JPS5713660A - Method of analysing solid local gas and its device - Google Patents
Method of analysing solid local gas and its deviceInfo
- Publication number
- JPS5713660A JPS5713660A JP8828780A JP8828780A JPS5713660A JP S5713660 A JPS5713660 A JP S5713660A JP 8828780 A JP8828780 A JP 8828780A JP 8828780 A JP8828780 A JP 8828780A JP S5713660 A JPS5713660 A JP S5713660A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- gases
- discharged
- sample
- solid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8828780A JPS5713660A (en) | 1980-06-27 | 1980-06-27 | Method of analysing solid local gas and its device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8828780A JPS5713660A (en) | 1980-06-27 | 1980-06-27 | Method of analysing solid local gas and its device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5713660A true JPS5713660A (en) | 1982-01-23 |
JPH0114664B2 JPH0114664B2 (ja) | 1989-03-13 |
Family
ID=13938686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8828780A Granted JPS5713660A (en) | 1980-06-27 | 1980-06-27 | Method of analysing solid local gas and its device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5713660A (ja) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0197252A (ja) * | 1987-07-20 | 1989-04-14 | Nichimo Co Ltd | 無結節網 |
US5742050A (en) * | 1996-09-30 | 1998-04-21 | Aviv Amirav | Method and apparatus for sample introduction into a mass spectrometer for improving a sample analysis |
WO1998046070A1 (en) | 1997-04-14 | 1998-10-22 | Martrawl, Inc. | Improved cell design for a trawl system and methods |
US6053059A (en) * | 1997-12-15 | 2000-04-25 | Mitsubishi Denki Kabushiki Kaisha | Analyzing system of organic substance adhering to a surface of a sample |
US6374531B1 (en) | 1995-10-13 | 2002-04-23 | Ottr Ultra-Low Drag, Ltd. | Trawl system cell design and methods |
US6434879B1 (en) | 1998-02-10 | 2002-08-20 | Otter Ultra-Low-Drag, Ltd. | Bi-directional, manufacturable, lift-generating mesh bar |
WO2019116605A1 (ja) * | 2017-12-13 | 2019-06-20 | 株式会社日立ハイテクノロジーズ | 電子線照射装置、分析システム |
-
1980
- 1980-06-27 JP JP8828780A patent/JPS5713660A/ja active Granted
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0197252A (ja) * | 1987-07-20 | 1989-04-14 | Nichimo Co Ltd | 無結節網 |
US6374531B1 (en) | 1995-10-13 | 2002-04-23 | Ottr Ultra-Low Drag, Ltd. | Trawl system cell design and methods |
US5742050A (en) * | 1996-09-30 | 1998-04-21 | Aviv Amirav | Method and apparatus for sample introduction into a mass spectrometer for improving a sample analysis |
WO1998046070A1 (en) | 1997-04-14 | 1998-10-22 | Martrawl, Inc. | Improved cell design for a trawl system and methods |
US6357164B1 (en) | 1997-04-14 | 2002-03-19 | Ottr Ultra-Low-Drag, Ltd. | Cell design for a trawl system and methods |
US6732468B2 (en) | 1997-04-14 | 2004-05-11 | Otter Ultra-Low-Drag, Ltd. | Cell design for a trawl system and methods |
US6053059A (en) * | 1997-12-15 | 2000-04-25 | Mitsubishi Denki Kabushiki Kaisha | Analyzing system of organic substance adhering to a surface of a sample |
US6434879B1 (en) | 1998-02-10 | 2002-08-20 | Otter Ultra-Low-Drag, Ltd. | Bi-directional, manufacturable, lift-generating mesh bar |
WO2019116605A1 (ja) * | 2017-12-13 | 2019-06-20 | 株式会社日立ハイテクノロジーズ | 電子線照射装置、分析システム |
Also Published As
Publication number | Publication date |
---|---|
JPH0114664B2 (ja) | 1989-03-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2000055600A3 (en) | Sampling and analysis of airborne particulate matter by glow discharge atomic emission and mass spectrometries | |
CA2090616A1 (en) | Apparatus and methods for trace component analysis | |
JPS5291494A (en) | Mass spectrometer | |
JPS5795056A (en) | Appearance inspecting process | |
CN207396354U (zh) | 一种用于粉末成分在线检测的激光诱导击穿光谱装置 | |
JPS5713660A (en) | Method of analysing solid local gas and its device | |
CA2149508A1 (en) | Method and apparatus for assessing the viability of plant material | |
JPS51120288A (en) | Analyzer direct-coupled with gas chromatograph mass analysis-meter | |
CN209400425U (zh) | 一种火花直读光谱仪用防沾污装置 | |
JPS57117241A (en) | Reactive ion etching method | |
JPS5753052A (en) | Atmospheric ionized ion source | |
JPS5635053A (en) | Measuring method of transmitted hydrogen in metal sample | |
JPS5486393A (en) | Process gas analytical method | |
JPS5615542A (en) | Mass analyzer equipped with tetraelectrode | |
JPS5614933A (en) | Sample inspecting device | |
EP0723153A3 (en) | Flow modulation for facilitating detector ignition | |
JPS57169241A (en) | Dry etching method | |
JPS5645562A (en) | Ionization device | |
JPS54135595A (en) | Leak measuring method of radioactive iodine removal filter | |
JPS5336291A (en) | Mass spectrometer | |
JPS56109187A (en) | Monitoring method for shielding gas for welding | |
Sinha | Laser-induced volatilization and ionization of aerosol particles for their mass spectral analysis in real time | |
JPS5760238A (en) | Dust explosion tester | |
JPS5485797A (en) | Ion detecting method of mass spectrometer | |
Reed | Secondary Ion Mass Spectroscopy |