JPS57108602A - Measuring device for film thickness - Google Patents
Measuring device for film thicknessInfo
- Publication number
- JPS57108602A JPS57108602A JP18279980A JP18279980A JPS57108602A JP S57108602 A JPS57108602 A JP S57108602A JP 18279980 A JP18279980 A JP 18279980A JP 18279980 A JP18279980 A JP 18279980A JP S57108602 A JPS57108602 A JP S57108602A
- Authority
- JP
- Japan
- Prior art keywords
- film thickness
- groove
- film
- measuring device
- insulator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/08—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
PURPOSE:To permit a constantly stable measurement of film thickness, by a method wherein a groove is formed in an insultor around a capacitor as a film thickness detecting element, and a negative pressure is introduced into the groove. CONSTITUTION:A film thickness sensor 9 is of such type as capable of measuring film thickness simply by contacting with one surface of a film 1, and made by forming an electrode directly on an insulator 10. A groove 11 is formed around the film thickness sensor 9, and an extremely low negative pressure is applied to the groove 11 by employing a pump 12 in order to allow the film 1 sliding on the surface of the insulator 10 to closely contact with the film thickness sensor 9, thereby to permit a stable measurement of film thickness.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18279980A JPS57108602A (en) | 1980-12-25 | 1980-12-25 | Measuring device for film thickness |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18279980A JPS57108602A (en) | 1980-12-25 | 1980-12-25 | Measuring device for film thickness |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57108602A true JPS57108602A (en) | 1982-07-06 |
Family
ID=16124616
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18279980A Pending JPS57108602A (en) | 1980-12-25 | 1980-12-25 | Measuring device for film thickness |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57108602A (en) |
-
1980
- 1980-12-25 JP JP18279980A patent/JPS57108602A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5770448A (en) | Enzyme electrode | |
JPS5315886A (en) | Oxygen concentration detector | |
FR2358655A1 (en) | Molecular oxygen level measurement in gas stream - uses current biassing electrodes on solid electrolyte, monitoring fluctuation of current flow | |
JPS5729916A (en) | Elastic surface wave device | |
DK317782A (en) | reference | |
GB1214218A (en) | Method of measuring the water content of liquid hydrocarbons | |
JPS57108602A (en) | Measuring device for film thickness | |
DE3881108T2 (en) | ELEMENT FOR DETECTING AN EVAPORABLE LIQUID. | |
GB1401172A (en) | Hygrometers | |
JPS577549A (en) | Fet gas sensor | |
JPS57106804A (en) | Measuring device for thickness of film | |
JPS57106803A (en) | Measuring device for thickness of film | |
JPS5242756A (en) | Device for measuring female screw | |
DK133280A (en) | Electrode arrangement | |
JPS55117955A (en) | Semiconductor sensor and impurity detection method | |
JPS5312373A (en) | Measuring apparatus for temperature difference | |
JPS57108601A (en) | Measuring device for film thickness | |
JPS57114811A (en) | Contact type encoder for measurement device | |
JPS57191526A (en) | Pressure sensor | |
JPS5717188A (en) | Semiconductor light-emitting element | |
JPS5649904A (en) | Detecting method for position of moving body | |
JPS57106045A (en) | Semiconductor device | |
JPS5425775A (en) | Easy measuring method of dielectric characteristics | |
JPS5246875A (en) | Pressure measuring device | |
FR2330002A1 (en) | Ion concentration measurement in liquid - is performed by comparison with reference liquid of variable ion concentration to achieve wide range |