JPS5713848A - Control system for subscriber-line test connection - Google Patents

Control system for subscriber-line test connection

Info

Publication number
JPS5713848A
JPS5713848A JP8785980A JP8785980A JPS5713848A JP S5713848 A JPS5713848 A JP S5713848A JP 8785980 A JP8785980 A JP 8785980A JP 8785980 A JP8785980 A JP 8785980A JP S5713848 A JPS5713848 A JP S5713848A
Authority
JP
Japan
Prior art keywords
line
subscriber
test
switch
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8785980A
Other languages
English (en)
Inventor
Yukio Iino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8785980A priority Critical patent/JPS5713848A/ja
Publication of JPS5713848A publication Critical patent/JPS5713848A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
JP8785980A 1980-06-30 1980-06-30 Control system for subscriber-line test connection Pending JPS5713848A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8785980A JPS5713848A (en) 1980-06-30 1980-06-30 Control system for subscriber-line test connection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8785980A JPS5713848A (en) 1980-06-30 1980-06-30 Control system for subscriber-line test connection

Publications (1)

Publication Number Publication Date
JPS5713848A true JPS5713848A (en) 1982-01-23

Family

ID=13926603

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8785980A Pending JPS5713848A (en) 1980-06-30 1980-06-30 Control system for subscriber-line test connection

Country Status (1)

Country Link
JP (1) JPS5713848A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59121018A (ja) * 1982-12-27 1984-07-12 Asahi Optical Co Ltd 拡大撮影用写真レンズ
US4755364A (en) * 1986-05-29 1988-07-05 Rockwell International Corporation Liquid phase epitaxy apparatus and method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5475916A (en) * 1977-11-30 1979-06-18 Oki Electric Ind Co Ltd Test system for subscribersigma line in remote office

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5475916A (en) * 1977-11-30 1979-06-18 Oki Electric Ind Co Ltd Test system for subscribersigma line in remote office

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59121018A (ja) * 1982-12-27 1984-07-12 Asahi Optical Co Ltd 拡大撮影用写真レンズ
JPS6214807B2 (ja) * 1982-12-27 1987-04-03 Asahi Optical Co Ltd
US4755364A (en) * 1986-05-29 1988-07-05 Rockwell International Corporation Liquid phase epitaxy apparatus and method

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