JPS57153346A - Noise voltage generation tester - Google Patents

Noise voltage generation tester

Info

Publication number
JPS57153346A
JPS57153346A JP56039125A JP3912581A JPS57153346A JP S57153346 A JPS57153346 A JP S57153346A JP 56039125 A JP56039125 A JP 56039125A JP 3912581 A JP3912581 A JP 3912581A JP S57153346 A JPS57153346 A JP S57153346A
Authority
JP
Japan
Prior art keywords
output
noise voltage
waves
wave
period
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56039125A
Other languages
English (en)
Other versions
JPS642284B2 (ja
Inventor
Toshio Matsui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56039125A priority Critical patent/JPS57153346A/ja
Publication of JPS57153346A publication Critical patent/JPS57153346A/ja
Publication of JPS642284B2 publication Critical patent/JPS642284B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
JP56039125A 1981-03-18 1981-03-18 Noise voltage generation tester Granted JPS57153346A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56039125A JPS57153346A (en) 1981-03-18 1981-03-18 Noise voltage generation tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56039125A JPS57153346A (en) 1981-03-18 1981-03-18 Noise voltage generation tester

Publications (2)

Publication Number Publication Date
JPS57153346A true JPS57153346A (en) 1982-09-21
JPS642284B2 JPS642284B2 (ja) 1989-01-17

Family

ID=12544373

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56039125A Granted JPS57153346A (en) 1981-03-18 1981-03-18 Noise voltage generation tester

Country Status (1)

Country Link
JP (1) JPS57153346A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119009U (ja) * 1986-01-20 1987-07-28

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS553216A (en) * 1978-06-23 1980-01-11 Hitachi Ltd Gate circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS553216A (en) * 1978-06-23 1980-01-11 Hitachi Ltd Gate circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119009U (ja) * 1986-01-20 1987-07-28
JPH0332091Y2 (ja) * 1986-01-20 1991-07-08

Also Published As

Publication number Publication date
JPS642284B2 (ja) 1989-01-17

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