JPS57135307A - Line interval deciding device for diffraction grating line graduating device - Google Patents

Line interval deciding device for diffraction grating line graduating device

Info

Publication number
JPS57135307A
JPS57135307A JP2208081A JP2208081A JPS57135307A JP S57135307 A JPS57135307 A JP S57135307A JP 2208081 A JP2208081 A JP 2208081A JP 2208081 A JP2208081 A JP 2208081A JP S57135307 A JPS57135307 A JP S57135307A
Authority
JP
Japan
Prior art keywords
diffraction grating
line
graduating
lens
controlled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2208081A
Other languages
English (en)
Inventor
Takumi Tomijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP2208081A priority Critical patent/JPS57135307A/ja
Publication of JPS57135307A publication Critical patent/JPS57135307A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/0683Stabilisation of laser output parameters by monitoring the optical output parameters
    • H01S5/0687Stabilising the frequency of the laser

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2208081A 1981-02-16 1981-02-16 Line interval deciding device for diffraction grating line graduating device Pending JPS57135307A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2208081A JPS57135307A (en) 1981-02-16 1981-02-16 Line interval deciding device for diffraction grating line graduating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2208081A JPS57135307A (en) 1981-02-16 1981-02-16 Line interval deciding device for diffraction grating line graduating device

Publications (1)

Publication Number Publication Date
JPS57135307A true JPS57135307A (en) 1982-08-20

Family

ID=12072898

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2208081A Pending JPS57135307A (en) 1981-02-16 1981-02-16 Line interval deciding device for diffraction grating line graduating device

Country Status (1)

Country Link
JP (1) JPS57135307A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006030196A (ja) * 2004-07-13 2006-02-02 Mitsutoyo Corp スペックル像相関光学変位センシングの読取ヘッド、スペックル像相関光学位置トランスデューサの読取ヘッドおよびそのウォームアップ期間の監視方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006030196A (ja) * 2004-07-13 2006-02-02 Mitsutoyo Corp スペックル像相関光学変位センシングの読取ヘッド、スペックル像相関光学位置トランスデューサの読取ヘッドおよびそのウォームアップ期間の監視方法
JP4694907B2 (ja) * 2004-07-13 2011-06-08 株式会社ミツトヨ スペックル像相関光学変位センシングの読取ヘッド、スペックル像相関光学位置トランスデューサの読取ヘッドおよびそのウォームアップ期間の監視方法

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