01-14 1984-07-24 Fuji Xerox Co Ltd Issuing device of slip, form or the like
JPH0526228B2 (en) * 1983-01-14 1993-04-15 Fuji Xerox Co Ltd

Similar Documents

Publication Publication Date Title
DE3274300D1 (en) Logic circuit interconnect fault detection system
KR920001523A (en) Semiconductor integrated circuit including detection circuit
JPS57160072A (en) Tester for entanglement of wires
JPS5785253A (en) Semiconductor device
JPS57210718A (en) Signal change detecting circuit
JPS5247682A (en) Integrated circuit
JPS5299031A (en) Three value input detecting circuit
JPS57138877A (en) Da/ac inverter
JPS5511624A (en) Holding device of multiple selection signal
JPS56146336A (en) Monitor signal identifying circuit
JPS5524658A (en) Inspecting circuit for electronic watch
JPS5741749A (en) Diagnosing system of fault detecting circuit
JPS5570129A (en) Level detector circuit
JPS5242162A (en) Edge detection device
JPS5745941A (en) Semiconductor integrated circuit device
SU750738A1 (en) Device for monitoring counter operation
JPS5553919A (en) Variation detecting circuit
JPS5252536A (en) Memory signal detection amplifing equipment
JPS6486713A (en) Reset signal generating circuit
JPS5741720A (en) Power supply circuit
JPS5737276A (en) Detecting circuit for battery voltage
JPS53144240A (en) Signal detection circuit
JPS57104323A (en) Semiconductor integrated circuit
JPS52135257A (en) Output level of mos ic
CA828866A (en) Fault detection circuit for testing the integrity of an electrical path